公开(公告)号：US20150346103A1

公开(公告)日：2015-12-03

申请号：US14723548

申请日：2015-05-28

Applicant: Sean Xiaolu Wang ,  Qun Li

Inventor： Sean Xiaolu Wang ,  Qun Li

IPC: G01N21/71 ,  G01J3/443

CPC classification number: G01N21/718 ,  G01J3/06 ,  G01J3/443

Abstract: This invention discloses a laser induced breakdown spectroscopy (LIBS) apparatus and method for performing spectral imaging of a sample surface. A high repetition rate pulsed laser is employed to produce a train of laser pulses. The laser beam is then scanned by a scanning mechanism over a surface of the subject sample. Each laser pulse produces a LIBS signal from a specific position of the sample surface, which is then measured by a spectrometer device to obtain a LIBS spectrum. The position of the laser beam is recorded and correlated to the corresponding LIBS spectrum. A two dimensional (2-D) mapping of the sample surface to its LIBS spectra is acquired in this manner to construct a LIBS spectral image of the sample surface.

Abstract translation: 本发明公开了一种用于对样品表面进行光谱成像的激光诱导击穿光谱（LIBS）装置和方法。 使用高重复率脉冲激光器来产生一列激光脉冲。 然后通过扫描机构在被摄体样品的表面上扫描激光束。 每个激光脉冲从样品表面的特定位置产生LIBS信号，然后由光谱仪装置测量以获得LIBS光谱。 记录激光束的位置并将其与相应的LIBS光谱相关联。 以这种方式获取样品表面与其LIBS光谱的二维（2-D）映射，以构建样品表面的LIBS光谱图像。

公开(公告)号：US09157802B2

公开(公告)日：2015-10-13

申请号：US13325840

申请日：2011-12-14

Applicant: Sungho Jeong ,  Seokhee Lee ,  Hee-Sang Shim

Inventor： Sungho Jeong ,  Seokhee Lee ,  Hee-Sang Shim

IPC: G01J3/443 ,  G01N21/71

CPC classification number: G01J3/443 ,  G01N21/718

Abstract: The present invention relates to a process control system which can measure the physical properties of a CIGS thin film in real-time in a continuous production line of a CIGS thin film solar cell, more specifically to a system for real-time analysis of material distribution of a CIGS thin film comprising: a header, which comprises a laser irradiation unit producing plasma from the CIGS thin film by irradiating a laser beam to a part of the CIGS thin film; and a spectrum detection optical unit detecting a spectrum generated from the plasma; a transfer unit, which transfers the header at the same rate and to the direction with the transfer rate and direction of the CIGS thin film; and a spectrum analysis unit, which analyzes the spectrum detected by the spectrum detection optical unit.

Abstract translation: 本发明涉及一种能够在CIGS薄膜太阳能电池的连续生产线中实时测量CIGS薄膜的物理性能的工艺控制系统，更具体地涉及一种实时分析材料分布的系统 包括：头部，其包括通过将激光束照射到CIGS薄膜的一部分而从CIGS薄膜产生等离子体的激光照射单元; 以及频谱检测光学单元，检测从等离子体产生的光谱; 传送单元，其以相同的速率传送头部并且传送到具有CIGS薄膜的传送速率和方向的方向; 以及分析由频谱检测光学单元检测到的频谱的频谱分析单元。

公开(公告)号：US20150286299A1

公开(公告)日：2015-10-08

申请号：US14246487

申请日：2014-04-07

Applicant: Thermo Scientific Portable Analytical Instruments Inc.

Inventor： Neil Bacon ,  Nathaneal Jeyachandran

IPC: G06F3/0354 ,  G06F3/041 ,  G01J3/453 ,  G01N23/223 ,  G01J3/44 ,  G01J3/443

CPC classification number: G06F3/03549 ,  G01J3/0264 ,  G01J3/027 ,  G01J3/0272 ,  G01J3/44 ,  G01J3/443 ,  G01J3/453 ,  G01N23/223 ,  G06F3/03545 ,  G06F3/0362 ,  G06F3/041

Abstract: A hand-held instrument includes a sample probe for evaluating at least one constituent of a sample; a processor configured with machine executable code stored on machine readable media for controlling the instrument; a display for providing output of the instrument; and, a pointing device for selecting output of the display and providing input to the processor, the pointing device configured for facilitating the selecting while holding the instrument. A method of use, a computer program product and embodiments of sample analyzers are disclosed.

