公开(公告)号：US09903757B1

公开(公告)日：2018-02-27

申请号：US15275172

申请日：2016-09-23

Applicant: HRL Laboratories, LLC

Inventor： Daniel Yap ,  Brian Neff

IPC: G01J3/10 ,  G01J3/02 ,  G01J3/42 ,  G01N21/39 ,  G01N21/35 ,  G01N21/94

CPC classification number: G01J3/108 ,  G01J3/0208 ,  G01J3/42 ,  G01J2003/102 ,  G01N21/35 ,  G01N21/39 ,  G01N21/94 ,  G01N2021/399 ,  G01N2201/067

Abstract: A sensor includes a plurality of transmitter units, a photodetector, and an optical system coupled to the plurality of transmitter units and the photodetector. Each of the transmitter units simultaneously transmits a light beam having a plurality of wavelengths, the optical system directs the light beam from each of the transmitter units onto a same illuminated spot on a probed surface, and the optical system collects light from the same illuminated spot and directs the light to the photodetector.

公开(公告)号：US09887355B2

公开(公告)日：2018-02-06

申请号：US15079472

申请日：2016-03-24

Applicant: Infineon Technologies Dresden GmbH

Inventor： Steffen Bieselt ,  Heiko Froehlich ,  Thoralf Kautzsch ,  Maik Stegemann ,  Mirko Vogt

IPC: H01L27/15 ,  H01L49/00 ,  G01J3/00

CPC classification number: H01L49/00 ,  G01J3/00 ,  G01J3/108 ,  G01J3/42

Abstract: A method for manufacturing an emitter comprises providing a semiconductor substrate having a main surface, the semiconductor substrate comprising a cavity adjacent to the main surface. A portion of the semiconductor substrate arranged between the cavity and the main surface of the semiconductor substrate forms a support structure. The method comprises arranging an emitting element at the support structure, the emitting element being configured to emit a thermal radiation of the emitter, wherein the cavity provides a reduction of a thermal coupling between the emitting element and the semiconductor substrate.

公开(公告)号：US09869633B2

公开(公告)日：2018-01-16

申请号：US15451714

申请日：2017-03-07

Applicant: Daylight Solutions Inc.

Inventor： Benjamin Bird ,  Miles James Weida ,  Jeremy Rowlette

IPC: G01N21/35 ,  G01J3/28 ,  G01J3/10 ,  G01N33/50

CPC classification number: G01N21/35 ,  G01J3/10 ,  G01J3/108 ,  G01J3/28 ,  G01J3/2823 ,  G01J3/42 ,  G01J3/433 ,  G01J5/52 ,  G01J2003/104 ,  G01J2003/2826 ,  G01J2003/4332 ,  G01N21/3563 ,  G01N21/39 ,  G01N33/50 ,  G01N2201/12

Abstract: Spectrally analyzing an unknown sample (10A) for the existence of a characteristic includes (i) analyzing a first known sample (10C) having the characteristic and a second known sample (10D) not having the characteristic to identify less than fifty diagnostic spectral features, each diagnostic spectral feature being present at a different diagnostic wavelength in a mid-infrared spectral region; (ii) directing a plurality of interrogation beams (16) at the unknown sample (10A), each of the interrogation beams (16) having a different interrogation wavelength, and each interrogation wavelength corresponding to a different one of the diagnostic wavelengths; (iii) acquiring a plurality of separate output images (245) of the unknown sample (10A), wherein each of the output images (245) is acquired while the unknown sample is illuminated by a different one of the interrogation beams (16); and (iv) analyzing less than fifty output images (245) with a control system (28) to determine whether the characteristic is present in the unknown sample (10A).

公开(公告)号：US09851248B2

公开(公告)日：2017-12-26

申请号：US14961872

申请日：2015-12-07

Applicant: EMX International, LLC

Inventor： Daniel Lee Graybeal ,  Alan Carey Rogers ,  Andrey Muraview ,  Charles Mark Carnifax ,  Robert E. Peale

IPC: G01J5/02 ,  G01J3/10 ,  G01J3/42 ,  G01J3/02 ,  G01N21/3504 ,  G01N21/39 ,  H01S5/34

CPC classification number: G01J3/10 ,  G01J3/0205 ,  G01J3/021 ,  G01J3/0218 ,  G01J3/0245 ,  G01J3/108 ,  G01J3/42 ,  G01N21/3504 ,  G01N21/39 ,  G01N2021/399 ,  G01N2201/06113 ,  G01N2201/0612 ,  G01N2201/0691 ,  G01N2201/0697 ,  G01N2201/08 ,  H01S5/3401

Abstract: An intracavity laser absorption infrared spectroscopy system for detecting trace analytes in vapor samples. The system uses a spectrometer in communications with control electronics, wherein the control electronics contain an analyte database that contains absorption profiles for each analyte the system is used to detect. The system can not only detect the presence of specific analytes, but identify them as well. The spectrometer uses a hollow cavity waveguide that creates a continuous loop inside of the device, thus creating a large path length and eliminating the need to mechanically adjust the path length to achieve a high Q-factor. In a preferred embodiment, the laser source may serve as the detector, thus eliminating the need for a separate detector.

