Abstract:
The present invention relates to hybrid nanostructures in which metal nanoparticles are combined on metal oxide nanostructures and, more specifically, to a manufacturing method for hybrid nanostructures in which metal nanoparticles are combined on aligned metal oxide nanostructures comprising: a first step of forming a metal-organic precursor layer on a substrate or a thin film; a second step of forming a metal oxide seed layer by an imprinting and hardening process by locating a stamp for imprinting on the metal-organic precursor layer; a third step of forming a metal oxide seed pattern layer by exposing a part of the substrate or thin film by removing a residual layer of the metal oxide seed layer; a fourth step of removing a solvent by performing heat treatment on the metal oxide seed pattern layer; a fifth step of forming aligned metal oxide nanostructures on the metal oxide seed pattern layer in which the solvent is removed by using a hydrothermal synthesis method; and a sixth step of forming hybrid nanostructures by combining metal nanoparticles on the aligned metal oxide nanostructures by using photodecomposition reaction, and to hybrid nanostructures manufactured thereby. The present invention is economical since hybrid nanostructures with metal nanoparticles on metal oxide nanostructures are easily manufactured by using a simple process requiring low production costs such as an imprinting process, a hydrothermal synthesis method, photodecomposition reaction and the like.
Abstract:
PURPOSE: An electric component having a metal diffusion prevention graphene layer and a manufacturing method there of form a graphene layer between a bonding layer and a metal layer, increasing reproducibility. CONSTITUTION: A metal layer (203) comprises single metal or alloy. A graphene layer (202) is formed on the lower side of the metal. The thickness of the graphene layer is 0.2nm to 1.5μm. A bonding layer (201) is formed one the lower side of the graphene. The bonding layer is formed with one or more of single metal film, alloy film, oxide film, organic layer or inorganic film.
Abstract:
PURPOSE: A manufacturing method of a multilayer nanostructure is provided to suppress photo reflection due to difference of refractivity between semiconductor material and air and to minimize damages by etching. CONSTITUTION: A manufacturing method of a multilayer nanostructure comprises a step of forming a polymer layer on the upper part of a substrate; a step of forming a photosensitive metal-organic material precursor layer and an imprint resin layer with Si or metal oxide nanoparticle in the upper part thereof. The imprint resin layer pressurizes the photosensitive metal-organic material layer by a stamp and forms a resin pattern layer or metal oxide thin film pattern layer by heating or light irradiation. An undercut is formed to expose the substrate, by etching one or more of the resin pattern layer, oxide thin film pattern layer, or polymer layer thereof. One or more layers of the resin pattern layer, oxide thin film pattern layer, or polymer layer thereof is formed on one or more upper part of the substrate. A nanostructure(100) is obtained by lifting off one or more of the metal, metal oxide, fluoride, nitride, or sulfide film, by solvent.
Abstract:
PURPOSE: A method for manufacturing a semiconductor device for substrate reuse is provided to improve productivity of the semiconductor device by securing two thin film structures with one separation process. CONSTITUTION: A first device layer(320) is formed at one side of a substrate(300). The first device layer comprises a transparent electrode layer and a p-type electrode. A second device layer(340) is formed at the other side of the substrate. A first carrier substrate(360) is welded to the first device layer. A second carrier substrate(380) is welded to the second device layer. The first device layer and the substrate are separated and the second device layer and the second device layer are separated through a laser lift off method.
Abstract:
PURPOSE: A method for forming an ohmic contact electrode using a dielectric thin film is provided to improve the morphology of an ohmic contact electrode surface by forming the dielectric thin film on an ohmic contact electrode. CONSTITUTION: An ohmic contact electrode(230) is formed on a semiconductor layer(220). A dielectric thin film(240) is formed on the ohmic contact electrode to prevent the morphology of the ohmic contact electrode surface from being curved in a thermal process. A contact resistance between a semiconductor layer and an ohmic contact electrode is improved by thermally processing a stack structure. A semiconductor layer, an ohmic contact electrode and a dielectric thin film are stacked on the stack structure. The dielectric thin film is removed.