公开(公告)号：US08988682B2

公开(公告)日：2015-03-24

申请号：US14058055

申请日：2013-10-18

Applicant: Apple Inc.

Inventor： Ye Yin ,  Gabriel G. Marcu ,  Jiaying Wu

IPC: G01J3/46 ,  G01J3/28

CPC classification number: G01J3/28 ,  G01J3/0218 ,  G01J3/0243 ,  G01J3/0291 ,  G01J3/0294 ,  G01J3/0297 ,  G01J3/462 ,  G01J3/465 ,  G01J3/50 ,  G01J3/502 ,  G01J3/506 ,  G01J3/51 ,  G01J3/513 ,  G01J3/524

Abstract: This specification describes various embodiments that relate to methods for providing a wideband colorimeter that can include more accurate outputs. In one embodiment, a narrowband instrument, such as a spectrometer or spectrograph, can be used for calibration of a wideband colorimeter, so that more accurate outputs can be provided. In one embodiment, an optical test equipment, which consists of both a wideband colorimeter and a narrowband spectrograph, can be used for providing a more accurately calibrated wideband colorimeter. As an example, a spectra-camera, which is a hybrid system consisting of both a wideband colorimeter and a narrowband spectrograph, can be used for simultaneous testing by both the wideband colorimeter and the narrowband spectrograph. By doing simultaneous testing, accurate calibration of the wideband colorimeter can be achieved. This specification further describes a mathematical model to characterize a wideband three channel colorimeter with a narrowband multiple channel spectrometer.

Abstract translation: 本说明书描述了涉及用于提供宽带色度计的方法的各种实施例，其可以包括更精确的输出。 在一个实施例中，诸如光谱仪或光谱仪的窄带仪器可以用于宽带色度计的校准，从而可以提供更精确的输出。 在一个实施例中，由宽带色度计和窄带光谱仪组成的光学测试设备可用于提供更准确校准的宽带色度计。 作为示例，作为由宽带色度计和窄带光谱仪组成的混合系统的光谱相机可以用于宽带色度计和窄带光谱仪的同时测试。 通过同时测试，可以实现宽带色度计的精确校准。 该说明书进一步描述了用窄带多通道光谱仪来表征宽带三通道色度计的数学模型。

公开(公告)号：US20140139922A1

公开(公告)日：2014-05-22

申请号：US14166248

申请日：2014-01-28

Applicant: Sheldon McLaughlin

Inventor： Sheldon McLaughlin

IPC: G02B5/18

CPC classification number: G02B6/29313 ,  G01J3/02 ,  G01J3/0205 ,  G01J3/0208 ,  G01J3/021 ,  G01J3/0243 ,  G01J3/0256 ,  G01J3/0291 ,  G01J3/1804 ,  G01J3/22 ,  G02B5/12 ,  G02B5/1809 ,  G02B5/1814 ,  G02B5/1866 ,  G02B6/2931 ,  G02B6/29311 ,  G02B6/2938 ,  G02B6/354 ,  G02B17/0856 ,  G02B2005/1804

Abstract: A compact wavelength dispersing device and a wavelength selective optical switch based on the wavelength dispersing device is described. The wavelength dispersing device has a folding mirror that folds the optical path at least three times. A focal length of a focusing coupler of the device is reduced and the NA is increased, while the increased optical aberrations are mitigated by using an optional coma-compensating wedge. A double-pass arrangement for a transmission diffraction grating allows further focal length and overall size reduction due to increased angular dispersion.

Abstract translation: 描述了基于波长分散装置的紧凑型波长分散装置和波长选择光开关。 波长分散装置具有将光路折叠至少三次的折叠镜。 减少了设备的聚焦耦合器的焦距，并且增加了NA，同时通过使用可选的光阑补偿楔来减轻增加的光学像差。 用于透射衍射光栅的双通道布置允许由于增加的角度分散而使焦距和总体尺寸减小。

公开(公告)号：US08717560B2

公开(公告)日：2014-05-06

申请号：US13100495

申请日：2011-05-04

Applicant: David Roger Labrecque

Inventor： David Roger Labrecque

IPC: G01J3/40 ,  G01J3/18 ,  G01J3/28 ,  G01J3/02

CPC classification number: G01J3/18 ,  G01J3/02 ,  G01J3/0229 ,  G01J3/0243 ,  G01J3/20 ,  G01J3/28 ,  G01J3/2823 ,  G01J3/2846 ,  G01J3/4406 ,  Y10T29/49826

Abstract: The present invention provides apparatuses including a point light source, a diffraction grating oriented in a light path generated from the point light source wherein the diffraction grating diffracts and concentrates light from the point light source into one or more rings of light, a detector positioned to detect one or more of the rings of light or light transmitted from a sample exposed to said rings of light, and a computer operably connected to the detector to analyze the intensity of one or more of the rings of light or said light transmitted from said sample. Variations including samples and additional components and methods of making the apparatuses of the present invention are also disclosed.

