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公开(公告)号:DE60143178D1
公开(公告)日:2010-11-18
申请号:DE60143178
申请日:2001-06-15
Inventor: NISHIMURA YUKIO , YAMAHARA NOBORU , YAMAMOTO MASAFUMI , KAJITA TORU , SHIMOKAWA TSUTOMU , ITO HIROSHI
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公开(公告)号:DE60323577D1
公开(公告)日:2008-10-30
申请号:DE60323577
申请日:2003-07-30
Applicant: JSR CORP
Inventor: SUGITA HIKARU , KONNO KEIJI , TANAKA MASATO , SHIMOKAWA TSUTOMU
IPC: C07C33/38 , C07C69/608 , C07C69/00 , C08F232/08 , G03F7/09
Abstract: Novel compounds acetoxymethylacenaphthylene and hydroxymethylacenaphthyleneare disclosed. A polymer prepared from these novel compounds containing a structural unit of the formula (3), wherein R is a hydrogen atom and R and R individually represent a monovalent atom or a monovalent organic group is also disclosed. The polymer is suitable as a component for an antireflection film-forming composition exhibiting a high antireflection effect and not causing intermixing with a resist film.
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公开(公告)号:SG125883A1
公开(公告)日:2006-10-30
申请号:SG200004850
申请日:2000-09-16
Applicant: JSR CORP
Inventor: DOUKI KATSUJI , MURATA KIYOSHI , ISHII HIROYUKI , KAJITA TORU , SHIMOKAWA TSUTOMU
Abstract: A radiation-sensitive resin composition comprising (A) a resin containing an acid-dissociable group which is insoluble or scarcely soluble in alkali and becomes alkali soluble when the acid-dissociable group dissociates, comprising the following recurring unit (I), recurring unit (II), and at least one of the recurring units (III-1) and (III-2), and (B) a photoacid generator. The radiation-sensitive resin composition is suitable for use as a chemically-amplified resist showing sensitivity to active radiation such as deep ultraviolet rays represented by a KrF excimer laser or ArF excimer laser, exhibiting superior dry etching resistance without being affected by types of etching gas, having high radiation transmittance, exhibiting excellent basic characteristics as a resist such as sensitivity, resolution, and pattern shape, possessing excellent storage stability as a composition, and exhibiting sufficient adhesion to substrates.
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公开(公告)号:DE60025297T2
公开(公告)日:2006-08-17
申请号:DE60025297
申请日:2000-09-14
Applicant: JSR CORP
Inventor: DOUKI KATSUJI , MURATA KIYOSHI , ISHII HIROYUKI , KAJITA TORU , SHIMOKAWA TSUTOMU
Abstract: A radiation-sensitive resin composition comprising (A) a resin containing an acid-dissociable group which is insoluble or scarcely soluble in alkali and becomes alkali soluble when the acid-dissociable group dissociates, comprising the following recurring unit (I), recurring unit (II), and at least one of the recurring units (III-1) and (III-2), and (B) a photoacid generator. The radiation-sensitive resin composition is suitable for use as a chemically-amplified resist showing sensitivity to active radiation such as deep ultraviolet rays represented by a KrF excimer laser or ArF excimer laser, exhibiting superior dry etching resistance without being affected by types of etching gas, having high radiation transmittance, exhibiting excellent basic characteristics as a resist such as sensitivity, resolution, and pattern shape, possessing excellent storage stability as a composition, and exhibiting sufficient adhesion to substrates.
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公开(公告)号:DE60025297D1
公开(公告)日:2006-03-30
申请号:DE60025297
申请日:2000-09-14
Applicant: JSR CORP
Inventor: DOUKI KATSUJI , MURATA KIYOSHI , ISHII HIROYUKI , KAJITA TORU , SHIMOKAWA TSUTOMU
Abstract: A radiation-sensitive resin composition comprising (A) a resin containing an acid-dissociable group which is insoluble or scarcely soluble in alkali and becomes alkali soluble when the acid-dissociable group dissociates, comprising the following recurring unit (I), recurring unit (II), and at least one of the recurring units (III-1) and (III-2), and (B) a photoacid generator. The radiation-sensitive resin composition is suitable for use as a chemically-amplified resist showing sensitivity to active radiation such as deep ultraviolet rays represented by a KrF excimer laser or ArF excimer laser, exhibiting superior dry etching resistance without being affected by types of etching gas, having high radiation transmittance, exhibiting excellent basic characteristics as a resist such as sensitivity, resolution, and pattern shape, possessing excellent storage stability as a composition, and exhibiting sufficient adhesion to substrates.
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16.
