Automated Delay Line Alignment
    161.
    发明申请

    公开(公告)号:US20180245977A1

    公开(公告)日:2018-08-30

    申请号:US15753459

    申请日:2016-08-19

    Abstract: A system and method for aligning a light beam in a spectroscopic measuring device such as a pump-probe device is provided. The system and method comprise a first motorized mirror (66b) positioned to receive and transmit a light beam (60a); a second motorized mirror (66c) positioned relative to the first mirror to receive the light beam from the first mirror and transmit the light beam to a delay line (64); a third mirror (78) positioned to receive the light beam from the delay line and transmit said light beam to a detector (80); and a computer-based processor (82) in communication with the detector and the first and second mirrors, the processor configured to a) receive and process data relating to the light beam from the detector, and b) cause movement of the first and second mirrors to change an angle of the mirrors based on the data relating to the light beam.

    Method and apparatus for calibrating a color measurement instrument

    公开(公告)号:US09952102B1

    公开(公告)日:2018-04-24

    申请号:US15628803

    申请日:2017-06-21

    Abstract: In one example, an electronic signal is received from a target color measurement instrument that includes a plurality of color channels. A response of the target color measurement instrument to a light emitted by a target light emitting device is extracted from the signal. The response is calibrated to minimize a difference between the response and an output of a color matching function of a standard observer. Calibrating includes multiplying the response by a calibration matrix. The calibration matrix combines measurements of a first plurality of lights from a tunable light source and measurements of a second plurality of lights from the target light emitting device. A first subset of the measurements of the first plurality and second plurality of lights are made by the target color measurement instrument and a second subset of the measurements of the first plurality and second plurality of lights are made by a reference spectroradiometer.

    TRANSFER OF A CALIBRATION MODEL USING A SPARSE TRANSFER SET

    公开(公告)号:US20180031421A1

    公开(公告)日:2018-02-01

    申请号:US15614110

    申请日:2017-06-05

    Abstract: A device may obtain a master calibration set, associated with a master calibration model of a master instrument, that includes spectra, associated with a set of samples, generated by the master instrument. The device may identify a selected set of master calibrants based on the master calibration set. The device may obtain a selected set of target calibrants that includes spectra, associated with the subset of the set of samples, generated by the target instrument. The device may create a transfer set based on the selected set of master calibrants and the selected set of target calibrants. The device may create a target calibration set, corresponding to the master calibration set, based on the transfer set. The device may generate, using an optimization technique associated with the transfer set and a support vector regression modeling technique, a transferred calibration model, for the target instrument, based on the target calibration set.

    SPECTROMETER MODULE AND FABRICATION METHOD THEREOF

    公开(公告)号:US20180017441A1

    公开(公告)日:2018-01-18

    申请号:US15371229

    申请日:2016-12-07

    CPC classification number: G01J3/0256 G01J3/0202 G01J3/0229 G01J3/0297 G01J3/18

    Abstract: A spectrometer module and a fabrication method thereof are provided. The fabrication method includes the steps of: providing at least one substrate; and forming at least one positioning side and at least one optical component of the spectrometer on the at least one substrate by a microelectromechanical systems (MEMS) process. The spectrometer module fabricated by the fabrication method includes a plurality of substrates and at least one optical component. At least one of the substrates has at least one positioning side, and the at least one optical component of the spectrometer is formed on at least one of the substrates. The positioning side and the optical component are fabricated by a MEMS process.

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