公开(公告)号：US09804026B2

公开(公告)日：2017-10-31

申请号：US14372779

申请日：2013-01-23

Applicant: The Regents of the University of Michigan

Inventor： Mona Jarrahi ,  Christopher W. Berry ,  Shang-Hua Yang

IPC: H01L33/38 ,  G01J3/10 ,  H01L31/09 ,  H01L31/0224 ,  H01L31/0232 ,  H01L31/0352 ,  H01L33/04

CPC classification number: G01J3/108 ,  H01L31/0224 ,  H01L31/02327 ,  H01L31/035209 ,  H01L31/09 ,  H01L33/04 ,  H01L33/38

Abstract: A photoconductive device that includes a semiconductor substrate, an antenna assembly, and a photoconductive assembly with one or more plasmonic contact electrodes. The photoconductive assembly can be provided with plasmonic contact electrodes that are arranged on the semiconductor substrate in a manner that improves the quantum efficiency of the photoconductive device by plasmonically enhancing the pump absorption into the photo-absorbing regions of semiconductor substrate. In one exemplary embodiment, the photoconductive device is arranged as a photoconductive source and is pumped at telecom pump wavelengths (e.g., 1.0-1.6 μm) and produces milliwatt-range power levels in the terahertz (THz) frequency range.

公开(公告)号：US20170292875A1

公开(公告)日：2017-10-12

申请号：US15516671

申请日：2015-10-02

Applicant: GWANGJU INSTITUTE OF SCIENCE AND TECHNOLOGY

Inventor： Jongin Song ,  Hajun Song

IPC: G01J3/10 ,  H01S3/23 ,  H01S3/00 ,  G01N21/3581 ,  G01N21/39

CPC classification number: G01J3/108 ,  G01N21/3581 ,  G01N21/39 ,  G01N2201/06113 ,  G01N2201/067 ,  G02F1/3534 ,  G02F2203/13 ,  H01S3/0085 ,  H01S3/2308

Abstract: An embodiment of the present invention provides a continuous-wave terahertz generation and detection device using a photomixing technique, the device including: first and second light source units configured to output continuous-wave laser light sources, which have single wavelength and different frequencies, to generate optical signals; a first electro-optic phase modulator configured to shift a frequency of the optical signal generated by the first light source unit, and a second electro-optic phase modulator configured to shift a frequency of the optical signal generated by the second light source unit; a first optical amplifier configured to receive and amplify the optical signal whose frequency is shifted by the first electro-optic phase modulator and the optical signal generated by the second light source unit, and a second optical amplifier configured to receive and amplify the optical signal whose frequency is shifted by the second electro-optic phase modulator and the optical signal generated by the first light source unit; an opto-electronic converter configured to convert the optical signal amplified by the first optical amplifier into a terahertz wave; a photomixer configured to mix the optical signal amplified by the second optical amplifier and the terahertz wave generated by the opto-electronic converter and convert the mixed signal into an electrical signal; a photodetector configured to combine the optical signals transferred from the first and second optical amplifiers and convert the combined optical signal into an electrical signal; and a filter unit configured to filter the electrical signal passing through the photodetector, wherein the electrical signal obtained through the photodetector is compared with the electrical signal obtained by the photomixer, and phase noise having the same frequency is removed.

公开(公告)号：US20170211977A1

公开(公告)日：2017-07-27

申请号：US15186682

申请日：2016-06-20

Applicant: Massachusetts Institute of Technology

Inventor： Thomas H. Jeys ,  William D. Herzog ,  Brian G. Saar ,  Alexander M. Stolyarov ,  Ryan Sullenberger ,  David Crompton ,  Shawn Michael Redmond

IPC: G01J3/433 ,  G01J3/10 ,  G01J3/28 ,  G01J3/447

CPC classification number: G01J3/433 ,  G01J3/108 ,  G01J3/2823 ,  G01J3/447 ,  G01N21/1717 ,  G01N21/636 ,  G01N2021/1725

Abstract: A device, and corresponding method, can include a pump light source configured to be modulated at a pump modulation and to irradiate a target specimen. The device can also include a probe light source arranged to generate a speckle pattern from the target specimen, as well as a sensor configured to detect changes in at least one of position and intensity of one or more speckle lobes of the speckle pattern having correlation with the pump modulation. The device and method can be used for non-contact monitoring and remote sensing of surfaces, gases, liquids, particles, and other target materials by analyzing speckle pattern changes as a function of pump light irradiation. Advantages can include much higher sensitivity than existing methods; the ability to use visible probe wavelengths for uncooled, low-cost visible detectors with high spatial resolution; and the ability to obtain target material properties without detecting infrared light.

