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公开(公告)号：KR1020170106151A
公开(公告)日：2017-09-20
申请号：KR1020160092482
申请日：2016-07-21
Applicant: 삼성전자주식회사
Abstract: 피치가좁고, 많은수의신호버스를포함하는반도체패키지의동작성능등을효과적으로검사함과동시에, 반도체패키지의생산성을향상시킬수 있는반도체패키지테스트방법을제공하는것이다. 상기반도체패키지테스트방법은제1 반도체칩을포함하는제1 반도체패키지를제공하되, 상기제1 반도체칩은제1 피치로배열된제1 외부단자그룹과, 상기제1 피치보다큰 제2 피치로배열된제2 외부단자그룹이일면에배치되고, 상기제1 외부단자그룹과제1 컨택터를접촉하여, 상기제1 반도체패키지에대한제1 테스트를수행하고, 상기제2 외부단자그룹과제2 컨택터를접촉하여, 상기제1 반도체패키지에대한제2 테스트를수행하는것을포함한다.
Abstract translation: 间距窄，以提供大量的信号必须有效地检查这样的半导体封装的操作性能包括总线，并在同一时间，可以提高半导体封装件的生产率，半导体封装用的测试方法。 的半导体封装测试方法的第一，但提供了一种半导体封装件，所述第一半导体芯片比第一外部端子组，其中所述第一间距布置在包括第一半导体芯片的第一间距大的第二间距， 布置在第二外部端子组被布置在一侧上，所述第一外部端子组分配第一接触器以接触，所述第一对所述半导体封装的第一次测试，并且所述第二外部端子组任务2个触点 并且对第一半导体封装执行第二测试。
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公开(公告)号：KR1020140124065A
公开(公告)日：2014-10-24
申请号：KR1020130041166
申请日：2013-04-15
Applicant: 삼성전자주식회사
CPC classification number: G01R31/2868
Abstract: 본 발명은 검사 장치 및 검사 방법을 개시한다. 검사 장치는 셀프 검사 가능한 반도체 소자들의 검사 공정을 수행하는 장치이다. 그의 장치는, 상기 반도체 소자들의 검사에 사용되는 검사 프로그램을 보유한 서버와 통신하는 스택커 부와, 상기 반도체 소자들을 탑재하여 상기 스택커 부 내에 제공되고, 상기 서버로부터 상기 검사 프로그램을 전달받아 상기 반도체 소자들에 제공하는 복수개의 검사 기판 부들을 포함한다. 상기 스택커 부는 상기 복수개의 검사 기판 부들을 수납하는 스택커들과, 상기 스택커 내의 상기 검사 기판 부들 및 상기 서버와 통신하는 스택커 컨트롤러를 포함할 수 있다
Abstract translation: 公开了一种测试装置和测试方法。 提供了测试装置来进行可以自我测试的半导体器件的测试过程。 测试装置包括：与包括用于半导体器件测试的测试程序的服务器通信的堆垛单元; 以及多个测试基板单元，其包括为堆叠单元提供的半导体器件，并接收要提供给半导体器件的测试程序。 堆垛机单元包括用于接收测试基板单元的堆垛机和与堆垛机和服务器中的测试基板单元通信的堆垛机控制器。
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公开(公告)号：KR1020140037394A
公开(公告)日：2014-03-27
申请号：KR1020120103015
申请日：2012-09-17
Applicant: 삼성전자주식회사
IPC: G01R31/26
CPC classification number: G01R31/2601 , G01R31/2865 , G01R31/2874
Abstract: Disclosed in the present invention are a test handler and a test method for a semiconductor element using the same. The test handler includes: chambers which provide a closed inner space for accommodating a first tray onto which semiconductor elements are loaded; a test module which electrically touches the semiconductor elements in the chambers in order to perform a test process of the semiconductor elements; and a sorting unit which loads or unloads the first tray in the chambers and sorts out semiconductor elements which are determined as faulty in the test process. The chambers may have a fluid path for circulating a coolant or a heat medium inside the walls in order to enable fast temperature switching between a first temperature below the room temperature and a second temperature above the room temperature during the test process of the semiconductor elements.
