Abstract:
Provided is an apparatus for optical emission spectroscopy. The apparatus for the optical emission spectroscopy includes a light collection unit configured to collect light within a plasma process chamber in which plasma is generated to process a substrate, a light transmission unit configured to transmit the collected light, and an analysis unit configured to analyze the light provided through the light transmission unit, thereby analyzing a plasma state. The light collection unit includes a light collection part configured to concentrate the light generated in the plasma process chamber and provide the concentrated light to the light transmission unit.
Abstract:
Systems and methods for measuring a target in a sample, the target being capable of generating an emitted light in response to an excitation light. In an example system, an excitation light source generates the excitation light along an excitation optical path. An attenuation filter arrangement selectively adds an attenuation filter to the excitation optical path. The attenuation filter attenuates the excitation light by a corresponding attenuation factor. The excitation light exits the attenuation filter arrangement along the excitation optical path to illuminate the sample. A light energy detector receives the emitted light generated in response to the excitation light, and outputs a measured signal level corresponding to an emitted light level. If the light energy detector indicates an overflow, signal measurement is repeated with attenuation filters of increasing attenuation factors until the measured signal level does not overflow.
Abstract:
The present subject matter relates to methods of high-speed analysis of product samples. Light is directed to a portion of a product under analysis and reflected from or transmitted through the product toward an optical detector. Signals for the detector are compared with reference signals based on a portion of the illuminating light passing through a reference element to determine characteristics of the product under analysis. The products under analysis may be stationary, moved by an inspection point by conveyor or other means, or may be contained within a container, the container including a window portion through which the product illuminating light may pass.
Abstract:
A system comprises a processing system, a laser system, a telescope system, a detector system and optical systems operatively arranged such that the laser system may be capable of outputting multiple wavelengths to a common telescope system, and the detector system is capable of receiving signatures from the same telescope system, under the control of a control system. The processor system processes signals received from the detector system to determine substances identified by known signatures. For example, a plurality of detectors in the detector system each receive a range of wavelengths of the signatures received by the telescope system. For example, a variable beam diverger and variable beam expander operatively control expansion and divergence of the output the laser system. For example, a beam reducer and lenslet array may operatively transmit signatures via optical fiber bundle to one or more of the detectors.
Abstract:
A spectral camera for producing a spectral output is disclosed. The spectral camera has an objective lens for producing an image, a mosaic of filters for passing different bands of the optical spectrum, and a sensor array arranged to detect pixels of the image at the different bands passed by the filters, wherein for each of the pixels, the sensor array has a cluster of sensor elements for detecting the different bands, and the mosaic has a corresponding cluster of filters of different bands, integrated on the sensor element so that the image can be detected simultaneously at the different bands. Further, the filters are first order Fabry-Perot filters, which can give any desired passband to give high spectral definition. Cross talk can be reduced since there is no longer a parasitic cavity.
Abstract:
Disclosed is a spectrum measuring apparatus for shortening such a measurement time period for an object being measured including two or more mutually different measurement portions as is required for the spectrum measurements of the lights from individual measurement portions. The spectrum measuring apparatus comprises a slit group having two or more slits, a spectroscope for separating the lights extracted by the slit group, for the individual slits, and a measuring unit for measuring the intensities of the individual components, which are separated by the spectroscope, for the slits. The individual slits extract such ones of the lights coming from an object being measured including two or more mutually different measurement portions, as come from the individual measurement portions.
Abstract:
A spectrometer assembly (10), comprising an Echelle grating (18; 46) for dispersing radiation entering the spectrometer assembly (10) in a main dispersion direction, and a dispersion assembly (16; 40) for dispersing a parallel radiation bundle generated from the radiation entering the spectrometer assembly in a lateral dispersion direction, is characterized in that the dispersion assembly (16; 40) is reflective, and the dispersion assembly (16; 40) is arranged relative to the Echelle grating (18; 46) in such a way that the parallel radiation bundle is reflected in the direction of the Echelle grating. The Echelle grating (18; 46) may be arranged in such a way that the dispersed radiation is reflected back to the dispersion assembly (16; 40).
Abstract:
A calibration system for a detector includes a base member, a plurality of radiation sources fixedly attached to the base member, and a positioning mechanism attached to the base member. Each radiation source is maintained at a different temperature and is configured to emit electromagnetic radiation. The positioning mechanism includes a movable member having a single degree of freedom with respect to the base member, and a plurality of optical elements arranged on the movable member. Each optical element corresponds to one of the radiation sources and each optical element is configured to at least be movable between a calibration position and a non-calibration position. When the optical element is in the calibration position, the optical element is configured to receive the electromagnetic radiation from its corresponding radiation source and to reflect the electromagnetic radiation to a detector.
Abstract:
An optical imaging system and method including a movable pixelated filter array, a shutter mechanism to which the pixelated filter array is attached, and a controller configured to implement a data reduction algorithm. The shutter mechanism is configured to move the pixelated filter array into and out of the optical path, and the data reduction algorithm allows the controller to account for axial and/or lateral misalignment of the filter array relative to the imaging detector array or its conjugate. In certain examples, the controller is further configured to use the data reduction algorithms also to perform wavefront sensing, for example to estimate wavefront error.
Abstract:
The invention relates to methods and systems for measuring and/or monitoring the chemical composition of a sample (e.g., a process stream), and/or detecting specific substances or compounds in a sample, using light spectroscopy such as absorption, emission and fluorescence spectroscopy. In certain embodiments, the invention relates to spectrometers with rotating narrow-band interference optical filter(s) to measure light intensity as a function of wavelength. More specifically, in certain embodiments, the invention relates to a spectrometer system with a rotatable filter assembly with a position detector rigidly attached thereto, and, in certain embodiments, the further use of various oversampling methods and techniques described herein, made particularly useful in conjunction with the rotatable filter assembly. In preferred embodiments, the rotatable filter is tilted with respect to the rotation axis, thereby providing surprisingly improved measurement stability and significantly improved control of the wavelength coverage of the filter spectrometer.