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公开(公告)号:DE10337569B4
公开(公告)日:2008-12-11
申请号:DE10337569
申请日:2003-08-14
Applicant: INFINEON TECHNOLOGIES AG
Inventor: HELNEDER JOHANN , GOEBEL THOMAS , SCHWERD MARKUS , MITCHELL ANDREA , KOERNER HEINRICH , SECK MARTIN , DREXL STEFAN , KLEIN WOLFGANG , HOMMEL MARTINA
IPC: H01L23/522 , H01L21/3205 , H01L21/60 , H01L21/768 , H01L23/485 , H01L23/532
Abstract: A connection arrangement having an outer conductive structure arranged at least partly or completely in a cutout of an electrical insulation layer is provided. An inner conductive structure is arranged at the bottom of the cutout on one side of the insulation layer. The inner conductive structure adjoins the outer conductive structure in a contact zone. A contact area is arranged at the outer conductive structure on the other side of the cutout. The contact zone and the contact area do not overlap. The bottom of the cutout is arranged to overlaps at least half of the contact area, to provide a step in the insulation layer at the edge of the cutout outside a main current path between the contact area and the inner conductive structure.
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公开(公告)号:DE10341059B4
公开(公告)日:2007-05-31
申请号:DE10341059
申请日:2003-09-05
Applicant: INFINEON TECHNOLOGIES AG
Inventor: HELNEDER JOHANN , SCHWERD MARKUS , GOEBEL THOMAS , MITCHELL ANDREA , KOERNER HEINRICH , SECK MARTIN , TORWESTEN HOLGER
IPC: H01L27/08 , H01G9/042 , H01L21/02 , H01L21/316 , H01L21/822 , H01L23/522 , H01L27/01 , H01L27/06
Abstract: An integrated circuit and fabrication method are presented. The integrated circuit includes a capacitor containing a base electrode, a covering electrode, and a dielectric between the base and covering electrodes. The dielectric contains an oxide of a material contained in the base electrode, which may be produced by anodic oxidation. A peripheral edge of the dielectric is uncovered by the covering electrode. A base layer on the capacitor includes a cutout adjacent to the dielectric. During fabrication, the base layer protects the material of the base electrode that is to be anodically oxidized from chemicals, and also protects the surrounding regions from anodic oxidation. A precision resistor may be fabricated simultaneously with the capacitor.
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公开(公告)号:DE102005045060A1
公开(公告)日:2007-03-22
申请号:DE102005045060
申请日:2005-09-21
Applicant: INFINEON TECHNOLOGIES AG
Inventor: SCHWERD MARKUS , KOERNER HEINRICH , HOMMEL MARTINA , SECK MARTIN
IPC: H01L23/522 , H01L21/768 , H01L27/08
Abstract: The substrate (20) integrates semiconductor components. There are three circuit planes. These are designated close, intermediate or remote, with respect to the substrate, i.e. their spacing from the substrate increases with each layer. Each circuit plane contains a planar base surface and a planar covering surface adjoining a dielectric. The base surface of the circuit plane remote from the substrate (76), extends in a plane occupied by the covering surface of the intermediate circuit plane. Alternatively the base surface of the circuit plane remote from the substrate, extends in a plane lying closer to the substrate than a plane occupied by the covering surface of the intermediate circuit plane. In addition, the base surface of the intermediate circuit plane extends in a plane occupied by the covering surface of the circuit plane near the substrate. Alternatively the base surface of the intermediate circuit plane extends in a plane closer to the substrate than that occupied by the covering surface of the circuit plane close to the substrate. Circuit elements in the structure are further elaborated. A component formed by the elements (A-G), comprises one, two or more windings of a coil, a side wall of a coaxial line or parts of a condenser exceeding 10 mu m or 50 mu m in length. Salient features include use of aluminum or copper to form the tracks (34-38), at 60 atom% concentrations. They form internal conductors of the circuit (10). An even more remote conductive structure is included. One or more further circuit planes are included between the substrate and the circuit plane closest to it. An independent claim is also included for the method of manufacture.
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公开(公告)号:DE10327709A1
公开(公告)日:2005-01-13
申请号:DE10327709
申请日:2003-06-21
Applicant: INFINEON TECHNOLOGIES AG
Inventor: SECK MARTIN , BOETTNER THOMAS , HUTTNER THOMAS , DREXL STEFAN
IPC: H01L21/8228 , H01L27/082 , H01L21/331
Abstract: An integrated circuit arrangement and fabrication method is provided. The integrated circuit arrangement contains an NPN transistor and a PNP transistor. The PNP transistor contains an emitter connection region and a cutout. The cutout delimits the width of the emitter connection region. The electrically conductive material of the connection region laterally overlaps the cutout.