Abstract translation: 手持式仪器包括用于评估样品的至少一种成分的样品探针; 配置有存储在用于控制所述仪器的机器可读介质上的机器可执行代码的处理器; 用于提供仪器输出的显示器; 以及用于选择所述显示器的输出并向所述处理器提供输入的指示设备，所述指示设备被配置为便于在保持所述仪器的同时进行所述选择。 公开了一种使用方法，计算机程序产品和样品分析仪的实施例。

公开(公告)号：US20150138545A1

公开(公告)日：2015-05-21

申请号：US14608359

申请日：2015-01-29

Applicant: SciAps, Inc.

Inventor： David R. Day ,  Konstantin Derman ,  John Francis Egan ,  Paul Edward Soucy

IPC: G01J3/02 ,  G01J3/443

CPC classification number: G01J3/0272 ,  G01J3/0297 ,  G01J3/2823 ,  G01J3/443 ,  G01J5/0255 ,  G01N21/718 ,  G01N2201/0221 ,  H01J37/32321

Abstract: A handheld LIBS analyzer includes a laser source for generating a laser beam and a spectrometer subsystem for analyzing a plasma generated when the laser beam strikes a sample. A nose section includes an end plate with an aperture for the laser beam, a purge cavity behind the aperture fluidly connected to a source of purge gas, and a shield covering the purge cavity. A vent removes purge gas from the purge cavity when the end plate is placed on the sample.

Abstract translation: 手持式LIBS分析仪包括用于产生激光束的激光源和用于分析当激光束撞击样品时产生的等离子体的光谱仪子系统。 鼻部包括具有用于激光束的孔的端板，在孔的后面的清洗腔，流体地连接到吹扫气体源，以及覆盖吹扫腔的屏蔽。 当端板放置在样品上时，排气口将吹扫气体从吹扫腔中移除。

公开(公告)号：US20150138534A1

公开(公告)日：2015-05-21

申请号：US14533498

申请日：2014-11-05

Applicant: ELTA SYSTEMS LTD.

Inventor： Gil TIDHAR

IPC: F41G3/14 ,  G01J3/447 ,  G01J3/443

CPC classification number: F41G3/147 ,  G01J3/0224 ,  G01J3/36 ,  G01J3/443 ,  G01J3/447 ,  G01S3/784 ,  H04N5/332

Abstract: A multiband imaging system comprising: an optical module configured for acquiring simultaneously images from a common field-of-view (FOV) scene in a short wavelength spectral band and in a long wavelength spectral band, the optical module comprising a polarizer configured for applying polarization filtering to electromagnetic radiation of the long wavelength spectral band; and a processing module configured to analyze data indicative of received irradiance distribution between the short and long wavelength spectral bands.

Abstract translation: 一种多频带成像系统，包括：光学模块，被配置为同时从短波长频谱带和长波长频谱带中的公共视场（FOV）场景中拍摄图像，所述光学模块包括被配置为施加偏振的偏振器 过滤长波长光谱带的电磁辐射; 以及处理模块，被配置为分析指示所述短波长和长波长光谱带之间的接收的辐照度分布的数据。

公开(公告)号：US20150062577A1

公开(公告)日：2015-03-05

申请号：US14470875

申请日：2014-08-27

Applicant: Thermo Electron Manufacturing Limited

Inventor： Stephen HARTWELL ,  Nigel Cooper BAILEY

IPC: G01J3/02 ,  G01J3/443

CPC classification number: G01J3/0297 ,  G01J3/28 ,  G01J3/443

Abstract: A method for deriving a background-corrected portion of a measured optical emission spectrum comprising the steps of identifying two or more background correction points from the portion of the measured emission spectrum; deriving a background correction function fitted to the identified background correction points, and applying the background correction function to the portion of the measured emission spectrum so as to produce a background-corrected portion of the emission spectrum, wherein the background correction points are identified from the measured data points by consideration of the gradients between the measured data points.

