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公开(公告)号:DE59805044D1
公开(公告)日:2002-09-05
申请号:DE59805044
申请日:1998-11-09
Applicant: INFINEON TECHNOLOGIES AG
Inventor: FEURLE ROBERT , SAVIGNAC DOMINIQUE , SCHNEIDER HELMUT
IPC: G05F3/24 , H03K19/0175
Abstract: A buffer circuit serves for buffering a supply voltage of an integrated circuit. The supply voltage is present between two potential nodes. A series circuit is disposed between the two potential nodes and includes at least two buffer capacitors between which a third potential node is disposed. The third potential node is connected to an additional circuit which influences the potential of the third potential node in such a way that it does not exceed an upper and/or lower limit value when a leakage current occurs through one of the capacitors. The advantage of the buffer circuit is that when there is a defect in just one of the buffer capacitors, the other capacitor is prevented from being destroyed.
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公开(公告)号:DE10104701A1
公开(公告)日:2002-08-29
申请号:DE10104701
申请日:2001-02-02
Applicant: INFINEON TECHNOLOGIES AG
Inventor: SAVIGNAC DOMINIQUE , SCHNEIDER HELMUT , PFEFFERL PETER , PFEIFFER JOHANN
IPC: G11C7/18 , G11C11/4096 , G11C7/14
Abstract: The method involves writing data into the memory simultaneously over the adjacent pairs of data lines. When reading data, data are only read from one of the pairs of data lines. Each data line is connected to a bit line via a switch and the switches to the four data lines are closed before writing data. Independent claims are also included for the following: a memory arrangement with at least two pairs of data lines.
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公开(公告)号:DE10051719A1
公开(公告)日:2002-05-08
申请号:DE10051719
申请日:2000-10-18
Applicant: INFINEON TECHNOLOGIES AG
Inventor: KLING SABINE , SAVIGNAC DOMINIQUE , MOLL HANS-PETER , HAFFNER HENNING , HIETSCHOLD ELKE
IPC: H01L21/768 , H01L21/8242 , H01L23/528 , H01L27/02 , H01L27/105 , H01L21/312 , H01L21/105 , H01L21/82 , G11C5/06 , H01L27/10
Abstract: The method involves using a lithographic process, whereby photo-lacquer structures are formed on the semiconducting substrate (5) to define dummy circuit structures. If an envisaged dummy structure (4) is smaller than a minimum size determined by the smallest required adhesive surface for photo-lacquer the first dummy structure is combined with a second to exceed the minimum size. An independent claim is also included for the following: a semiconducting substrate with functional circuit structures and dummy structures.
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公开(公告)号:DE59801722D1
公开(公告)日:2001-11-15
申请号:DE59801722
申请日:1998-11-11
Applicant: INFINEON TECHNOLOGIES AG
Inventor: SAVIGNAC DOMINIQUE , FEURLE ROBERT , SCHNEIDER HELMUT
IPC: G11C11/405 , G11C5/14 , G11C11/4074 , H02J9/06
Abstract: An integrated memory includes two potential nodes at which a supply voltage is present. Memory cells each have a selection transistor and a storage capacitor. At least one series circuit is disposed between the two potential nodes. The series circuits each have at least one buffer capacitor and one associated transistor. The associated transistor effects current limiting in the event of a defect in the at least one buffer capacitor. Each of the buffer capacitor and associated transistor have a mutual configuration and dimensions like the selection transistor and storage capacitor of one of the memory cells and have only an electrical connection differing from the selection transistor and storage capacitor.
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公开(公告)号:HK1005300A1
公开(公告)日:1998-12-31
申请号:HK98104392
申请日:1998-05-21
Applicant: INFINEON TECHNOLOGIES AG
Inventor: SAVIGNAC DOMINIQUE , SOMMER DIETHER , WEIDENHOEFER JUERGEN
IPC: G11C11/413 , G11C11/401 , G11C29/00 , G11C29/04 , G11C , G06F
Abstract: The column redundancy device for a memory has a memory blocks (BK1... N), with memory cells arranged in x rows and y columns, redundant memory cells, which are arranged in b rows and c columns, a column decoder (CDEC) with c redundant column decoders (RCD1 ... N), and d coding elements (CF1,1 ... CFP,4). Each column decoder (RCD1 ... 4) is assigned to one of the c redundant columns of each memory block (BK1 ... N). Each of the d coding elements (CF1,1 ... CFP,4) includes means of decoding addresses, and can thus be assigned to any memory block (BK1... N).