Abstract translation: 本发明提供了一种装置，包括点光源，衍射光栅，其定向在从点光源产生的光路中，其中衍射光栅将来自点光源的光衍射并集中到一个或多个光环中，检测器定位成 检测从暴露于所述光环的样品透射的光或光的一个或多个环，以及可操作地连接到所述检测器的计算机，以分析从所述样品透射的一个或多个所述光或所述光的强度 。 还公开了包括样品和附加组分的变化以及制备本发明的装置的方法。

公开(公告)号：US20130329225A1

公开(公告)日：2013-12-12

申请号：US13964472

申请日：2013-08-12

Applicant: HAMAMATSU PHOTONICS K.K.

Inventor： Katsumi SHIBAYAMA ,  Takashi KASAHARA ,  Anna YOSHIDA

IPC: G01J3/02 ,  H01L31/18

CPC classification number: G01J3/0205 ,  G01J3/02 ,  G01J3/0208 ,  G01J3/0243 ,  G01J3/0259 ,  G01J3/0262 ,  G01J3/04 ,  G01J3/18 ,  G01J3/2803 ,  G02B7/027 ,  H01L31/18

Abstract: The present invention provides a highly reliable spectral module. When light L1 proceeding to a spectroscopic unit (4) passes through a light transmitting hole (50) in the spectral module (1) in accordance with the present invention, only the light having passed through a light entrance side unit (51) formed such as to become narrower toward a substrate (2) and entered a light exit side unit (52) formed such as to oppose a bottom face (51b) of the light entrance side unit (51) is emitted from a light exit opening (52a). Therefore, stray light M incident on a side face (51c) or bottom face (51b) of the light entrance side unit (51) is reflected to the side opposite to the light exit side unit (52) and thus is inhibited from entering the light exit side unit (52). Therefore, the reliability of the spectral module (1) can be improved.

Abstract translation: 本发明提供了一种高度可靠的光谱模块。 当进入分光单元（4）的光L1穿过根据本发明的光谱模块（1）中的透光孔（50）时，仅通过形成光入射侧单元（51）的光 朝向基板（2）变窄并且进入与光入射侧单元（51）的底面（51b）相对形成的光出射侧单元（52）从光出射开口（52a）射出， 。 因此，入射到光入射单元（51）的侧面（51c）或底面（51b）的杂散光M被反射到与光出射单元（52）相反的一侧，因此被禁止进入 光出射侧单元（52）。 因此，可以提高光谱模块（1）的可靠性。

公开(公告)号：US08400637B2

公开(公告)日：2013-03-19

申请号：US13540109

申请日：2012-07-02

Applicant: Michael L. Myrick ,  Robert P. Freese ,  William Soltmann ,  David L. Perkins

Inventor： Michael L. Myrick ,  Robert P. Freese ,  William Soltmann ,  David L. Perkins

IPC: G01N21/00

CPC classification number: G01J3/02 ,  G01J3/021 ,  G01J3/0229 ,  G01J3/0232 ,  G01J3/0235 ,  G01J3/0243 ,  G01J3/0286 ,  G01J3/08 ,  G01J3/28 ,  G01J3/42 ,  G01J2003/1213 ,  G01N2201/1293

Abstract: The present subject matter relates to an apparatus and related method of high-speed analysis of product samples during production of the product. Light is directed to a portion of a product under analysis and reflected from or transmitted through the product toward optical detectors. Signals from the optical detectors are compared to determine characteristics of the product under analysis. Temperature within the monitoring system may be monitored in order to provide compensation for the signals produced by the optical detectors. The products under analysis may be stationary, moved by an inspection point by conveyor or other means, or may be contained within a container, the container including a window portion through which the product illuminating light may pass.

