Photo electric measuring device
    181.
    发明申请
    Photo electric measuring device 失效
    照片电测仪

    公开(公告)号:US20020075482A1

    公开(公告)日:2002-06-20

    申请号:US10002398

    申请日:2001-10-25

    Inventor: Hans Pallingen

    Abstract: A device for the photoelectric measuring of an opaque or transparent object to be measured includes a photoelectric sensor (4) and a measuring optics (3) which directs measuring light originating from a measurement field of the object to be measured (6) onto the sensor (4). A control electronic (5) cooperates with the sensor (4) for the processing of the electrical signals produced by the sensor. The sensor (4) includes at least two individually controlled and concentrically arranged partial sensors (41, 42, 43), and the control electronics (5) includes switching means (51) by which the partial sensors (41, 42, 43) can be selectively switched on or off-line. The use of a photoelectric sensor made of or divided into several partial sensors enables a purely electronic and therefore simple and fast selection of different effective measurement field sizes.

    Abstract translation: 用于测量不透明或透明物体的光电测量装置包括:光电传感器(4)和测量光学元件(3),其将来自被测量物体(6)的测量光的测量光引导到传感器 (4)。 控制电子(5)与传感器(4)配合用于处理由传感器产生的电信号。 传感器(4)包括至少两个独立控制和同心布置的部分传感器(41,42,43),并且控制电子器件(5)包括切换装置(51),部分传感器(41,42,43) 有选择地打开或离线。 使用由几个部分传感器制成或分为几个部分传感器的光电传感器能够实现纯电子,因此简单而快速地选择不同的有效测量场尺寸。

    Method and apparatus for spectrum analysis and encoder

    公开(公告)号:US20010019408A1

    公开(公告)日:2001-09-06

    申请号:US09846583

    申请日:2001-05-01

    Inventor: Thomas W. Hagler

    Abstract: A disc serving as a spatial radiation modulator has dispersed radiation filters thereon. Each filter has a transmittance or reflectance modulation function of the form sin2(mnullnullpnull/4), where m is a positive integer and p has one of the four values 0, 1, 2, 3. A radiation beam including selected wavelength components is diffracted into an elongated image dispersed according to wavelength. Different wavelength components are focused onto different filters on the modulator and are encoded by correspond filters. Since the modulation functions of the filters are orthogonal to one another, it is possible to extract the amplitude of each wavelength component after it has been encoded or modulated by corresponding filter from the total detected signal during one measurement.

    Postacquired spectrophotometers
    183.
    发明授权
    Postacquired spectrophotometers 失效
    后检测分光光度计

    公开(公告)号:US5386295A

    公开(公告)日:1995-01-31

    申请号:US005321

    申请日:1993-01-15

    Abstract: A postacquired spectrophotometer, for use with a sample and reference. The spectrophotometer has a filter unit, defining an axis of movement, and pluralities of designated sites and dark sites disposed in uniform relation to the axis. The designated and dark sites are disposed in alternation. Alternating designated sites have apertures and filters covering the apertures. Further, a main member, coaxial with the filter unit, has sample and reference beam paths, which are intersected by the sites. The main member has disposed, in operative relation to the actuators, an actuator sensor, which generates an integration actuator signal upon alignment with each integration actuator and a clamping actuator signal upon alignment with each clamping actuator. Moreover, a drive continuously moves the filter unit relative to the axis and beam paths. Further, a light distribution system directs light separately from the sample and reference to respective beam paths, and then to a detector, which produces a detector signal responsive to light received. Finally, means for processing the signals is provided, including a clamping circuit, integrators, and a demultiplexer.

    Abstract translation: 一个采用分光光度计的分光光度计,用于样品和参考。 分光光度计具有限定运动轴线的过滤器单元以及与轴线均匀关系地设置的多个指定位置和暗点。 指定的和黑暗的地点交替处置。 交替指定的位置具有覆盖孔的孔和过滤器。 此外,与过滤器单元同轴的主构件具有与位置相交的样品和参考光束路径。 主构件以致动器的方式相对于致动器设置致动器传感器,其在与每个积分致动器对准时产生积分致动器信号,并且在与每个夹紧致动器对准时产生夹紧致动器信号。 此外,驱动器相对于轴和梁路连续地移动过滤单元。 此外,配光系统将光从样品分开引导并参考各个光束路径,然后引导到检测器,该检测器响应于所接收的光产生检测器信号。 最后,提供用于处理信号的装置,包括钳位电路,积分器和解复用器。

    Microscopic spectrometer
    184.
    发明授权
    Microscopic spectrometer 失效
    显微镜光谱仪

    公开(公告)号:US5301007A

    公开(公告)日:1994-04-05

    申请号:US607313

    申请日:1990-10-31

    Applicant: Juichiro Ukon

    Inventor: Juichiro Ukon

    Abstract: A microscopic spectrometer having a separate optical path for masking light from a sample for spectrometric measurements. In the preferred embodiment, a beam splitter is disposed behind an object lens to form two branched optical paths. One of the optical paths is provided with masks at a point of focus along the path, allowing part of the image to be masked. The second optical path allows optical throughput and observation of the entire image. These two optical paths are rejoined, and a final image is obtained for visual inspection by synthesizing the two optical paths.

