STRUCTURED SILICON-BASED THERMAL EMITTER
    41.
    发明申请
    STRUCTURED SILICON-BASED THERMAL EMITTER 有权
    结构硅基热发射体

    公开(公告)号:US20170012199A1

    公开(公告)日:2017-01-12

    申请号:US15203773

    申请日:2016-07-06

    Abstract: An optical radiation source produced from a disordered semiconductor material, such as black silicon, is provided. The optical radiation source includes a semiconductor substrate, a disordered semiconductor structure etched in the semiconductor substrate and a heating element disposed proximal to the disordered semiconductor structure and configured to heat the disordered semiconductor structure to a temperature at which the disordered semiconductor structure emits thermal infrared radiation.

    Abstract translation: 提供由诸如黑色硅的无序半导体材料产生的光辐射源。 光辐射源包括半导体衬底,在半导体衬底中蚀刻的无序半导体结构和设置在无序半导体结构附近的加热元件,其被配置为将无序半导体结构加热到无序半导体结构发射热红外辐射的温度 。

    Fourier transform infrared spectrophotometer
    43.
    发明授权
    Fourier transform infrared spectrophotometer 有权
    傅里叶变换红外分光光度计

    公开(公告)号:US09459150B2

    公开(公告)日:2016-10-04

    申请号:US14770849

    申请日:2013-02-28

    Inventor: Hisato Fukuda

    Abstract: A Fourier transform infrared spectrophotometer that is free from an effect of interference condition change resulting from an accessory being mounted and has a high measurement accuracy is provided. A Fourier transform infrared spectrophotometer according to the present invention is a Fourier transform infrared spectrophotometer including a common base on which a sample chamber 2 and an interference optical system are mounted, where an accessory 20 can be detachably in the sample chamber, the Fourier transform infrared spectrophotometer including: accessory information reading means 22 for reading accessory information provided to the accessory 20 when the accessory 20 is mounted in the sample chamber 2; and setting condition changing means (controller 30) for changing a setting condition for the interference optical system based on the accessory information read by the accessory information reading means 22, the setting condition varying depending on, e.g., a difference in weight between respective accessories 20.

    Abstract translation: 提供了一种傅立叶变换红外分光光度计,其不受由安装的附件引起的干扰条件变化的影响并具有高测量精度。 根据本发明的傅里叶变换红外分光光度计是一种傅里叶变换红外分光光度计,其包括:共用基底,其上安装有样品室2和干涉光学系统,其中附件20可拆卸地在样品室中,傅里叶变换红外 分光光度计包括:附件信息读取装置22,用于当附件20安装在样品室2中时,读取附件信息; 以及用于根据由附件信息读取装置22读取的附件信息来改变干涉光学系统的设置条件的设置条件改变装置(控制器30),该设置条件根据例如各个附件20之间的重量差异而变化 。

    Spectroscopic analysis
    44.
    发明授权
    Spectroscopic analysis 有权
    光谱分析

    公开(公告)号:US09354165B2

    公开(公告)日:2016-05-31

    申请号:US14409450

    申请日:2013-06-19

    Abstract: A method and analyzer for identifying, verifying or otherwise characterizing a sample involves emitting electromagnetic radiation in at least one beam at a sample. The electromagnetic radiation includes at least two different wavelengths. A sample detector detects affected electromagnetic radiation resulting from the emitted electromagnetic radiation affected by the sample and provides output representing the detected affected radiation. A processor determines sample coefficients from the output and identifies, verifies or otherwise characterizes the sample using the sample coefficients and training coefficients determined from training samples. The coefficients reduce sensitivity to a sample retainer variation and/or are independent of concentration.

    Abstract translation: 用于识别,验证或以其他方式表征样品的方法和分析仪包括在样品的至少一个束中发射电磁辐射。 电磁辐射包括至少两个不同的波长。 样品检测器检测受样品发射的电磁辐射产生的电磁辐射,并提供表示检测到的受影响辐射的输出。 处理器从输出端确定采样系数,并使用从训练样本确定的采样系数和训练系数来识别,验证或以其他方式表征样本。 系数降低了对样品保持器变化的敏感性和/或不依赖于浓度。

    ANALYSIS TARGET REGION SETTING APPARATUS
    47.
    发明申请
    ANALYSIS TARGET REGION SETTING APPARATUS 有权
    分析目标区域设置装置

    公开(公告)号:US20160011408A1

    公开(公告)日:2016-01-14

    申请号:US14773057

    申请日:2013-03-08

    Inventor: Akira NODA

    Abstract: Provided is an analysis target region setting apparatus that can accurately set an analysis target region, based on an observation image of a sample obtained with an optical microscope and the like irrespective of texture on the sample surface when the analysis target region is set therein. The analysis target region setting apparatus according to the present invention divides the observation image into a plurality of sub-regions based on pixel information on each pixel constituting the observation image. Subsequently, consolidation information on each sub-region is calculated, and two adjacent sub-regions themselves are consolidated based on the consolidation information. According to this, it is possible to divide the observation image into sub-regions having similar pixel information with a disregard of noise attributed to the shape of a surface and the like. A user designates one sub-region from among the sub-regions finally obtained, as the analysis target region.

    Abstract translation: 提供一种分析对象区域设定装置,其能够在设定分析对象区域时,基于用光学显微镜等获得的样本的观察图像来准确地设定分析对象区域,而与样本表面的纹理无关。 根据本发明的分析对象区域设定装置,根据构成观察图像的各像素的像素信息,将观察图像分割为多个子区域。 随后,计算每个子区域的合并信息,并且基于合并信息来合并两个相邻的子区域本身。 据此,可以将观察图像分割成具有类似像素信息的子区域,而不考虑由于表面形状等引起的噪声。 用户从最终获得的子区域中指定一个子区域作为分析目标区域。

    METHOD OF SPECTROMETRY AND SPECTROMETER
    48.
    发明申请
    METHOD OF SPECTROMETRY AND SPECTROMETER 有权
    光谱仪和光谱仪的方法

    公开(公告)号:US20150369729A1

    公开(公告)日:2015-12-24

    申请号:US14608539

    申请日:2015-01-29

    Abstract: A method of spectrometry on a spatially extensive sample with generation of a measure in respect of a match of a detected spectrum of a first generation with a single or a plurality of predetermined comparative spectra of chemical substances is disclosed. The method includes the steps: determining at least one location of the first generation on the sample, irradiating the sample with electromagnetic radiation with a plurality of frequencies or a frequency band between 1 GHz and 30 THz at the given location of the first generation of a first order on the sample, frequency-resolved detection of a measure in respect of the intensity of the electromagnetic radiation irradiated on to the sample at the location of the first generation and transmitted or reflected by the sample as the spectrum of the first generation, and calculating a respective measure in respect of a match of the detected spectrum of the first generation with one of the comparative spectra.

    Abstract translation: 公开了一种在空间广泛的样品上进行光谱测定的方法,其中生成关于第一代的检测光谱与化学物质的单个或多个预定比较光谱的匹配的测量。 该方法包括以下步骤:在样本上确定第一代的至少一个位置,在第一代的给定位置用具有多个频率或1GHz和30Hz之间的频带的电磁辐射照射样本 样本上的第一顺序,针对在第一代的位置处照射到样本并由样本发射或反射的电磁辐射的强度的度量的频率分辨检测作为第一代的谱,以及 计算关于第一代的检测光谱与比较光谱之一的匹配的相应测量。

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