Abstract translation: 本发明涉及在产品生产过程中产品样品的高速分析的装置和相关方法。 光被引导到被分析产品的一部分，从产品反射或透射到光学检测器。 将来自光学检测器的信号进行比较，以确定正在分析的产品的特性。 可以监视监视系统内的温度，以便为由光学检测器产生的信号提供补偿。 被分析的产品可以是固定的，由检查点通过输送机或其他方式移动，或者可以容纳在容器内，该容器包括产品照明光通过的窗口部分。

公开(公告)号：US20120257649A1

公开(公告)日：2012-10-11

申请号：US13479755

申请日：2012-05-24

Applicant: Hideki TANAKA

Inventor： Hideki TANAKA

IPC: G01K7/00

CPC classification number: G01J5/04 ,  G01J3/0202 ,  G01J3/0243 ,  G01J5/0011 ,  G01J5/02 ,  G01J5/0205 ,  G01J5/025 ,  G01J5/028 ,  G01J5/048 ,  G01J5/049 ,  G01J5/08 ,  G01J5/085 ,  G01J5/14 ,  G01J2005/068 ,  H05K1/189 ,  H05K2201/09063 ,  H05K2201/10151 ,  H05K2201/10606

Abstract: An object is to realize an ear thermometer that is configured to easily arrange a sensor in a sensor mirror and is suitable for mass production. The ear thermometer has a probe. The probe includes a probe body and a temperature measuring part joined with the probe body. The temperature measuring part includes a flange coupled with the probe body and a front end part extending from the flange, the front end part incorporating a sensor mirror. The sensor mirror includes a cylindrical holder with an internal concave reflection face, a connection shaft extending from the back of the cylindrical holder, a flexible printed circuit board with a circuit conductor of predetermined pattern, stretched in a front space of the cylindrical holder, a temperature measuring first sensor and a correcting second sensor spaced by a predetermined distance from each other in a longitudinal direction of the board and soldered to the circuit conductor on the board, and a protection cover covering a front face of the cylindrical holder. The board is electrically connected, in the temperature measuring part, to the cable passing through the probe body.

Abstract translation: 一个目的是实现一种耳式温度计，其配置为能够将传感器轻松地布置在传感器镜中，并且适合于批量生产。 耳温度计有一个探头。 探针包括探针体和与探针体接合的温度测量部。 温度测量部件包括与探针本体连接的凸缘和从凸缘延伸的前端部，前端部分包括传感器镜。 传感镜包括一个带有内凹反射面的圆筒形保持器，从圆柱形支架的背面延伸的连接轴，具有预定图案的电路导体的柔性印刷电路板，在柱形保持器的前部空间中被拉伸， 温度测量第一传感器和校正第二传感器，其在板的纵向方向上彼此间隔开预定距离并且焊接到板上的电路导体，以及覆盖圆柱形保持器的前表面的保护盖。 该板在温度测量部分电连接到穿过探头主体的电缆。

公开(公告)号：US20120026484A1

公开(公告)日：2012-02-02

申请号：US13196802

申请日：2011-08-02

Applicant: Michael L. Myrick ,  Robert P. Freese ,  William Soltmann ,  David L. Perkins

Inventor： Michael L. Myrick ,  Robert P. Freese ,  William Soltmann ,  David L. Perkins

IPC: G01N21/01

CPC classification number: G01J3/02 ,  G01J3/021 ,  G01J3/0229 ,  G01J3/0232 ,  G01J3/0235 ,  G01J3/0243 ,  G01J3/0286 ,  G01J3/08 ,  G01J3/28 ,  G01J3/42 ,  G01J2003/1213 ,  G01N2201/1293

Abstract: The present subject matter relates to methods of high-speed analysis of product samples during production of the product. Light is directed to a portion of a product under analysis and reflected from or transmitted through the product toward optical detectors. Signals from the optical detectors are compared to determine characteristics of the product under analysis. Temperature within the monitoring system may be monitored in order to provide compensation for the signals produced by the optical detectors. The products under analysis may be stationary, moved by an inspection point by conveyor or other means, or may be contained within a container, the container including a window portion through which the product illuminating light may pass.

Abstract translation: 本主题涉及产品生产过程中产品样品的高速分析方法。 光被引导到被分析产品的一部分，从产品反射或透射到光学检测器。 将来自光学检测器的信号进行比较，以确定正在分析的产品的特性。 可以监视监视系统内的温度，以便为由光学检测器产生的信号提供补偿。 被分析的产品可以是固定的，由检查点通过输送机或其他方式移动，或者可以容纳在容器内，该容器包括产品照明光通过的窗口部分。

公开(公告)号：US20110273707A1

公开(公告)日：2011-11-10

申请号：US13100495

申请日：2011-05-04

Applicant: David Roger LABRECQUE

Inventor： David Roger LABRECQUE

IPC: G01J3/40 ,  B23P11/00 ,  G01J3/28

CPC classification number: G01J3/18 ,  G01J3/02 ,  G01J3/0229 ,  G01J3/0243 ,  G01J3/20 ,  G01J3/28 ,  G01J3/2823 ,  G01J3/2846 ,  G01J3/4406 ,  Y10T29/49826

Abstract: The present invention provides apparatuses including a point light source, a diffraction grating oriented in a light path generated from the point light source wherein the diffraction grating diffracts and concentrates light from the point light source into one or more rings of light, a detector positioned to detect one or more of the rings of light or light transmitted from a sample exposed to said rings of light, and a computer operably connected to the detector to analyze the intensity of one or more of the rings of light or said light transmitted from said sample. Variations including samples and additional components and methods of making the apparatuses of the present invention are also disclosed.

