Abstract:
An optical radiation source produced from a disordered semiconductor material, such as black silicon, is provided. The optical radiation source includes a semiconductor substrate, a disordered semiconductor structure etched in the semiconductor substrate and a heating element disposed proximal to the disordered semiconductor structure and configured to heat the disordered semiconductor structure to a temperature at which the disordered semiconductor structure emits thermal infrared radiation.
Abstract:
An optical system includes a tunable semiconductor light emitter that generates an input beam having a wavelength shorter than about 2.5 microns, an optical isolator coupled to the emitter and configured to block reflected light into the emitter, an optical amplifier receiving the input beam and outputting an intermediate beam, and optical fibers receiving the intermediate beam and forming an output beam. A subsystem includes lenses or mirrors that deliver the output beam to a sample. The subsystem may include an Optical Coherence Tomography (OCT) apparatus having a sample arm and a reference arm, the output beam having a temporal duration greater than approximately 30 picoseconds, a repetition rate between continuous wave and Megahertz or higher, and a time averaged intensity less than approximately 50 MW/cm2. The system may also include a light detection system collecting any of the output beam that reflects or transmits from the sample.
Abstract translation:光学系统包括可调谐半导体光发射器,其产生具有短于约2.5微米的波长的输入光束;光隔离器,耦合到发射器并被配置为阻挡入射发射器的反射光;接收输入光束的光放大器, 中间光束和接收中间光束的光纤并形成输出光束。 子系统包括将输出光束传递到样品的透镜或反射镜。 子系统可以包括具有采样臂和参考臂的光学相干断层扫描(OCT)装置,输出光束具有大于约30皮秒的时间持续时间,连续波和兆赫兹或更高之间的重复频率以及时间平均强度 小于约50MW / cm 2。 该系统还可以包括光检测系统,其收集从样品反射或透射的任何输出光束。
Abstract:
A Fourier transform infrared spectrophotometer that is free from an effect of interference condition change resulting from an accessory being mounted and has a high measurement accuracy is provided. A Fourier transform infrared spectrophotometer according to the present invention is a Fourier transform infrared spectrophotometer including a common base on which a sample chamber 2 and an interference optical system are mounted, where an accessory 20 can be detachably in the sample chamber, the Fourier transform infrared spectrophotometer including: accessory information reading means 22 for reading accessory information provided to the accessory 20 when the accessory 20 is mounted in the sample chamber 2; and setting condition changing means (controller 30) for changing a setting condition for the interference optical system based on the accessory information read by the accessory information reading means 22, the setting condition varying depending on, e.g., a difference in weight between respective accessories 20.
Abstract:
A method and analyzer for identifying, verifying or otherwise characterizing a sample involves emitting electromagnetic radiation in at least one beam at a sample. The electromagnetic radiation includes at least two different wavelengths. A sample detector detects affected electromagnetic radiation resulting from the emitted electromagnetic radiation affected by the sample and provides output representing the detected affected radiation. A processor determines sample coefficients from the output and identifies, verifies or otherwise characterizes the sample using the sample coefficients and training coefficients determined from training samples. The coefficients reduce sensitivity to a sample retainer variation and/or are independent of concentration.
Abstract:
A method and a system for measuring an optical asynchronous sample signal. The system for measuring an optical asynchronous sampling signal comprises a pulsed optical source capable of emitting two optical pulse sequences with different repetition frequencies, a signal optical path, a reference optical path, and a detection device. Since the optical asynchronous sampling signal can be measured by merely using one pulsed optical source, the complexity and cost of the system are reduced. A multi-frequency optical comb system using the pulsed optical source and a method for implementing the multi-frequency optical comb are further disclosed.
Abstract:
A measurement system includes a light source generating an output optical beam using semiconductor sources generating an input beam, optical amplifiers outputting an intermediate beam, and optical fibers receiving the intermediate beam and forming a first optical beam. A nonlinear element broadens the output beam spectrum to at least 10 nm, the spectrum comprising a near-infrared wavelength of 700-2500 nm. A measurement apparatus receives the output optical beam and delivers to a sample an analysis output beam. A receiver receives and processes the analysis output beam reflected or transmitted from the sample.
Abstract:
Provided is an analysis target region setting apparatus that can accurately set an analysis target region, based on an observation image of a sample obtained with an optical microscope and the like irrespective of texture on the sample surface when the analysis target region is set therein. The analysis target region setting apparatus according to the present invention divides the observation image into a plurality of sub-regions based on pixel information on each pixel constituting the observation image. Subsequently, consolidation information on each sub-region is calculated, and two adjacent sub-regions themselves are consolidated based on the consolidation information. According to this, it is possible to divide the observation image into sub-regions having similar pixel information with a disregard of noise attributed to the shape of a surface and the like. A user designates one sub-region from among the sub-regions finally obtained, as the analysis target region.
Abstract:
A method of spectrometry on a spatially extensive sample with generation of a measure in respect of a match of a detected spectrum of a first generation with a single or a plurality of predetermined comparative spectra of chemical substances is disclosed. The method includes the steps: determining at least one location of the first generation on the sample, irradiating the sample with electromagnetic radiation with a plurality of frequencies or a frequency band between 1 GHz and 30 THz at the given location of the first generation of a first order on the sample, frequency-resolved detection of a measure in respect of the intensity of the electromagnetic radiation irradiated on to the sample at the location of the first generation and transmitted or reflected by the sample as the spectrum of the first generation, and calculating a respective measure in respect of a match of the detected spectrum of the first generation with one of the comparative spectra.
Abstract:
A solid state detection system includes a degenerate photo-parametric amplifier (PPA), wherein the PPA comprises a photo diode, and a periodically pulsed light source, wherein the photo-parametric, amplifier (PPA) is synchronized to the pulsed light source with a phase locked loop that generates a pump waveform for the PPA at twice the frequency of the excitation pulse rate.
Abstract:
Provided are methods and systems for concurrent imaging at multiple wavelengths. In one aspect, a hyperspectral/multispectral imaging device includes a lens configured to receive light backscattered by an object, a plurality of photo-sensors, a plurality of bandpass filters covering respective photo-sensors, where each bandpass filter is configured to allow a different respective spectral band to pass through the filter, and a plurality of beam splitters in optical communication with the lens and the photo-sensors, where each beam splitter splits the light received by the lens into a plurality of optical paths, each path configured to direct light to a corresponding photo-sensor through the bandpass filter corresponding to the respective photo-sensor.