Abstract translation: 在本发明中公开了一种使用其的半导体元件的测试处理器和测试方法。 测试处理器包括：提供封闭内部空间的室，用于容纳加载有半导体元件的第一托盘; 测试模块，其电接触所述腔室中的半导体元件，以便执行半导体元件的测试过程; 以及分类单元，其将室内的第一托盘装载或卸载，并对在测试过程中被确定为故障的半导体元件进行分类。 腔室可以具有用于在壁内循环冷却剂或热介质的流体路径，以便在半导体元件的测试过程期间实现在室温以下的第一温度和高于室温的第二温度之间的快速温度切换。
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公开(公告)号：KR1020110050925A
公开(公告)日：2011-05-17
申请号：KR1020090107516
申请日：2009-11-09
Applicant: 삼성전자주식회사
IPC: G01R31/3177 , G01R31/3181 , G11C29/00
CPC classification number: G11C29/56 , G11C2029/5606 , H05K1/0295 , H05K2201/10159 , H05K2201/10325 , H05K2203/162
Abstract: PURPOSE: A signal capturing system and a test device including the same are provided to realize various kinds of module RAM on one printed circuit board by loading a socket, in which various kinds of memory components is loaded, on the printed circuit board. CONSTITUTION: A socket(120) is in connection with a printed circuit board and loads a reference memory component. An interposer(130) is loaded on the printed circuit board and is in connection with the socket, an external device, and a storage device. A first signal from the reference memory component is received in the interposer and is transferred to the external device and the storage device. A second signal from the external device is received in the interposer and is transferred to the reference memory component and the storage device.
Abstract translation: 目的：提供一种信号捕获系统和包括该信号捕获系统的测试装置，通过在印刷电路板上装载各种存储器组件的插座来实现一个印刷电路板上的各种模块RAM。 构成：插座（120）与印刷电路板连接并加载参考存储器组件。 插入器（130）装载在印刷电路板上并与插座，外部设备和存储设备连接。 来自参考存储器部件的第一信号被接收在插入器中并被传送到外部设备和存储设备。 来自外部设备的第二信号被接收在插入器中并被传送到参考存储器组件和存储设备。
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公开(公告)号：KR1020090057553A
公开(公告)日：2009-06-08
申请号：KR1020070124180
申请日：2007-12-03
Applicant: 삼성전자주식회사
CPC classification number: G01R31/2893 , G01R1/04
Abstract: A test carrier and a teat device including the same are provided to support a first surface and a second surface of a semiconductor package by using a first support member and a second support member to operate independently. A subject is received in an opening(112) of a carrier body(110). A first support member(120) is rotatably connected to the carrier body. The first support member selectively supports the first surface of the subject. The second support member is rotatably connected to the carrier body. The second support member operates independently with regard to the first support member. The second support member supports the second surface of the subject opposite to the first surface.
Abstract translation: 通过使用第一支撑构件和第二支撑构件独立地操作来提供包括该测试载体和乳头装置的测试载体和乳头装置以支撑半导体封装的第一表面和第二表面。 受试者被接收在承载体（110）的开口（112）中。 第一支撑构件（120）可旋转地连接到载体主体。 第一支撑构件选择性地支撑受试者的第一表面。 第二支撑构件可旋转地连接到载体主体。 第二支撑构件相对于第一支撑构件独立地操作。 第二支撑构件支撑与第一表面相对的对象的第二表面。
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Patent Agency Ranking
公开(公告)号：KR1020090006308A
公开(公告)日：2009-01-15
申请号：KR1020070069509
申请日：2007-07-11
Applicant: 삼성전자주식회사
IPC: H01L21/66
CPC classification number: G01R31/2893
Abstract: The test apparatus is provided to replace a desired test unit without stopping the operation and to reduce the waiting time of the semiconductor package. The test chamber(110) accommodates the object for the electrical characteristic is tested. The tray(170) in which semiconductor packages are accepted are arranged within the test chamber. The guide member is arranged in the floor of the test chamber in the first direction. The guide member comprises a pair of the rail(120). The conveying unit comprises the shuttle(140) and robot machanism(150). The shuttle is arranged in the floor of the test chamber in the second direction.
