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公开(公告)号:DE102004058132B3
公开(公告)日:2006-03-02
申请号:DE102004058132
申请日:2004-12-02
Applicant: INFINEON TECHNOLOGIES AG
Inventor: LIAW CORVIN , ROEHR THOMAS
Abstract: The data storage circuit incorporates a storage cell matrix (1) with vertical word lines (WL) and horizontal bit lines (BL) with PMC resistors (2) connected across their crossing points. The resistors consists of CBRAM-resistor elements. A reference word line (RWL) crosses the horizontal bit lines on a first side of the storage cell matrix and there are reference resistors (6) at the crossing points. Amplifiers (5) are connected to the horizontal bit lines on the second side of the storage cell matrix and are connected to data evaluation circuits (8). The bottom ends of the word lines are connected to voltage sources (3,7) with connections to an address decoder (4) and a control circuit (9).
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公开(公告)号:DE10017368B4
公开(公告)日:2005-12-15
申请号:DE10017368
申请日:2000-04-07
Applicant: INFINEON TECHNOLOGIES AG
Inventor: ROEHR THOMAS , ESTERL ROBERT , HOENIGSCHMID HEINZ , KANDOLF HELMUT
Abstract: A description is given of a method for operating an integrated memory which has memory cells each having a selection transistor and a storage capacitor with a ferroelectric storage effect. The memory contains a plate line, which is connected to one of the column lines via a series circuit containing a selection transistor and a storage capacitor of respective memory cells. A memory access is carried out according to the "pulsed plate concept". In this case, the temporal sequence is controlled in such a way that, in an access cycle, the storage capacitor of the memory cell to be selected is in each case charged and discharged by the same amount. An attenuation or destruction of the information stored in the memory cells, which is caused by source-drain leakage currents of unactivated selection transistors, is thus avoided.
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公开(公告)号:DE102005018344A1
公开(公告)日:2005-12-01
申请号:DE102005018344
申请日:2005-04-20
Applicant: INFINEON TECHNOLOGIES AG
Inventor: ROEHR THOMAS , HAPP THOMAS
IPC: G02F1/153 , G11C13/02 , G11C16/00 , H01L23/525 , H01L27/24 , H01L29/02 , H01L45/00 , H01L47/00 , H03F3/45
Abstract: A switching device to be reversibly switched between an electrically isolating off-state and an electrically conducting on-state for use in, e.g., a reconfigurable interconnect. The device includes two separate electrodes, one of which being a reactive metal electrode and the other one being an inert electrode, and a solid state electrolyte arranged between the electrodes and being capable of electrically isolating the electrodes to define the off-state. The reactive metal electrode and the solid state electrolyte also being capable of forming a redox-system having a minimum voltage (turn-on voltage) to start a redox-reaction, which results in generating metal ions that are released into the solid state electrolyte. The metal ions are reduced to increase a metal concentration within the solid state electrolyte, wherein an increase of the metal concentration results in a conductive metallic connection bridging the electrodes to define the on-state.
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公开(公告)号:AU2003278686A1
公开(公告)日:2004-06-15
申请号:AU2003278686
申请日:2003-11-11
Applicant: INFINEON TECHNOLOGIES AG
Inventor: WOHLFAHRT JOERG , ROEHR THOMAS , REHM NORBERT , JACOB MICHAEL
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公开(公告)号:AU2003278684A8
公开(公告)日:2004-06-15
申请号:AU2003278684
申请日:2003-11-11
Applicant: INFINEON TECHNOLOGIES AG
Inventor: JOACHIM HANS-OLIVER , JACOB MICHAEL , ROEHR THOMAS , WOHLFAHRT JOERG
Abstract: The present invention provides a test mode section for facilitating a worst case product test sequence for signal margin to ensure full product functionality over the entire component lifetime taking all aging effects into account. A semiconductor memory test mode configuration includes a first capacitor for storing digital data The capacitor connects a cell plate line to a first bit line through a first select transistor. The first select transistor is activated through a connection to a word line. A second capacitor stores digital data and connects the cell plate line to a second bit line through a second select transistor. The second select transistor is also activated through a connection to the word line. A sense amplifier is connected to the first and second bit lines and measures a differential read signal on the first and second bit lines. A potential is connected to the first bit line through a third transistor and changes a pre-charge signal level on the first bit line when the third transistor is turned on to reduce the differential read signal.
