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公开(公告)号:US20190312176A1
公开(公告)日:2019-10-10
申请号:US16443832
申请日:2019-06-17
Applicant: Genesis Photonics Inc.
Inventor: Tsung-Syun Huang , Jing-En Huang , Yu-Chen Kuo , Yan-Ting Lan , Kai-Shun Kang , Fei-Lung Lu , Teng-Hsien Lai , Yi-Ru Huang
Abstract: A light-emitting diode including a semiconductor epitaxial layer, a first electrode, and a second electrode is provided. The semiconductor epitaxial layer includes a first-type doped semiconductor layer, a second-type doped semiconductor layer, and a quantum well layer. A recessed portion is formed in the semiconductor epitaxial layer. The recessed portion separates the second-type doped semiconductor layer, the quantum well layer, and a portion of the first-type doped semiconductor layer and defines a first region and a second region on the semiconductor epitaxial layer. The first electrode is located in the first region and electrically connected to at least a portion of the first-type doped semiconductor layer and at least a portion of the second-type doped semiconductor layer. The second electrode is located in the second region and electrically connected to the second-type doped semiconductor layer.
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公开(公告)号:US10050081B2
公开(公告)日:2018-08-14
申请号:US15135584
申请日:2016-04-22
Applicant: Genesis Photonics Inc.
Inventor: Tsung-Syun Huang , Chih-Chung Kuo , Jing-En Huang , Shao-Ying Ting
Abstract: A light-emitting device includes a substrate and a first light-emitting unit. The first light-emitting unit is disposed on the substrate, and includes a first semiconductor layer, a first light-emitting layer, and a second semiconductor layer. The first semiconductor layer is disposed on the substrate. The first light-emitting layer is disposed between the first semiconductor layer and the second semiconductor layer. The second semiconductor layer is disposed on the first light-emitting layer. The first semiconductor layer has a first sidewall and a second sidewall. A first angle is between the substrate and the first sidewall. A second angle is between the substrate and the second sidewall. The first angle is smaller than the second angle.
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公开(公告)号:US10326047B2
公开(公告)日:2019-06-18
申请号:US15255161
申请日:2016-09-02
Applicant: Genesis Photonics Inc.
Inventor: Tsung-Syun Huang , Jing-En Huang , Yu-Chen Kuo , Yan-Ting Lan , Kai-Shun Kang , Fei-Lung Lu , Teng-Hsien Lai , Yi-Ru Huang
Abstract: A light-emitting diode including a semiconductor epitaxial layer, a first electrode, and a second electrode is provided. The semiconductor epitaxial layer includes a first-type doped semiconductor layer, a second-type doped semiconductor layer, and a quantum well layer. A recessed portion is formed in the semiconductor epitaxial layer. The recessed portion separates the second-type doped semiconductor layer, the quantum well layer, and a portion of the first-type doped semiconductor layer and defines a first region and a second region on the semiconductor epitaxial layer. The first electrode is located in the first region and electrically connected to at least a portion of the first-type doped semiconductor layer and at least a portion of the second-type doped semiconductor layer. The second electrode is located in the second region and electrically connected to the second-type doped semiconductor layer.
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公开(公告)号:US20180374892A1
公开(公告)日:2018-12-27
申请号:US16101681
申请日:2018-08-13
Applicant: Genesis Photonics Inc.
Inventor: Tsung-Syun Huang , Chih-Chung Kuo , Jing-En Huang , Shao-Ying Ting
CPC classification number: H01L27/15 , H01L27/153 , H01L33/20 , H01L2933/0016
Abstract: A light-emitting device includes a substrate and a first light-emitting unit. The first light-emitting unit is disposed on the substrate, and includes a first semiconductor layer, a first light-emitting layer, and a second semiconductor layer. The first semiconductor layer is disposed on the substrate. The first light-emitting layer is disposed between the first semiconductor layer and the second semiconductor layer. The second semiconductor layer is disposed on the first light-emitting layer. The first semiconductor layer has a first sidewall and a second sidewall. A first angle is between the substrate and the first sidewall. A second angle is between the substrate and the second sidewall. The first angle is smaller than the second angle.
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公开(公告)号:US20180130926A1
公开(公告)日:2018-05-10
申请号:US15727545
申请日:2017-10-06
Applicant: Genesis Photonics Inc.
Inventor: Yi-Ru Huang , Sheng-Tsung Hsu , Yu-Chen Kuo , Chih-Ming Shen , Tung-Lin Chuang , Tsung-Syun Huang , Jing-En Huang
CPC classification number: H01L33/382 , H01L33/007 , H01L33/0095 , H01L33/06 , H01L33/14 , H01L33/145 , H01L33/32 , H01L33/387 , H01L33/44 , H01L33/46 , H01L33/62 , H01L2933/0016 , H01L2933/0025
Abstract: An LED includes a first-type semiconductor layer, a light emitting layer, a second-type semiconductor layer, a first metal layer, a first current conducting layer, a first bonding layer, and a second current conducting layer. The light emitting layer is located between the first-type semiconductor layer and the second-type semiconductor layer. The first metal layer is located on the first-type semiconductor layer and electrically connected to the first-type semiconductor layer. The first metal layer is located between the first current conducting layer and the first-type semiconductor layer. The first current conducting layer is located between the first bonding layer and the first metal layer. The first bonding layer is electrically connected to the first-type semiconductor layer via the first current conducting layer and the first metal layer. The first bonding layer has through holes overlapping with the first metal layer.
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公开(公告)号:US20160153909A1
公开(公告)日:2016-06-02
申请号:US15016301
申请日:2016-02-05
Applicant: Genesis Photonics Inc.
Inventor: Cheng-Pin Chen , Yun-Li Li , Shou-Wen Hsu , Chih-Hung Tseng , Pei-Yi Huang , Ching-Cheng Sun , Tsung-Syun Huang , Yung-Tsung Lin , Ping-Tsung Tsai
CPC classification number: G01N21/63 , G01N21/6489 , G01N21/8806 , G01N21/95 , G01N21/9501 , G01N2021/646 , G01N2201/061 , G01N2201/0636
Abstract: An inspection apparatus is capable for inspecting at least one light-emitting device. The inspection apparatus includes a working machine and an inspection light source. The inspection light source is disposed on the working machine and located above the light-emitting device. A dominant wavelength of the inspection light source is smaller than a dominant wavelength of the light-emitting device so as to excite the light-emitting device and get an optical property of the light-emitting device.
Abstract translation: 检查装置能够检查至少一个发光装置。 检查装置包括作业机和检查光源。 检查光源设置在工作机上并位于发光装置的上方。 检查光源的主波长小于发光装置的主波长,从而激发发光装置并获得发光装置的光学特性。
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