Abstract translation: 提供了测试装置来替代期望的测试单元而不停止操作并且减少半导体封装的等待时间。 测试室（110）容纳物体以测试电气特性。 其中半导体封装被接受的托盘（170）布置在测试室内。 引导构件沿第一方向布置在测试室的地板中。 引导构件包括一对轨道（120）。 传送单元包括梭子（140）和机器人机构（150）。 梭子沿第二个方向排列在测试室的地板上。
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公开(公告)号：KR1020080022919A
公开(公告)日：2008-03-12
申请号：KR1020060086746
申请日：2006-09-08
Applicant: 삼성전자주식회사
Abstract: A fluid control valve used for a manufacturing apparatus of a display apparatus is provided to detect easily an erroneous state of a fluid control unit by forming a main body unit with a transparent material or a semi-transparent material. A fluid control valve includes a main body unit(10) and a fluid control unit(20). The main body unit includes a fluid path. The fluid control unit is inserted into the fluid path in order to adjust a flow rate of the fluid. The main body unit is transparent or semi-transparent. The main body unit is formed of a polymer material or a PVC(Polyvinyl Chloride) material. The fluid control unit is formed of a fluoric resin material. The fluid control valve includes a diaphragm valve and a QDR valve.
Abstract translation: 用于显示装置的制造装置的流体控制阀被设置成通过用透明材料或半透明材料形成主体单元来容易地检测流体控制单元的错误状态。 流体控制阀包括主体单元（10）和流体控制单元（20）。 主体单元包括流体路径。 流体控制单元被插入到流体路径中以调节流体的流量。 主体单元是透明或半透明的。 主体单元由聚合物材料或PVC（聚氯乙烯）材料形成。 流体控制单元由氟树脂材料形成。 流体控制阀包括隔膜阀和QDR阀。
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28.发明授权금속유기물증착법에 의한 ＣｕＩｎＳ2 박막의 제조방법,그로 제조된 ＣｕＩｎＳ2 박막 및 그를 이용한 Ｉｎ2Ｓ3박막의 제조방법 失效使用金属有机化学气相沉积的Cu2S薄膜的制造方法，CUINS2薄膜及其使用的In2S3薄膜的制造方法
公开(公告)号：KR100789064B1
公开(公告)日：2007-12-26
申请号：KR1020060066427
申请日：2006-07-14
Applicant: 중앙대학교 산학협력단 , 삼성전자주식회사 , 재단법인서울대학교산학협력재단
IPC: C23C16/18
CPC classification number: H01L31/0322 , C23C16/305 , Y02E10/541
Abstract: A method of manufacturing a CuInS2 thin film by metal organic chemical vapor deposition and a CuInS2 thin film manufactured by the method are provided to achieve high purity and desired composition of CuInS2 thin film, a method of manufacturing an In2S3 thin film by additionally depositing a precursor comprising In-S onto the CuInS2 thin film manufactured is provided. A method of manufacturing a CuInS2 thin film comprises steps of: depositing a copper precursor of an asymmetrical structure selected from copper ethylbutyrylacetate and copper ethylisobutyrylacetate onto a substrate by metal organic chemical vapor deposition to manufacture a copper thin film; and depositing a precursor comprising In-S onto the copper thin film by metal organic chemical vapor deposition. The manufacturing method further comprises a heat treatment process after the second step. A CuInS2 thin film manufactured by the manufacturing method has a band gap of 1.4 1.6 eV. A method of manufacturing an In2S3 thin film comprises heat-treating the CuInS2 thin film at 350 to 450 deg.C for 60 to 180 minutes, and additionally depositing a precursor comprising In-S onto the heat-treated In2S3 thin film by metal organic chemical vapor deposition.
