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    IMAGING SPECTROMETER WITH REFLECTIVE GRATING
    151.
    发明申请
    IMAGING SPECTROMETER WITH REFLECTIVE GRATING 审中-公开

    公开(公告)号：US20180094977A1

    公开(公告)日：2018-04-05

    申请号：US15718475

    申请日：2017-09-28

    Applicant: European Space Agency

    Inventor： Matteo Taccola

    IPC: G01J3/26 ,  G02B17/06 ,  G02B5/18 ,  G01J3/18 ,  G01J3/28

    CPC classification number: G01J3/26 ,  G01J3/021 ,  G01J3/0291 ,  G01J3/18 ,  G01J3/1809 ,  G01J3/2823 ,  G01J2003/262 ,  G02B5/1861 ,  G02B17/061 ,  G02B17/0615

    Abstract: An imaging spectrometer receives a beam of light from a slit and outputs the beam of light to a focal plane. The output beam of light at the focal plane is dispersed in accordance with a spectral composition of the beam of light received from the slit. The imaging spectrometer comprises first to fourth curved reflective portions. The first to fourth curved reflective portions are arranged so that the beam of light, in its passage from the slit to the focal plane, sequentially strikes the first to fourth curved reflective portions and is reflected by the first to fourth curved reflective portions. Further, the first to fourth curved reflective portions are alternatingly concave or convex, respectively, along the passage of the beam of light. At least one of the first to fourth curved reflective portions has a reflective grating structure. Further disclosed is a method of manufacturing such imaging spectrometer.

    Spectroscopic detector
    156.
    发明授权
    Spectroscopic detector 有权

    公开(公告)号：US09891104B2

    公开(公告)日：2018-02-13

    申请号：US15204418

    申请日：2016-07-07

    Applicant: SHIMADZU CORPORATION

    Inventor： Hiroyuki Minato

    IPC: G01J3/28 ,  G01J3/18 ,  G01J3/02 ,  G01J3/10 ,  G01N30/74

    CPC classification number: G01J3/18 ,  G01J3/0291 ,  G01J3/10 ,  G01N30/74 ,  G01N21/65

    Abstract: Provided is a spectroscopic detector including: a light source for generating polychromatic light 11; a single diffraction grating 13; an excitation optical system for guiding the light from the light source 11 onto the diffraction grating 13, for selecting one wavelength from the light diffracted by the diffraction grating 13, and for casting the selected wavelength of light into a sample as excitation light; a detection optical system for guiding observation light emitted from the sample irradiated with the excitation light onto the diffraction grating 13 to disperse the observation light; and a photodetector 15 for detecting the observation light dispersed by the detection optical system. By using one diffraction grating 13 in both the excitation optical system and the detection optical system, the number of diffraction gratings is reduced, whereby both the cost reduction and the downsizing of the device are achieved.

    SPECTROMETER AND MANUFACTURING METHOD THEREOF
    159.
    发明申请
    SPECTROMETER AND MANUFACTURING METHOD THEREOF 审中-公开

    公开(公告)号：US20180017443A1

    公开(公告)日：2018-01-18

    申请号：US15360962

    申请日：2016-11-23

    Applicant: OTO PHOTONICS INC.

    Inventor： Chien-Hsiang Hung

    IPC: G01J3/18 ,  G01J3/02 ,  G01J3/28

    CPC classification number: G01J3/1895 ,  G01J3/021 ,  G01J3/0259 ,  G01J3/20 ,  G01J3/28 ,  G01J2003/1842

    Abstract: A spectrometer includes an input unit for receiving an optical signal, a diffraction grating disposed on the transmission path of the optical signal for dispersing the optical signal into a plurality of spectral rays, an image sensor disposed on the transmission path of at least a portion of the spectral rays, and a waveguide device. A waveguide space is formed between the first and second reflective surfaces of the waveguide device. The optical signal is transmitted from the input unit to the diffraction grating via the waveguide space. The portion of the spectral rays is transmitted to the image sensor via the waveguide space. At least one opening is formed on the waveguide device, and is substantially parallel to the first and/or second reflective surface. A portion of the spectral rays and/or the optical signal diffuses from the opening out of the waveguide space without reaching the image sensor.

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