Abstract translation: 本发明提供了一种装置，包括点光源，衍射光栅，其定向在从点光源产生的光路中，其中衍射光栅将来自点光源的光衍射并集中到一个或多个光环中，检测器定位成 检测从暴露于所述光环的样品透射的光或光的一个或多个环，以及可操作地连接到所述检测器的计算机，以分析从所述样品透射的一个或多个所述光或所述光的强度 。 还公开了包括样品和附加组分的变化以及制备本发明的装置的方法。

公开(公告)号：US08035814B2

公开(公告)日：2011-10-11

申请号：US12464273

申请日：2009-05-12

Applicant: Katsumi Shibayama ,  Tomofumi Suzuki ,  Masaki Hirose

Inventor： Katsumi Shibayama ,  Tomofumi Suzuki ,  Masaki Hirose

IPC: G01J3/28

CPC classification number: G01J3/2803 ,  G01J3/02 ,  G01J3/0202 ,  G01J3/0208 ,  G01J3/0243 ,  G01J3/0259 ,  G01J3/0262 ,  G01J3/0286 ,  G01J3/18

Abstract: In a spectroscopy module 1, a light passing hole 50 through which a light L1 advancing to a spectroscopic portion 4 passes is formed in a light detecting element 5. Therefore, it is possible to prevent the relative positional relationship between the light passing hole 50 and a light detecting portion 5a of the light detecting element 5 from deviating. Moreover, the light detecting element 5 is bonded to a front plane 2a of a substrate 2 with an optical resin adhesive 63. Thus, it is possible to reduce a stress generated onto the light detecting element 5 due to a thermal expansion difference between the light detecting element 5 and the substrate 2. Additionally, on the light detecting element 5, a first convex portion 101 is formed so as to be located at least between the light detecting portion 5a and the light passing hole 50 when viewed from a direction substantially perpendicular to the front plane 2a. Thus, when the light detecting element 5 is attached to the substrate 2 via the optical resin adhesive 63, the optical resin adhesive 63 is dammed at the first convex portion 101. Thus, the optical resin adhesive 63 is prevented from penetrating into the light passing hole 50.

Abstract translation: 在光谱模块1中，在光检测元件5中形成有通过向分光部4前进的光L1通过的光通过孔50.因此，能够防止光通过孔50与 光检测元件5的光检测部分5a偏离。 此外，光检测元件5利用光学树脂粘合剂63接合到基板2的前面2a。因此，可以减少由于光的热膨胀差而在光检测元件5上产生的应力 检测元件5和基板2.此外，在光检测元件5上，当从基本上垂直的方向观察时，形成至少位于光检测部分5a和光通过孔50之间的第一凸部101 到前平面2a。 因此，当光检测元件5经由光学树脂粘合剂63安装到基板2上时，光学树脂粘合剂63被阻挡在第一凸部101处。因此，防止光学树脂粘合剂63渗透到光通过 孔50。

公开(公告)号：US07977636B2

公开(公告)日：2011-07-12

申请号：US12228539

申请日：2008-08-12

Applicant: Markus B. Raschke

Inventor： Markus B. Raschke

IPC: G01J5/02

CPC classification number: G01J3/02 ,  G01J3/0208 ,  G01J3/0243 ,  G01J3/108 ,  G01J3/36 ,  G01J3/42 ,  G01J3/453 ,  G01Q30/02 ,  G01Q60/58

Abstract: A method for performing sub-micron optical spectroscopy, using a heated SPM probe and far-field collection optics is described. The enhanced emission characteristics at a sharp heated tip constitute a highly localized wideband IR source. Thus the IR absorption and emission properties of a sample surface adjacent can be observed and measured in the farfield even though the interaction region is sub-micron in scale. . . . providing spatial resolution mapping of sample composition.

Abstract translation: 描述了使用加热的SPM探针和远场收集光学器件进行亚微米光谱的方法。 在尖锐的加热尖端处的增强的发射特性构成高度局部化的宽带IR源。 因此，即使相互作用区域在亚微米级别，也可以在远场观察和测量邻近的样品表面的IR吸收和发射性质。 。 。 。 提供样品组成的空间分辨率映射。