    Abstract translation: 具有用于掩蔽来自样品的光的单独光路的微观光谱仪用于光谱测量。 在优选实施例中,分束器设置在物镜后面以形成两个分支的光路。 光路中的一个在沿着路径的焦点处设置有掩模,允许图像的一部分被掩蔽。 第二光路允许光学吞吐量和整个图像的观察。 这两个光路被重新连接,并通过合成两个光路获得最终的图像用于目视检查。

    Dispersive holographic spectrometer
    185.
    发明授权
    Dispersive holographic spectrometer 失效
    分散全息光谱仪

    公开(公告)号:US5050992A

    公开(公告)日:1991-09-24

    申请号:US508436

    申请日:1990-04-13

    Abstract: This invention relates to a dispersive holographic spectrometer (12) for analyzing radiation from an infrared source (16). The holographic spectrometer (12) comprises a piezoelectric block (40) having a holographic lens (38) on one face, an array of detectors (36) on another face and a pair of vernier electrodes (32, 34) on opposite faces. Radiation from the source (16) incident upon the holographic lens (38) is dispersed into component wavelengths (44, 46) and directed towards the detector array (38). The holographic lens (36) has a holographic interference pattern recorded on it such that radiation of predetermined wavelength components are dispersed sufficiently enough such that radiation of specific wavelengths falls on different detector elements (48) of the detector array (36). By applying a voltage to the electrodes (32, 38), an electric field is created within the piezoelectric block (40) such that it is either compressed or expanded. This change in the piezoelectric block (40) alters the direction of the radiation from the holographic lens (38) to the detector array (36). Therefore, misalignment of the source (16) with the holographic lens (38) can be compensated for such that piezoelectric adjustment of the block (40) will make the radiation of individual wavelengths fall on the desired detector element (48). Further, radiation from different wavelengths can be directed from one detector element to another. The detector array (36) is self-scanning such that an absorption spectrum can be measured and recorded over a range of frequencies.

    Process and apparatus for the colorimetric analysis of printed material
    186.
    发明授权
    Process and apparatus for the colorimetric analysis of printed material 失效
    用于印刷材料比色分析的方法和装置

    公开(公告)号:US4505589A

    公开(公告)日:1985-03-19

    申请号:US363538

    申请日:1982-03-30

    CPC classification number: G01J3/02 B41F33/0036 G01J3/0289 B41P2233/51

    Abstract: On a measuring table (1), a bridge (2) extends over a printed sheet (5) to be measured. A measuring carriage (3) carrying a three color-simultaneous measuring head is arranged on the bridge (2) for linear movement in a back-and-forth manner along a desired path on the printed sheet. For control of the movement of the measuring head during measuring runs and for the evaluation of the measured data, a computer (7) with an integrated image display terminal and a processor system (6) controlled by the computer, is provided with the necessary interfaces. The analysis of a color measuring strip (MS) located along the desired path on the printed sheet is effected in two phases. In a first, so-called recognition run the measuring strip is scanned stepwise with high resolution in all three color channels, for the purpose of an analysis of its configuration. By means of flat locations in the density variations, effective positions (e.g., the centers) in the measuring fields are determined as possible measuring positions for subsequent measuring runs. During the measuring runs the measuring strip is measured only at the measuring positions determined during the recognition and the measured data obtained in this manner are transmitted for processing and/or display to the computer (7). By the division of the measurements into a recognition and a measuring run, coupled with the determination of measuring positions by means of flat locations in the density variations, a practically completely automatic evaluation of the color measuring strips independently of their configuration and without the need of prior knowledge of the strips by the apparatus, is rendered possible.

    Abstract translation: 在测量台(1)上,桥接件(2)在待测量的印刷板(5)上延伸。 承载三色同步测量头的测量托架(3)布置在桥架(2)上,用于沿打印片材上所需的路径沿着前后方向线性运动。 为了在测量运行期间控制测量头的移动和用于评估测量数据,具有集成图像显示终端的计算机(7)和由计算机控制的处理器系统(6)被提供有必要的接口 。 沿着打印纸上的所需路径定位的测色条(MS)的分析分两个阶段进行。 首先,所谓的识别运行,测量条在所有三个颜色通道中以高分辨率逐步扫描,以便分析其配置。 通过在密度变化中的平坦位置,测量场中的有效位置(例如,中心)被确定为用于后续测量运行的可能的测量位置。 在测量运行期间,仅在识别期间确定的测量位置处测量测量条,并且以这种方式获得的测量数据被传送以用于处理和/或显示到计算机(7)。 通过将测量值分解为识别和测量运行,加上通过密度变化中的平坦位置确定测量位置,实际上完全自动评估颜色测量条,而不需要其配置 通过该装置对条的先前知识是可能的。

    SYSTEMS AND METHODS TO REDISTRIBUTE FIELD OF VIEW IN SPECTROSCOPY

    公开(公告)号:US20230384156A1

    公开(公告)日:2023-11-30

    申请号:US18030247

    申请日:2021-10-05

    CPC classification number: G01J3/0289 G01J3/021

    Abstract: An apparatus includes a substrate and an optically powered surface. The substrate is transmissive of electromagnetic energy, and includes a plurality of reflective portions oriented and positioned to control a propagation direction of electromagnetic energy along an optical path of the substrate. The substrate further includes an input surface aligned with the optical path so as to allow electromagnetic energy to enter the substrate through the input surface. The optically powered surface is positioned relative to the substrate so as to redirect a field of view of the substrate. The field of view of the substrate is bounded by a first angular width, a field of view of the optically powered surface is bounded by a second angular width, and the second angular width is different than the first angular width.

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