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    Spectroscopic analysis device and spectroscopic analysis method
    81.
    发明授权
    Spectroscopic analysis device and spectroscopic analysis method 有权

    公开(公告)号：US12050128B2

    公开(公告)日：2024-07-30

    申请号：US17755550

    申请日：2020-10-20

    Applicant: YOKOGAWA ELECTRIC CORPORATION

    Inventor： Kodai Murayama ,  Toshiyuki Saruya ,  Fumie Watanabe ,  Risa Hara

    IPC: G01J3/10 ,  G01J3/02 ,  G01N21/65 ,  G01J3/28

    CPC classification number: G01J3/108 ,  G01J3/0294 ,  G01N21/658 ,  G01J3/28 ,  G01J2003/2879

    Abstract: A spectroscopic analysis device (1) according to the present disclosure includes a controller (40) that acquires refractive index information on a sample (S) based on information on a first spectroscopic spectrum in a first wavelength band in which only a resonance spectrum of surface plasmon occurs within a spectroscopic spectrum, determines, based on the acquired refractive index information, an incidence angle of irradiation light (L1) irradiated by an irradiator (10) with respect to a membrane (M) such that the peak wavelength of the resonance spectrum and the peak wavelength of an absorption spectrum of the sample (S) match in a second spectroscopic spectrum in a second wavelength band in which the resonance spectrum and the absorption spectrum occur within the spectroscopic spectrum, and analyzes the state of the sample (S) from information on the second spectroscopic spectrum obtained based on the determined incidence angle.

    MULTI-SECTIONED WINDOW FOR SPECTROSCOPIC DEVICE
    82.
    发明公开
    MULTI-SECTIONED WINDOW FOR SPECTROSCOPIC DEVICE 审中-公开

    公开(公告)号：US20240247980A1

    公开(公告)日：2024-07-25

    申请号：US18159216

    申请日：2023-01-25

    Applicant: Endress+Hauser Optical Analysis, Inc.

    Inventor： Nicholas J. Croglio, JR. ,  Peter Scott ,  Douglas H. Beyer

    IPC: G01J3/02 ,  G01J3/45 ,  G02B1/11

    CPC classification number: G01J3/021 ,  G01J3/45 ,  G02B1/11

    Abstract: The present disclosure includes an optical head for a spectroscopic device configured to produce a beam of light, a reference signal detector, and a signal detector. A mirror reflects the beam of light from the light source toward a multi-sectioned window having a top side and a bottom side. The bottom side includes an AR coating and the top side has a first section including an AR coating and a second section including a beam splitter with transmittance and reflectance. A first beam path for the beam of light is defined by the mirror, the second section of the multi-sectioned window, and the reference signal detector. A second beam path for the beam of light is defined by the mirror, the second section of the multi-sectioned window, a medium contained in the spectroscopic device, an additional mirror, the first section of the multi-sectioned window, and the signal detector.

    Colorimeter colour standards
    83.
    发明授权
    Colorimeter colour standards 有权

    公开(公告)号：US12038327B2

    公开(公告)日：2024-07-16

    申请号：US17615538

    申请日：2020-07-17

    Applicant: TINTOMETER GMBH

    Inventor： Nicholas Jeremy Barnes ,  Amy Elizabeth Penn ,  Peter John Clarke

    IPC: G01J3/50 ,  G01J3/02 ,  G01J3/52

    CPC classification number: G01J3/501 ,  G01J3/0202 ,  G01J3/522

    Abstract: A method of making a colorimeter colour standard, including determining print parameters required to achieve a desired colour for the colour standard, printing the desired colour on a colour-receiving face of a first transparent piece using the determined print parameters and permanently affixing the printed first piece to a second transparent piece such that the colour-receiving face of the first transparent piece and a joining face of the second transparent piece are positioned at the interface between the first transparent piece and the second transparent piece.

    Color measuring apparatus
    87.
    发明授权
    Color measuring apparatus 有权

    公开(公告)号：US12025493B2

    公开(公告)日：2024-07-02

    申请号：US17658895

    申请日：2022-04-12

    Applicant: SEIKO EPSON CORPORATION

    Inventor： Tatsuya Shirane

    IPC: G01J3/02 ,  G01J3/50 ,  G01J3/51 ,  G01J3/26 ,  G01J3/32

    CPC classification number: G01J3/0202 ,  G01J3/0272 ,  G01J3/0291 ,  G01J3/50 ,  G01J3/26 ,  G01J3/32 ,  G01J3/51

    Abstract: A color measuring apparatus includes an opening portion that is provided in a bottom portion of the apparatus and takes light from a measurement target into the apparatus, an incident light processing unit that processes light that enters the apparatus through the opening portion, a housing that covers an apparatus internal unit including the incident light processing unit, at least one protrusion member that is configured to switch between a first state in which the protrusion member protrudes from a bottom surface of the housing and a second state in which the protrusion member does not protrude from the bottom surface of the housing, and at least one pressing member that presses the protrusion member in a protruding direction from the bottom surface of the housing.

    Arrayed Waveguide Multiplexing/Demultiplexing Device with Phase Correction
    88.
    发明公开
    Arrayed Waveguide Multiplexing/Demultiplexing Device with Phase Correction 审中-公开

    公开(公告)号：US20240210618A1

    公开(公告)日：2024-06-27

    申请号：US18392389

    申请日：2023-12-21

    Applicant: IMEC VZW

    Inventor： Bruno Figeys

    IPC: G02B6/12 ,  G01J3/02

    CPC classification number: G02B6/12014 ,  G01J3/0208 ,  G01J3/021 ,  G02B6/12021 ,  G02B2006/12104 ,  G02B2006/12164

    Abstract: An integrated photonics arrayed waveguide multiplexing/demultiplexing device is disclosed. The device includes an array of waveguides having an incident light waveguide section including a phase correcting region, a transmitted light waveguide section, a tunable reflector, wherein each pair of consecutive waveguides in the array includes a coupler. The coupler configured to combine light from the transmitted light waveguide sections, determine therefrom an optical phase difference between the two consecutive waveguides, and wherein the couplers are further configured to determine therefrom a change in optical path length required for each of two consecutive waveguides to reach a predetermined optical phase difference, and wherein each phase correcting region is configured to apply the change to correct the optical path length of the respective waveguide.

    On-chip temperature-insensitive read-out
    90.
    发明授权
    On-chip temperature-insensitive read-out 有权

    公开(公告)号：US12018984B2

    公开(公告)日：2024-06-25

    申请号：US17776032

    申请日：2020-11-18

    Applicant: UNIVERSITEIT GENT ,  IMEC VZW

    Inventor： Fabio Pavanello ,  Dries Van Thourhout ,  Roeland Baets

    IPC: G01J3/28 ,  G01J3/02 ,  G01J3/12

    CPC classification number: G01J3/0294 ,  G01J3/12 ,  G01J3/28 ,  G01J2003/1213 ,  G01J2003/2879

    Abstract: A temperature compensation method for wavelength monitoring using spectrometers on photonic integrated chips and a related temperature-compensated wavelength monitoring device include an optical filter of the chip filters a source signal to provide at least one spectral reference line to a first spectrometer to detect thermal wavelength drifts thereof. At least one spectral line to be monitored is received by the same or another spectrometer of the chip to detect wavelength shifts thereof. The detected thermal drift of the reference line is compared to calibrated thermal drifts for the reference line which is associated with a calibrated thermal drift for the spectral response curve of the spectrometer receiving the spectral line to be monitored. A thermal drift rate for the response curve of the optical filter differs from a thermal drift rate for the response curve of the first spectrometer at least by an amount.

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