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公开(公告)号:DE10029072A1
公开(公告)日:2002-01-17
申请号:DE10029072
申请日:2000-06-13
Applicant: INFINEON TECHNOLOGIES AG
Inventor: JACOBS TOBIAS , SECK MARTIN , HEINECK LARS PETER
IPC: H01L21/02 , H01L21/762 , H01L27/08 , H01L21/822
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公开(公告)号:SG155055A1
公开(公告)日:2009-09-30
申请号:SG2007029515
申请日:2003-10-24
Applicant: INFINEON TECHNOLOGIES AG
Inventor: BOECK JOSEF , LACHNER RUDOLF , MEISTER THOMAS , SCHAEFER HERBERT , SECK MARTIN , STENGL REINHARD
IPC: H01L21/331 , H01L21/8222 , H01L27/082 , H01L29/08
Abstract: Method for producing transistor structure The invention relates to a method for fabricating a transistor structure, comprising at least a first and a second bipolar transistor having different collector widths. The invention is distinguished by the fact that all junctions between differently doped regions have a sharp interface. In this case, by way of example, a first collector region 2.1 is suitable for a high- frequency transistor with high limiting frequencies fT and a second collector region 2.2 is suitable for a high-voltage transistor with increased breakdown voltages. Figure 3c
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公开(公告)号:DE10250204B8
公开(公告)日:2008-09-11
申请号:DE10250204
申请日:2002-10-28
Applicant: INFINEON TECHNOLOGIES AG
Inventor: STENGL REINHARD , MEISTER THOMAS , SCHAEFER HERBERT , BOECK JOSEF , SECK MARTIN , LACHNER RUDOLF
IPC: H01L21/8222 , H01L21/331 , H01L27/082 , H01L29/08 , H01L29/732
Abstract: A method for fabricating a transistor structure with a first and a second bipolar transistor having different collector widths is presented. The method includes providing a semiconductor substrate, introducing a first buried layer of the first bipolar transistor and a second buried layer of the second bipolar transistor into the semiconductor substrate, and producing at least a first collector region having a first collector width on the first buried layer and a second collector region having a second collector width on the second buried layer. A first collector zone having a first thickness is produced on the second buried layer for production of the second collector width. A second collector zone having a second thickness is produced on the first collector zone. At least one insulation region is produced that isolates at least the collector regions from one another.
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公开(公告)号:DE10250204B4
公开(公告)日:2008-04-30
申请号:DE10250204
申请日:2002-10-28
Applicant: INFINEON TECHNOLOGIES AG
Inventor: STENGL REINHARD , MEISTER THOMAS , SCHAEFER HERBERT , BOECK JOSEF , SECK MARTIN , LACHNER RUDOLF
IPC: H01L21/8222 , H01L21/331 , H01L27/082 , H01L29/08 , H01L29/732
Abstract: A method for fabricating a transistor structure with a first and a second bipolar transistor having different collector widths is presented. The method includes providing a semiconductor substrate, introducing a first buried layer of the first bipolar transistor and a second buried layer of the second bipolar transistor into the semiconductor substrate, and producing at least a first collector region having a first collector width on the first buried layer and a second collector region having a second collector width on the second buried layer. A first collector zone having a first thickness is produced on the second buried layer for production of the second collector width. A second collector zone having a second thickness is produced on the first collector zone. At least one insulation region is produced that isolates at least the collector regions from one another.
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公开(公告)号:DE102005045056A1
公开(公告)日:2007-03-29
申请号:DE102005045056
申请日:2005-09-21
Applicant: INFINEON TECHNOLOGIES AG
Inventor: SCHWERD MARKUS , KOERNER HEINRICH , HOMMEL MARTINA , SECK MARTIN
IPC: H01L23/522 , H01L21/768 , H01L27/08
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公开(公告)号:DE10341059A1
公开(公告)日:2005-04-14
申请号:DE10341059
申请日:2003-09-05
Applicant: INFINEON TECHNOLOGIES AG
Inventor: HELNEDER JOHANN , SCHWERD MARKUS , GOEBEL THOMAS , MITCHELL ANDREA , KOERNER HEINRICH , SECK MARTIN , TORWESTEN HOLGER
IPC: H01L21/02 , H01L21/316 , H01L23/522 , H01L27/01 , H01L27/08 , H01L21/822 , H01G9/042
Abstract: An integrated circuit and fabrication method are presented. The integrated circuit includes a capacitor containing a base electrode, a covering electrode, and a dielectric between the base and covering electrodes. The dielectric contains an oxide of a material contained in the base electrode, which may be produced by anodic oxidation. A peripheral edge of the dielectric is uncovered by the covering electrode. A base layer on the capacitor includes a cutout adjacent to the dielectric. During fabrication, the base layer protects the material of the base electrode that is to be anodically oxidized from chemicals, and also protects the surrounding regions from anodic oxidation. A precision resistor may be fabricated simultaneously with the capacitor.
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