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    METHOD AND SYSTEM FOR MUELLER MATRIX POLARIMETRIC CHARACTERIZATION OF TRANSPARENT OBJECTS
    11.
    发明公开
    METHOD AND SYSTEM FOR MUELLER MATRIX POLARIMETRIC CHARACTERIZATION OF TRANSPARENT OBJECTS 审中-公开

    公开(公告)号：US20230204494A1

    公开(公告)日：2023-06-29

    申请号：US18066374

    申请日：2022-12-15

    Applicant: Tata Consultancy Services Limited

    Inventor： ACHANNA ANIL KUMAR ,  TAPAS CHAKRAVARTY ,  SUBHASRI CHATTERJEE ,  ARPAN PAL ,  JAYAVARDHANA RAMA GUBBI LAKSHMINARASIMHA ,  ROKKAM KRISHNA KANTH

    IPC: G01N21/23 ,  G01J4/04 ,  G01N21/958

    CPC classification number: G01N21/23 ,  G01J4/04 ,  G01N21/958

    Abstract: Existing Mueller Matrix polarization techniques that rely only on polarization properties are insufficient for accurate characterization of transparent objects. Embodiments of the present disclosure provide a method and system for Mueller Matrix polarimetric characterization of transparent object using optical properties along with the polarization properties to accurately characterize the transparent object. The polarization properties of are derived from a decomposed Mueller matrix element. Additionally, the method derives the optical properties by further subjecting the decomposed Mueller matrix element to Fresnel’s law-based analysis and a reverse Monte Carlo analysis to extract optical properties such as a material refractive index and a material attenuation index. Optical properties vary with changes in the material property caused due to several factors such as manufacturing defect, aberration, inclusion of an impurity such as bubble or dust etc. Thus, considering the optical properties along with the polarization properties enables enhanced, accurate characterization of the transparent object.

    Light polarization state modulation and detection apparatuses and detection method
    15.
    发明授权
    Light polarization state modulation and detection apparatuses and detection method 有权

    公开(公告)号：US09976906B2

    公开(公告)日：2018-05-22

    申请号：US15202717

    申请日：2016-07-06

    Applicant: Graduate School at Shenzhen, Tsinghua University

    Inventor： Hui Ma ,  Jintao Chang ,  Honghui He ,  Nan Zeng ,  Yonghong He ,  Ran Liao ,  Shuqing Sun ,  Zhenhua Chen

    IPC: G01J4/00 ,  G01J4/04

    CPC classification number: G01J4/04

    Abstract: Disclosed are a light polarization state detection apparatus, a detection method and a light polarization state modulation method. The light polarization state detection apparatus comprises a lens with a variable birefringence feature as an optical phase modulator, a polarizer as a SOP analyzer, a plurality of common lenses and a CCD as imaging devices, and a data processing and displaying unit. The SOP detection apparatus uses wide special birefringence distribution of birefringence optical elements such as a GRIN lens to obtain the Stokes parameters of light to be measured by CCD single frame imaging, and can rapidly accurately measure the SOP. The SOP detection apparatus is simple in structure, lower in cost without containing any motion parts and electrical modulation devices, and is a fully static full Stokes parameters SOP detection apparatus.

    MEASURING POLARISATION
    16.
    发明申请
    MEASURING POLARISATION 审中-公开

    公开(公告)号：US20180058934A1

    公开(公告)日：2018-03-01

    申请号：US15321148

    申请日：2015-06-26

    Applicant: University of Salford Enterprises Limited

    Inventor： Tiehan SHEN ,  Paul Joseph COOK

    IPC: G01J4/04 ,  G02F1/1335 ,  G02F1/01

    CPC classification number: G01J4/04 ,  G01J2004/004 ,  G02F1/0136

    Abstract: A method and apparatus are disclosed for measuring polarisation of electromagnetic illumination. The method includes the steps of modulating a polarisation state of illumination received from a target object to generate modulated intensity illumination, selectively measuring an intensity of the modulated intensity illumination by periodically gating an exposure of an imaging device to the modulated intensity illumination at a first gating frequency; responsive to the measured intensity, determining polarisation parameters of the received illumination, and generating image data corresponding to the target object with a plurality of the polarisation parameters, wherein the illumination from the target object is modulated in accordance with a first frequency and the first gating frequency is associated with and synchronised with at least the first frequency.

    Phase-shift reticle for characterizing a beam
    18.
    发明授权
    Phase-shift reticle for characterizing a beam 有权

    公开(公告)号：US09631979B2

    公开(公告)日：2017-04-25

    申请号：US14865903

    申请日：2015-09-25

    Applicant: Benchmark Technologies

    Inventor： Yuqiang Tu ,  Patrick Reynolds

    IPC: G01N21/00 ,  G01J4/04

    CPC classification number: G01J4/04 ,  G03F1/44 ,  G03F7/70566 ,  G03F7/70641

    Abstract: Methods and apparatus for characterizing a beam parameter associated with an electromagnetic beam of a light source. The light source exposes a phase-shifted target through a set of focal distances relative to a focal plane of a substrate. At each focal distance of the set, registration values are measured and used to determine one or more registration slopes as a function of focal distance. The registration slopes are compared with baseline registration slopes to characterize the current relative state of the beam parameter in question. Beam parameters that may be characterized in this manner include degree of polarization and polarization rotation relative to an initial polarization direction. Phase shift test patterns advantageously used for beam characterization are described.

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