Abstract:
PROBLEM TO BE SOLVED: To reduce crosstalk noise occurring between signal wiring lines.SOLUTION: In a first conductor layer 101, first and second signal wiring patterns 111 and 112 are formed. In a second conductor layer 102 that is a surface layer, a first pad 121 electrically connected to the first signal wiring pattern 111 through the first via 131 and a second pad 122 electrically connected to the second signal wiring pattern 112 through a second via 132 are formed. A third conductor layer 103 is disposed between the first conductor layer 101 and the second conductor layer 102, and an insulator 105 is interposed among the conductor layers. In the third conductor layer 103, a first via pad 141 electrically connected to the first via 131 is formed. The first via pad 141 is overlapped with the second pad 122 as viewed from a direction perpendicular to a substrate surface 100a, and has a facing portion 141a that faces the second pad 122 via the insulator 105.
Abstract:
The semiconductor device comprises a semiconductor substrate (1) and an optical via (4) penetrating the substrate from a main surface (12) to an opposite further main surface (13). A metal via layer (5) is arranged along the optical via without closing the optical via. A contact pad (19) is arranged above the further main surface at a distance from the optical via. A through-substrate via (14) comprising a further metal via layer (15) is arranged in the substrate, the through-substrate via penetrating the substrate from the main surface to the contact pad. The further metal via layer is in electrical contact with the contact pad.
Abstract:
First (111) and second (112) signal wiring patterns are formed in a first conductor layer (101). A first electrode pad (121) electrically connected to the first signal wiring pattern through a first via (131) and a second electrode pad (122) electrically connected to the second signal wiring pattern through a second via (132) are formed in a second conductor layer (102) as a surface layer. A third conductor layer (103) is disposed between the first conductor layer and the second conductor layer with an insulator (105) interposed between those conductor layers. A first pad (141,151,161,171) electrically connected to the first via is formed in the third conductor layer. The first pad includes an opposed portion (141a,151b,161c,171d) which overlaps the second electrode pad as viewed in a direction perpendicular to the surface of a printed board and which is opposed to the second electrode pad through intermediation of the insulator. This enables reduction of crosstalk noise caused between the signal wirings.
Abstract:
An etched tri-metal-layer air bridge circuit board specially designed for fine-pitch applications, comprising:
an electrically insulative substrate surface (10), a plurality of tri-metal-layer bond pads (12) arranged in a generally straight row on the substrate surface (10) wherein the row defines a width direction therealong, and a circuit trace (20) arranged on the substrate surface (10), wherein the circuit trace (20) runs between two adjacent ones (22) of the plurality of tri-metal-layer bond pads (12). Each bond pad (12) comprises: (1) a bottom layer (14) attached to the substrate surface (10), the bottom layer (14) being made of a first metal and having an overall width W1 as measured along the width direction; (2) a top layer (18) disposed above and generally concentric with the bottom layer (14), the top layer (18) being made of the first metal and having an overall width W2 as measured along the width direction; and (3) a middle layer (16) made of a second metal connecting the bottom layer (14) and the top layer (18). The bond pads (12) are specially shaped such that W2 > W1 for at least the two adjacent bond pads (12), thus enabling the circuit trace (20) to be spaced closely to the bottom layers (14) of the two adjacent bond pads (12), while allowing the top layers (18) of the pads (12) to be made much larger so as to avoid delamination thereof from their associated middle layers (16).