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公开(公告)号:DE102006031055A1
公开(公告)日:2007-02-01
申请号:DE102006031055
申请日:2006-07-05
Applicant: INFINEON TECHNOLOGIES AG
Inventor: RUCKERBAUER HERMANN , SAVIGNAC DOMINIQUE , SCHLEDZ RALF , SICHERT CHRISTIAN , FUKUZO YUKIO
Abstract: The device has a memory cell operated in a mode, in which the cell is directly operated as a memory device for error-correcting code (ECC)-information. The cell is operated in another mode, in which the cell serves as the memory device for storing information, which is different from the ECC -information. A signal control device (CTRL) is used for signaling in such a manner that the cell is operated in the former or latter mode. An independent claim is also included for a method for operating a semiconductor memory device.
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公开(公告)号:DE102005056351A1
公开(公告)日:2006-07-13
申请号:DE102005056351
申请日:2005-11-25
Applicant: INFINEON TECHNOLOGIES AG
Inventor: RUCKERBAUER HERMANN , SAVIGNAC DOMINIQUE , SICHERT CHRISTIAN
IPC: G11C11/409 , G11C7/22
Abstract: One embodiment of the present invention provides a memory device comprising a plurality of sets of memory banks, wherein each memory bank includes a memory array and is adapted to be read out in a data access; a plurality of internal data buses and a plurality of internal command and address buses connected to the plurality of sets of memory banks, respectively, such that each set of memory banks is associated with one of the internal data buses and one of the internal command and address buses; a command and address port for receiving command and address data from outside; and a command and address unit to direct the received command and address data to one of the sets of memory banks via the associated command and address bus, depending on the address data; and a data output unit for receiving data read out from one set of memory banks via the respective internal data bus in the data access and for serially outputting the received data.
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公开(公告)号:DE102004052612A1
公开(公告)日:2006-05-04
申请号:DE102004052612
申请日:2004-10-29
Applicant: INFINEON TECHNOLOGIES AG
Inventor: RUCKERBAUER HERMANN , SAVIGNAC DOMINIQUE , GREGORIUS PETER , SICHERT CHRISTIAN , WALLNER PAUL
IPC: G11C7/10 , G06F11/14 , G11C11/4093
Abstract: A semiconductor memory module includes a plurality of semiconductor memory chips. Each semiconductor memory chip includes an interface circuit that is configured to detect a transmission error in a write datum and is further configured to output, via a separate signal path, a repeat request signal for the repeated transmission of the write datum detected as erroneous. This repeat request signal can be transmitted either as a single-bit signal or as a multibit signal (e.g., serially as an individual signal line to a superordinate memory controller).
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公开(公告)号:DE102005042427A1
公开(公告)日:2006-04-13
申请号:DE102005042427
申请日:2005-09-07
Applicant: INFINEON TECHNOLOGIES AG
Inventor: GREGORIUS PETER , RUCKERBAUER HERMANN , SAVIGNAC DOMINIQUE , SICHERT CHRISTIAN , WALLNER PAUL
IPC: G06F12/00
Abstract: One embodiment of the present invention provides to a memory device adapted to receive data according to a write clock signal and to output data according to a read clock signal, comprising a clock port configured to output the read clock signal and to receive the write clock signal and a serial bidirectional driver configured to output the read clock signal via the clock port and to receive the write clock signal via the clock port simultaneously.
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公开(公告)号:DE10323237A1
公开(公告)日:2004-12-16
申请号:DE10323237
申请日:2003-05-22
Applicant: INFINEON TECHNOLOGIES AG
Inventor: BREDE RUEDIGER , FISCHER HELMUT , SAVIGNAC DOMINIQUE
IPC: G11C7/10 , G11C11/4076 , G11C29/50
Abstract: The method involves producing a real time period in the memory during a test mode. The real time period is selected so that a performance parameter of the memory improves between the execution time-points of two operations. The set time period is changed in the direction of the real time period in the test mode, and information relating to the modified set time period is stored in the memory. An independent claim is included for a semiconductor memory device.
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