Abstract:
The present invention is directed to a grating spectrometer system for polychromator spectrometer arrangements and monochromator spectrometer arrangements. The grating spectrometer system, according to the invention, comprises a light source for illuminating the sample to be analyzed, a diffraction grating, imaging optical elements, a detector arranged in the image plane, and a controlling and regulating unit. Individual light sources, preferably LEDs having different spectral characteristics, whose spectral range covers a plurality of diffraction orders in the image plane are used as light source. Only those LEDs which do not illuminate the same location of the individual detectors arranged in the image plane in any diffraction order are switched on individually or in groups by the controlling and regulating unit. The proposed solution is suitable for polychromator spectrometer arrangements and for monocluomator spectrometer arrangements. The field of application is determined by the spectral sensitivity of the detector that is employed. By using a plurality of diffraction orders, the resolution can be increased with the detector size remaining the same, or the detector surface can be reduced while retaining the same imaging quality.
Abstract:
The present application discloses a system comprising a compact curved grating (CCG) and its associated compact curved grating spectrometer (COGS) or compact curved grating wavelength multiplexer/demultiplexer (WMDM) module and a method for making the same. The system is capable of achieving a very small (resolution vs. size) RS factor. The location of the entrance slit and detector can be adjusted in order to have the best performance for a particular design goal. The initial groove spacing is calculated using a prescribed formula dependent on operation wavelength. The location of the grooves is calculated based on two conditions. The first one being that the path-difference between adjacent grooves should be an integral multiple of the wavelength in the medium to achieve aberration-free grating focusing at the detector or a first anchor output slit even with large beam diffraction angle from the entrance slit or input slit, the second one being specific for a particular design goal of a curved-grating spectrometer.
Abstract:
A spectrometer includes a first spectroscopic unit and a second spectroscopic unit. A light passing part, a reflection part, a common reflection part, a dispersive part, and a light detection part included in the first spectroscopic unit are arranged along a first reference line when viewed in a Z-axis direction. A light passing part, a reflection part, the common reflection part, a dispersive part, and a light detection part included in the second spectroscopic unit are arranged along a second reference line when viewed in the Z-axis direction. The first reference line and the second reference line intersect with one another.
Abstract:
A manufacturing method for a grating is disclosed for the angular dispersion of light impinging the grating. The grating comprises tapered structures and cavities. A cavity width and/or corrugation amplitude is varied for achieving a desired grating efficiency according to calculation. A method is disclosed for conveniently creating gratings with variable cavity width and/or corrugation amplitude. The method comprises the step of anisotropically etching a groove pattern into a grating master. Optionally a replica is produced that is complementary to the grating master. By variation of an etching resist pattern, the cavity width of the grating may be varied allowing the optimization towards different efficiency goals.
Abstract:
A spectrometer includes a light source to project a light beam to a target object, an optical element including a plurality of apertures through which the light beam reflected by the target object transmits, a diffraction element to form diffracted images from a plurality of light beams having transmitted through the optical element, and a light receiving element to receive the diffracted images formed by the diffraction element and including an optical shield to block a diffracted image other than a certain-order diffracted image.
Abstract:
A spectrometer includes a light source to project a light beam to a target object, an optical element including a plurality of apertures through which the light beam reflected by the target object transmits, a diffraction element to form diffracted images from a plurality of light beams having transmitted through the optical element, and a light receiving element to receive the diffracted images formed by the diffraction element and including an optical shield to block a diffracted image other than a certain-order diffracted image.
Abstract:
The invention concerns an optical system. The optical system comprises an input for receiving an optical signal, a predetermined output plane, and a diffraction grating for separating the optical signal received at the input into spectral elements thereof. The grating has a diffraction surface, which is formed by a photolithography process. The diffraction surface has a first predetermined profile. The first profile is formed by a plurality of points each conducted by different equations. Consequently, each spectral component is focused on the predetermined output plane.
Abstract:
An echelle spectroscope has one or more echelle diffraction gratings, one or more elements for separating dispersed light into portions corresponding to different orders of diffraction and one or more imaging means such as imaging mirrors but there is only one image detector. These components are so designed and arranged with respect to one another that the total range of wavelength to be analyzed is divided into a plurality of smaller ranges and the portions of the spectral light from a source corresponding to different ones of these divided wavelength ranges travel on different paths but would each form an image on the same image detector. A shutter is provided so as to selectively allow one of these portions of spectral light corresponding to one of different wavelength ranges to pass through.
Abstract:
Provided is a hyperspectral imaging (HSI) apparatus. The HSI apparatus includes: a first slit plate configured to introduce an output beam; a first aspherical mirror configured to reflect the introduced output beam; a first grating having a planar reflective surface, the first grating configured to generate a plurality of first split beams by splitting the output beam after being reflected by the first aspherical mirror; and a first camera configured to detect the plurality of first split beams.
Abstract:
A multispectral imaging system and method in which the zero-mode channel is used to provide imaging of any of a variety of optical properties. In one example an imaging method includes spectrally dispersing received electromagnetic radiation into its spectral components with a dispersive element to produce spectrally dispersed electromagnetic radiation, transmitting the electromagnetic radiation through the dispersive element to produce non-dispersed electromagnetic radiation corresponding to a zero order diffraction mode of the dispersive element, imaging the non-dispersed electromagnetic radiation to produce a zero-mode image, and simultaneously imaging the spectrally dispersed electromagnetic radiation to produce a spectral image.