Abstract:
Aspects of blending data detected by a monochromator over multiple wavelength ranges is described herein. In one embodiment, the monochromator includes a diffraction grating, a grating drive motor that rotates the diffraction grating to provide, by diffraction of broadband light, first dispersed wavelengths of light and second dispersed wavelengths of light, a detector that detects a first reflection from the first dispersed wavelengths of light and a second reflection from the second dispersed wavelengths of light, and processing circuitry that blends data values from the first reflection and data values from the second reflection together to provide a spectrum of combined data values. By blending data detected over multiple ranges, measurements of relatively high precision and quality can be provided over a wider spectral range.
Abstract:
A zoned order sorting filter for a spectrometer in a semiconductor metrology system is disclosed with reduced light dispersion at the zone joints. The order sorting filter comprises optically-transparent layers deposited underneath, or on top of thin-film filter stacks of the order sorting filter zones, wherein the thicknesses of the optically-transparent layers are adjusted such that the total optical lengths traversed by light at a zone joint are substantially equal in zones adjacent the zone joint. A method for wavelength to detector array pixel location calibration of spectrometers is also disclosed, capable of accurately representing the highly localized nonlinearities of the calibration curve in the vicinity of zone joints of an order sorting filter.
Abstract:
A method and apparatus for the spectrochemical analysis of a sample in which a solid state array detector (82) is used to detect radiation (62) of spectrochemical interest. The invention involves the use of a shutter (72) adjacent the entrance aperture (70) of a polychromator (74-80) to expose the detector (82) to the radiation (62) for varying lengths of time whereby for short duration exposure times charge accumulation in elements (i.e. pixels) of the detector (82) due to high intensity components of the radiation is limited and for longer exposure times charge accumulation in elements (pixels) of the detector (82) due to feeble intesity components of radiation (62) is increased. This ensures that each reading of the detector (82) includes at least one exposure in which the amount of charge accumulated at each wavelength of interest is neither too little or too great. The problems of feeble radiation components not being accurately measurable and of high intensity radiation components exceeding the charge carrying capacity of elements (pixels) of the detector (82) are thereby able to be avoided. An attenuator (90) may be placed between the radiation source (60) and the detector (82) to permit longer exposure times to be used for very high intensity radiation.
Abstract:
An optical system having a first order spectral range that is usable in an optical spectrum analyzer receives an broadband optical test signal and a optical calibration signal and couples the optical signals via two optically isolated paths to separate optical detectors. First and second pairs of optical fibers, with each pair having an input fiber and an output fiber, are positioned in a focal plane of a collimating optic that has an optical axis. The fiber pairs are symmetrically positioned on either side of the optical axis with the input fibers positioned on one side of the optical axis and the output fibers positioned on the opposite side of the optical axis. The input fibers receive the optical test signal and the optical calibration signal. The output optical fibers are coupled to first and second optical detectors. An optical calibration source generates second order or greater spectral lines that fall within the first order spectral range of the optical system. A diffraction grating receives the optical test signal and the optical calibration signal from the collimating optic and separates the first order spectral components of the broadband optical test signal and passes the second order or greater spectral lines of the optical calibration signal. The first optical detector that is responsive to the first order spectral components of the optical test signal receives the optical test signal from the collimating optic and converts the optical test signal to an electrical signal. A second optical detector that is responsive to the second order or greater spectral lines of the optical calibration signal concurrently receives the optical calibration signal from the collimating optic and converts the calibrations signal to an electrical signal.
Abstract:
An acousto-optic tunable filter 4 including: an acousto-optic crystal 41; an acoustic wave driver 42; and a piezoelectric transducer 43, is provided in front of a light source section 2 including a plurality of light sources 2A, 2B, . . . 2N having different wavelength characteristics. The frequency of RF generated by the acoustic wave driver 42 is varied in accordance with a desired wavelength. Thus, the light having the desired wavelength is incident on a converging lens 5 as plus and minus first-order light beams, and the light having wavelengths other than the desired wavelength is incident on a converging lens 5 as a zero-order light beam. The converging lens 5 converges the plus and minus first-order light beams and the zero-order light beams at positions different from each other. A selector 6 having openings located at the positions onto which the plus and first-order light beams are converged is provided in front of the converging lens 5. Therefore, only the light having the desired wavelength can pass through the selector 6 and is emitted from the light source apparatus 1.
Abstract:
A monochromator for examining very narrow band ranges of a light spectrum has a fixed inlet slot, a grid illuminated by said slot and rotatively driven by a grid drive, a fixed outlet slot arranged in the angular area of the generated spectrum and at least one cutoff filter arranged in the path of the rays, continuously and swivelingly driven by the grid drive transversely to the path of the rays for filtering out light of orders other than the observed order. The cutoff filter is coupled to the grid drive in such a way that it is synchronically swiveled over the same angle as the grid, covering the desired spectral range.
Abstract:
An improved flat field grating spectrometer for increasing the spectral resolutiion and usable spectral range. The spectrometer comprises an entrance slit or port, a concave grating, a field flattening lens and detection means encompassing the desired spectral region and capable of providing separate measurements between different regions of the spectral image plane. A second embodiment provides a beam splitter (dichroic or neutral density) placed between the grating and the detector to divert a portion of the energy at selected wavelengths through a second field flattening lens to a second detection means.
Abstract:
An optical system for a multidetector array spectrophotometer which includes multiple light sources for emitting light of selected wavelength ranges and means for selectively transmitting the selected wavelength ranges of light to respective slits of a multi-slit spectrograph for multiple wavelength range detection. The spectrograph has two or more slits which direct the selected wavelength ranges of the light spectra to fall upon a dispersive and focusing system which collects light from each slit, disperses the light by wavelength and refocuses the light at the positions of a single set of detectors.
Abstract:
A very wide spectral coverage grating spectrometer which gathers light from a scene being viewed and collimates that light. A mosaic grating is disposed in collimated space which disperses the collimated light. The dispersed light is focused onto a detector array.