STACKED NANOWIRE OR NANOSHEET GATE-ALL-AROUND DEVICE AND METHOD FOR MANUFACTURING THE SAME

    公开(公告)号:US20210151561A1

    公开(公告)日:2021-05-20

    申请号:US16824810

    申请日:2020-03-20

    Abstract: A stacked nanowire or nanosheet gate-all-around device, including: a silicon substrate; stacked nanowires or nanosheets located on the silicon substrate, extending along a first direction gate stacks and including multiple nanowires or nanosheets that are stacked; a gate stack, surrounding each of the stacked nanowires or nanosheets, and extending along a second direction, where first spacers are located on two sidewalls of the gate stack in the first direction; source-or-drain regions, located at two sides of the gate stack along the first direction; a channel region, including a portion of the stacked nanowires or nanosheets that is located between the first spacers. A notch structure recessed inward is located between the stacked nanowires or nanosheets and the silicon substrate, and includes an isolator that isolates the stacked nanowires or nanosheets from the silicon substrate. A method for manufacturing the stacked nanowire or nanosheet gate-all-around device is further provided.

    SEMICONDUCTOR DEVICE, METHOD OF MANUFACTURING THE SAME AND ELECTRONIC DEVICE INCLUDING THE SAME

    公开(公告)号:US20210043762A1

    公开(公告)日:2021-02-11

    申请号:US16966862

    申请日:2018-10-31

    Inventor: Huilong ZHU

    Abstract: There are provided a vertical semiconductor device, a method of manufacturing the same, and an electronic device including the same. According to an embodiment, the semiconductor device may include a vertical active region disposed on a substrate and comprising a first source/drain layer, a channel layer and a second source/drain layer which are stacked in sequence; a gate stack surrounding at least a part of a periphery of the channel layer; and at least one of: a first electrical connection component for the first source/drain layer, comprising a first contact portion disposed above a top surface of the active region and a first conductive channel in contact with the first contact portion and extending from the top surface of the active region to be in contact with at least a part of sidewalls of the first source/drain layer; and a second electrical connection component for the gate stack, comprising a second contact portion disposed above the top surface of the active region and a second conductive channel in contact with the second contact portion and extending from the top surface of the active region to be in contact with at least a part of sidewalls of a gate conductor layer in the gate stack.

    DETECTOR BASED ON GALLIUM NITRIDE-BASED ENHANCEMENT-MODE DEVICE AND MANUFACTURING METHOD THEREOF

    公开(公告)号:US20210043761A1

    公开(公告)日:2021-02-11

    申请号:US16868708

    申请日:2020-05-07

    Abstract: A detector based on a gallium nitride-based enhancement-mode device and a manufacturing method thereof. The detector is a gas or solution detector. When the detector is used in electrolyte solution detection, electrolyte solution is located in the gate opening region and directly contacts the thin barrier layer to form a contact interface. The electrolyte solution affects interface charges at the contact interface, leading to a change in a concentration of the two-dimensional electron gas, and further a change in a current between the source and the drain. When the detector is used in a hydrogen-containing gas detection, the H concentration of the hydrogen-containing gas affects interface charges at the contact interface between the gate and the thin barrier layer, leading to a change in a concentration of the two-dimensional electron gas, and further a change in the current between the source and the drain.

    Semiconductor arrangements and methods of manufacturing the same

    公开(公告)号:US10825738B2

    公开(公告)日:2020-11-03

    申请号:US16222570

    申请日:2018-12-17

    Inventor: Huilong Zhu

    Abstract: Semiconductor arrangements and methods of manufacturing the same. The semiconductor arrangement may include: a substrate including a base substrate, a first semiconductor layer on the substrate, and a second semiconductor layer on the first semiconductor layer; first and second fin structures formed on the substrate and extending in the same straight line, each of the first and second fin structures including at least portions of the second semiconductor layer; a first isolation part formed around the first and second fin structures on opposite sides of the straight line; first and second FinFETs formed on the substrate based on the first and second fin structures respectively; and a second isolation part between the first and second fin structures and intersecting the first and second fin structures to isolate the first and second fin structures from each other.

    METHOD FOR IMPLEMENTING LOGIC CALCULATION BASED ON A CROSSBAR ARRAY STRUCTURE OF RESISTIVE SWITCHING DEVICE

    公开(公告)号:US20200335165A1

    公开(公告)日:2020-10-22

    申请号:US16959225

    申请日:2018-01-22

    Abstract: An operation method for integrating logic calculations and data storage based on a crossbar array structure of resistive switching devices. The calculation and storage functions of the method are based on the same hardware architecture, and the data storage is completed while performing calculation, thereby realizing the fusion of calculation and storage. The method includes applying a pulse sequence to a specified word line or bit line by a controller, configuring basic units of resistive switching devices to form different serial-parallel structures, such that three basic logic operations, i.e. NAND, OR, and COPY, are implemented and mutually combined on this basis, thereby implementing 16 types of binary Boolean logic and full addition operations, and on this basis, a method for implementing a parallel logic and full addition operations is provided.

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