Abstract translation: 一种用于导出测量的光发射光谱的背景校正部分的方法，包括以下步骤：从所测量的发射光谱的部分中识别两个或更多个背景校正点; 导出拟合到所识别的背景校正点的背景校正函数，以及将背景校正函数应用于所测量的发射光谱的部分，以产生背景校正部分的发射光谱，其中从背景校正点 通过考虑测量数据点之间的梯度来测量数据点。

公开(公告)号：US20140368818A1

公开(公告)日：2014-12-18

申请号：US14361840

申请日：2012-12-11

Applicant: THERMO FISHER SCIENTIFIC (ECUBLENS) SARL

Inventor： Fabio Demarco ,  Jean-Luc Dorier ,  Edmund Halasz

IPC: G01J3/443 ,  G01J3/18 ,  G01J3/02 ,  G01N21/67

CPC classification number: G01J3/443 ,  G01J3/0208 ,  G01J3/021 ,  G01J3/0229 ,  G01J3/024 ,  G01J3/0294 ,  G01J3/18 ,  G01J3/2803 ,  G01N21/67

Abstract: A spark optical emission spectrometer comprising: a spark source for causing spark induced emission of light from a sample; a single entrance slit; a toroidal mirror for directing the light through the single entrance slit; a plurality of diffraction gratings for diffracting light that has been directed through the entrance slit by the mirror, whereby the plurality of diffraction gratings are simultaneously illuminated; and at least one array detector for detecting the diffracted light from the plurality of diffraction gratings, wherein the minor is for directing the light through the entrance slit such that light from different regions in the spark source is spatially separated in an image of the light at the gratings whereby a first diffraction grating is preferentially illuminated with light from a first region of the spark source and simultaneously a second diffraction grating is preferentially illuminated with light from a second region of the spark source.

Abstract translation: 一种火花光发射光谱仪，包括：火花源，用于引起火花诱发的来自样品的光的发射; 单个入口狭缝; 用于将光引导通过单个入口狭缝的环形镜; 多个用于衍射光的衍射光栅，所述衍射光栅通过所述反射镜被引导通过所述入射狭缝，由此所述多个衍射光栅同时被照亮; 以及用于检测来自多个衍射光栅的衍射光的至少一个阵列检测器，其中，次要用于引导光通过入口狭缝，使得来自火花源中的不同区域的光在光的图像中在空间上分离 其中由来自火花源的第一区域的光优先照射第一衍射光栅并且同时第二衍射光栅的光栅优先用来自火花源的第二区域的光照射。

公开(公告)号：US20140353495A1

公开(公告)日：2014-12-04

申请号：US14367944

申请日：2012-10-04

Applicant: NATIONAL INSTITUTE OF ADVANCED INDUSTRIAL SCIENCE AND TECHNOLOGY ,  S.T. JAPAN INC.

Inventor： Kazumi Inagaki ,  Shin-Ichiro Fujii ,  Akiko Takatsu ,  Koichi Chiba ,  Takao Nakagawa ,  Masaaki Abe ,  Nobuyoshi Kitagawa ,  Yosuke Nakagawa

IPC: H01J49/10 ,  G01J3/443

CPC classification number: H01J49/105 ,  B05B7/0416 ,  G01J3/443 ,  G01N21/714 ,  H01J49/045

Abstract: A nebulizer characterized in being provided with: an inner tube, which is disposed coaxially with an outer tube in which a nebulizing outlet is formed and which, together with the outer tube, forms a gas channel therebetween; a sample channel, which is formed inside the inner tube and through which a liquid sample to be nebulized flows; and a reticular membrane disposed with a gap from the sample outlet that is formed at one end of the inner tube and in which multiple holes, through which liquid sample drops flowing out from the sample outlet pass along with a gas, are formed. Using the nebulizer, the particle size of the nebulized liquid droplets can be made uniformly fine over a broad range of sample liquid flow volumes while retention of sample liquid in the nebulizer is reduced.