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公开(公告)号:DE59904238D1
公开(公告)日:2003-03-13
申请号:DE59904238
申请日:1999-07-28
Applicant: INFINEON TECHNOLOGIES AG
Inventor: ROEHR THOMAS , HOENIGSCHMID HEINZ , MANYOKI ZOLTAN , BOEHM THOMAS , NEUHOLD ERNST , BRAUN GEORG
IPC: G11C11/407 , G11C5/14 , G11C8/00 , G11C8/08 , G11C16/12 , H03K19/094 , H03K19/20 , H03M5/16 , H03M7/00
Abstract: A decoder element is provided with an output, whereby an output signal with one of three different possible potentials is produced. The output signal may have a value of either a first potential, a second potential, and a third potential, where the second potential lies between the first potential and the third potential. The output signal is produced according to voltage values of input signals at terminal connections of the decoder element.
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公开(公告)号:DE10032272C2
公开(公告)日:2002-08-29
申请号:DE10032272
申请日:2000-07-03
Applicant: INFINEON TECHNOLOGIES AG
Inventor: BOEHM THOMAS , GOGL DIETMAR , MUELLER GERHARD , ROEHR THOMAS
IPC: G11C11/14 , G11C7/12 , G11C11/15 , G11C11/16 , H01L21/8246 , H01L27/10 , H01L27/105 , H01L43/08
Abstract: A bit line (BL) first driver (FD) (T1) has an FD current source (J3) and an FD n-channel field effect transistor (N6) with a channel width (wn). The FD current source and the FD field effect transistor connect in series between a BL source of voltage supply (V-SupplyBL) and the BL. A second driver (SD) (T2) for a word line (WL) has an SD current source (J0) that connects with an SD field effect transistor (N0) in series between a WL source of voltage supply (V-SupplyWL) and the WL.
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公开(公告)号:DE59901953D1
公开(公告)日:2002-08-08
申请号:DE59901953
申请日:1999-09-17
Applicant: INFINEON TECHNOLOGIES AG
Inventor: BRAUN GEORG , HOENIGSCHMID HEINZ , ROEHR THOMAS , KOWARIK OSKAR , HOFFMANN KURT
Abstract: A circuit for generating a reference voltage for the reading out from and the evaluation of read output signals which are read out with a constant plate voltage from storage cells of a ferroelectric memory via bit lines. In the circuit, a reference voltage device is formed of two reference cells that are subjected to the action of complementary signals. The reference cells can be simultaneously read out in order to generate the reference voltage in a selection and evaluation device.
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公开(公告)号:DE10057806A1
公开(公告)日:2002-06-06
申请号:DE10057806
申请日:2000-11-22
Applicant: INFINEON TECHNOLOGIES AG
Inventor: ROEHR THOMAS , HOENIGSCHMID HEINZ , DEHM CHRISTINE
IPC: H01L21/8246 , H01L27/115 , H01L27/11502 , H01L27/11507 , H01L21/8239 , H01L27/105
Abstract: The contact plugs (26) to the top capacitor electrodes of each memory cell are not manufactured from below but from above. First the capacitor formed by the upper (22) and lower (24,24s) capacitor electrodes and the dielectric (23) are manufactured. A hole for the contact plug to the top electrode is then etched through the top electrode and the dielectric and filled with a conductive material to connect top electrode with the substrate.
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公开(公告)号:DE10056159A1
公开(公告)日:2002-05-23
申请号:DE10056159
申请日:2000-11-13
Applicant: INFINEON TECHNOLOGIES AG
Inventor: HOENIGSCHMID HEINZ , BOEHM THOMAS , ROEHR THOMAS
IPC: G11C11/15 , G11C11/16 , H01L21/8246 , H01L27/105 , H01L43/08 , H01L27/22 , G11C11/14 , G11C11/02
Abstract: The memory device has a matrix of magnetic tunnel junction memory cells (1), each connected between a bit line (B1-B4) and a plate line (PL), with selection transistors coupled to the plate line connected at their gate electrodes to perpendicular word lines (W1-W4). Each selection transistor is associated with several magnetic tunnel junction memory cells, with its channel width determined by the number of associated magnetic tunnel junction memory cells.
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