Abstract translation: 提供了通过金属有机化学气相沉积制造CuInS 2薄膜的方法和通过该方法制造的CuInS 2薄膜，以实现CuInS 2薄膜的高纯度和期望组成，通过另外沉积前体制备In 2 S 3薄膜的方法 提供了在制造的CuInS 2薄膜上的In-S。 制造CuInS 2薄膜的方法包括以下步骤：通过金属有机化学气相沉积将选自乙基丁酰乙酸铜和乙基异丁酰乙酸铜的不对称结构的铜前体沉积在基底上，制造铜薄膜; 以及通过金属有机化学气相沉积将包含In-S的前体沉积到铜薄膜上。 制造方法还包括在第二步骤之后的热处理过程。 通过该制造方法制造的CuInS 2薄膜的带隙为1.4±1.6eV。 制造In2S3薄膜的方法包括在350至450℃下对CuInS 2薄膜进行热处理60至180分钟，并且通过金属有机化学品另外将包含In-S的前体沉积到经热处理的In 2 S 3薄膜上 气相沉积。
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公开(公告)号：KR1020060054640A
公开(公告)日：2006-05-23
申请号：KR1020040093257
申请日：2004-11-15
Applicant: 삼성전자주식회사
Inventor： 박종필
IPC: H04N5/46
CPC classification number: H04N5/46
Abstract: 본 발명은, 안테나를 통해 수신되는 RF방송신호를 선국하는 튜너를 구비한 텔레비전장치 및 그 제어방법 에 관한 것으로서, 본 발명의 텔레비전 장치는 상기 튜너로부터 출력되는 방송신호를 입력받아, 소정의 제어신호에 따라 상이한 복수의 방송시스템 중 어느 하나에 해당하는 비디오신호로 복조하여 출력하는 디지털 복조부와; 상기 튜너로부터의 방송신호를 감지하여 방송시스템을 판별하고, 상기 방송신호를 상기 판별된 방송시스템에 해당하는 비디오신호로 복조하도록 상기 디지털복조부를 제어하는 제어부를 포함하는 것을 특징으로 한다. 이에 의하여, 방송신호의 방송시스템을 판별하고 자동으로 판별된 방송시스템에 따라 방송신호를 복조하여, 다양한 방식의 방송시스템을 재생할 수 있는 텔레비전 장치를 제공할 수 있다.
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公开(公告)号：KR100366025B1
公开(公告)日：2003-04-10
申请号：KR1019980050870
申请日：1998-11-26
Applicant: 삼성전자주식회사
Abstract: PURPOSE: A cartridge having a recognition hole capable of being opened and closed, a method and device for driving the cartridge are provided to open or close the recognition hole according to cartridge open state and disk inspection state to record information in a disk without additional verification when a user certificates the disk state. CONSTITUTION: A cartridge includes a cartridge case for accommodating a disk, an opening cover(40) detachably attached to an opening of the back side of the case, at least one recognition hole(24) used for judging whether or not the disk is out of the cartridge case, and a sensor lever(50) for controlling opening and closing of the recognition hole according to the state of the disk. The sensor lever has an opening/closing member(52) placed in the recognition hole. The cartridge further includes a tension unit(54) extended from the sensor lever to come into contact with the inner side of the cartridge case. The tension unit applies a predetermined tension to the sensor lever and, when the opening cover is opened, locates the opening/closing member of the sensor lever to the open position of the recognition hole to confirm opening of the opening cover. When the opening cover is opened, the opening/closing member of the sensor lever, being located at the closed position of the recognition hole, is automatically moved to the opened position to maintain the open state of the recognition hole.
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