Abstract translation: 一种喷雾器，其特征在于具有：内管，其与形成有喷雾出口的外管同轴设置，并且与外管一起在其间形成气体通道; 样品通道，其形成在内管内部，待雾化的液体样品通过该通道流动; 和形成在内管的一端形成有来自样品出口的间隙的网状膜，其中从样品出口流出的液体样品滴下的多个孔与气体一起形成。 使用雾化器，雾化液滴的粒径可以在宽范围的样品液体流量上均匀地精细化，同时将样品液体保留在雾化器中。

公开(公告)号：US08879061B2

公开(公告)日：2014-11-04

申请号：US13839560

申请日：2013-03-15

Applicant: Imagineering, Inc.

Inventor： Yuji Ikeda ,  Ryoji Turuoka

IPC: G01J3/30 ,  G01J3/02 ,  G01N21/68 ,  G01N21/71 ,  G01J3/443

CPC classification number: G01J3/02 ,  G01J3/443 ,  G01N21/68 ,  G01N21/718

Abstract: The analysis apparatus 10 includes a plasma generation device 11 and an optical analysis device 13. The plasma generation device 11 generates initial plasma by energizing a substance in space to be turned into a plasma state, and maintains the plasma state by irradiating the initial plasma with electromagnetic wave for a predetermined period of time. Then, the optical analysis device 13 analyzes the target substance 15 based on a time integral value of intensity of emission from the target substance 15 in an electromagnetic wave plasma region, which is maintained by the electromagnetic wave.

Abstract translation: 分析装置10包括等离子体产生装置11和光学分析装置13.等离子体产生装置11通过对空间中的物质进行激励而产生初始等离子体等待状态，并通过用初始等离子体照射来保持等离子体状态 电磁波预定时间段。 然后，光学分析装置13基于由电磁波维持的电磁波等离子体区域中的来自目标物质15的发射强度的时间积分值来分析目标物质15。

公开(公告)号：US20140264073A1

公开(公告)日：2014-09-18

申请号：US14205040

申请日：2014-03-11

Applicant: Nathan McLaughlin ,  Jason King ,  Michael Jansen

Inventor： Nathan McLaughlin ,  Jason King ,  Michael Jansen

IPC: G01N21/64 ,  G01J3/443

CPC classification number: G01N21/6489 ,  G01J3/0254 ,  G01J3/027 ,  G01J3/443

Abstract: Photoluminescence quantum yield (PLQY) testing of quantum dots is described. In one embodiment, a method involves heating a sample including quantum dots and illuminating the sample with a light source. The method involves measuring spectra of luminescence from the illuminated quantum dots of the sample at each of a plurality of temperatures. The method involves measuring each of the plurality of temperatures with a temperature sensor. The PLQY at each of the plurality of temperatures is computed based on the measured spectra. The method further involves computing a relationship between QD emission wavelength of the measured spectra and the plurality of temperatures measured with the temperature sensor. The relationship is used to determine the QD temperature corresponding to each of the PLQY computations. In one embodiment, an integrating sphere moves on a gantry over the samples.

Abstract translation: 描述了量子点的光致发光量子产率（PLQY）测试。 在一个实施例中，一种方法包括加热包括量子点的样品并用光源照射样品。 该方法包括在多个温度中的每一个处测量来自样品的照射量子点的发光光谱。 该方法包括用温度传感器测量多个温度中的每一个。 基于测量的光谱计算多个温度中的每一个的PLQY。 该方法还涉及计算测量光谱的QD发射波长与用温度传感器测量的多个温度之间的关系。 该关系用于确定与每个PLQY计算相对应的QD温度。 在一个实施例中，积分球在样本上的台架上移动。