公开(公告)号：US20170176326A1

公开(公告)日：2017-06-22

申请号：US15451714

申请日：2017-03-07

Applicant: Daylight Solutions Inc.

Inventor： Benjamin Bird ,  Miles James Weida ,  Jeremy Rowlette

IPC: G01N21/35 ,  G01J3/10 ,  G01N33/50 ,  G01J3/28

CPC classification number: G01N21/35 ,  G01J3/10 ,  G01J3/108 ,  G01J3/28 ,  G01J3/2823 ,  G01J3/42 ,  G01J3/433 ,  G01J5/52 ,  G01J2003/104 ,  G01J2003/2826 ,  G01J2003/4332 ,  G01N21/3563 ,  G01N21/39 ,  G01N33/50 ,  G01N2201/12

Abstract: Spectrally analyzing an unknown sample (10A) includes (i) providing a spatially homogeneous region (10B) of the unknown sample (10A); (ii) directing a plurality of interrogation beams (16) at the spatially homogeneous region (10B) with a laser source (14), (iii) acquiring a separate output image (245) while the unknown sample (10A) is illuminated by each of the interrogation beams (16) with an image sensor (26A); and (iv) analyzing less than fifty output images (245) to analyze whether a characteristic is present in the unknown sample (10A) with a control system (28) that includes a processor. Each of the interrogation beams (16) is nominally monochromatic and has a different interrogation wavelength that is in the mid-infrared spectral range.

公开(公告)号：US20170160192A1

公开(公告)日：2017-06-08

申请号：US15320260

申请日：2015-06-24

Applicant: VALMET AUTOMATION OY

Inventor： Markku MÄNTYLÄ ,  Pekka SUOPAJÄRVI ,  Jussi TENHUNEN ,  Janne PAASO

IPC: G01N21/3559 ,  D21F7/00 ,  G01J3/28 ,  G01J3/26 ,  G01J3/10

CPC classification number: G01N21/3559 ,  D21F7/003 ,  G01J3/108 ,  G01J3/26 ,  G01J2003/1213 ,  G01N21/8903 ,  G01N33/346 ,  G01N2021/8663

Abstract: Optical multi-channel measurement unit for a process measurement includes first ends for receiving optical radiation from the optical radiation source, and second ends for outputting the optical radiation for illuminating the at least one object. Optical detectors receive optical radiation from at least one measurement channel via at least one optical filter and convert an intensity of the optical radiation to an electrical signal. A movement mechanism causes, for filtering the wavelengths of the optical radiation propagating between detectors and the optical measurement channels through the optical filters, at least one of the following: movement inside at least one optical filter and movement between the filters and the detectors.

公开(公告)号：US20170089830A1

公开(公告)日：2017-03-30

申请号：US15274305

申请日：2016-09-23

Applicant: Drägerwerk AG & Co. KGaA

Inventor： Peter DREYER ,  Livio FORNASIERO ,  Arne TRÕLLSCH ,  Robert JAHNS

IPC: G01N21/3504 ,  G01J3/45

CPC classification number: G01N21/3504 ,  G01J3/108 ,  G01J3/26 ,  G01J3/36 ,  G01J3/42 ,  G01J3/45

Abstract: A method for signal detection with a gas analysis system (1, 1′) includes a radiation source (3); a gas measuring section (9) containing gas to be measured; a Fabry-Perot interferometer (13); a thermal sensor (17) configured to cause a change in voltage between electrodes with electromagnetic radiation falling thereon and arranged such that radiation released by a second interferometer mirror falls on the thermal sensor. The method includes irradiating the gas measuring section with radiation source radiation, continuously increasing or decreasing a distance of interferometer mirrors during a generating of time signal pulses at a constant period of time from one another. After a predefined number of time signal pulses, the voltage generated between the electrodes is detected and stored as a measured signal value. After a further predefined number of time signal pulses, the voltage generated between the electrodes is detected again and stored as a measured signal value.