公开(公告)号:CA2387716A1
公开(公告)日:2002-03-07
申请号:CA2387716
申请日:2001-08-24
Applicant: JSR CORP
Inventor: BESSHO NOBUO , SHIMOKAWA TSUTOMU , YAMADA KENJI , KUMANO ATSUSHI , NISHIMURA ISAO
IPC: C08L67/00 , C08L69/00 , C08L83/14 , G02B1/04 , G02B5/18 , G02B6/124 , G03F7/00 , G03F7/004 , G03F7/039 , G03F7/075 , G02B3/00 , C08L101/00 , G03H1/02 , G02B6/12 , G03F7/36
Abstract: A composition having a refractive index sensitively changeable by a radiatio n which comprises (A) a decomposable compound, (B) a non-decomposable compound having a refractive index lower than that of the decomposable compound (A), (C) a radiation-sensitive decomposing agent, and (D) a stabilizer. The irradiation of the composition with a radiation ray via a mask decomposes th e above (C) and (A) components in a irradiated portion, resulting in the occurrence of the difference in refractive index between an irradiated porti on and a non-irradiated portion, which leads to the formation of a pattern havi ng regions of different refractive indexes.
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公开(公告)号:DE60236710D1
公开(公告)日:2010-07-29
申请号:DE60236710
申请日:2002-04-25
Applicant: JSR CORP
Inventor: NAGAI TOMOKI , NUMATA JUN , KOBAYASHI EIICHI , SHIMOKAWA TSUTOMU
IPC: G03F7/004 , G03F7/039 , C08F12/24 , H01L21/027
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18.
公开(公告)号:AU2002222583B2
公开(公告)日:2006-06-15
申请号:AU2002222583
申请日:2001-12-06
Applicant: JSR CORP
Inventor: SHIMOKAWA TSUTOMU , BESSHO NOBUO , KUMANO ATSUSHI , NISHIMURA ISAO , YAMADA KENJI
IPC: C08L101/00 , G03F7/00 , G03F7/004 , G03F7/039 , G03F7/075
Abstract: A radiation sensitive refractive index changing composition comprising (A) a decomposable compound, (B) a non-decomposable compound having a higher refractive index than the decomposable compound (A), (C) a radiation sensitive decomposer and (D) astabilizer. By exposing this composition to radiation through a pattern mask, the above components (C) and (A) of an exposed portion decompose to create a refractive index difference between the exposed portion and an unexposed portion, thereby forming a pattern having different refractive indices.
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公开(公告)号:DE60105523T2
公开(公告)日:2005-09-29
申请号:DE60105523
申请日:2001-11-13
Applicant: JSR CORP
Inventor: KAWAGUCHI KAZUO , TANAKA MASATO , SHIMOKAWA TSUTOMU
Abstract: An anti-reflection coating-forming composition is provided. This composition includes a polymer and a solvent. The polymer has a structural unit represented by the formula (1): wherein R1 is a monovalent atom other than a hydrogen atom or a monovalent group, and n is an integer of 0-4, provided that when n is an integer of 2-4, a plural number of R1's are the same or different; R2 and R3 are each a monovalent atom or group; and X is a bivalent group. The anti-reflection coating formed from this composition has a high antireflective effect, does not generate intermixing with a resist film, and enables a good resist pattern profile excellent in resolution and precision in cooperation with a positive or negative resist.
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公开(公告)号:DE60102028T2
公开(公告)日:2004-06-24
申请号:DE60102028
申请日:2001-04-05
Applicant: JSR CORP
Inventor: IWASAWA HARUO , SHIMOKAWA TSUTOMU , AKIHIRO HAYASHI , NISHIYAMA SATORU
IPC: C08G77/42 , C07F7/08 , C08G77/14 , C08G77/24 , C08L83/06 , C08L83/08 , G03F7/004 , G03F7/075 , C08G77/04 , C08L83/04 , C08L83/14 , C07F7/04 , C07F7/21 , G03F7/039
Abstract: A novel polysiloxane having the following structural units (I) and/or (II) and the structural unit (III), wherein A and A are an acid-dissociable monovalent organic group, R is hydrogen, monovalent (halogenated) hydrocarbon, halogen, or amino, R is monovalent (halogenated) hydrocarbon group, or halogen. A method of preparing such a polysiloxane, a silicon-containing alicyclic compound providing this polysiloxane, and a radiation-sensitive resin composition comprising this polysiloxane are also provided. The polysiloxane is useful as a resin component for a resist material, effectively senses radiation with a short wavelength, exhibits high transparency to radiation and superior dry etching properties, and excels in basic resist properties required for resist materials such as high sensitivity, resolution, developability, etc.
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