公开(公告)号：US12009196B2

公开(公告)日：2024-06-11

申请号：US17596458

申请日：2019-07-01

Applicant: SHIMADZU CORPORATION

Inventor： Takahiro Harada ,  Yuichi Kuratani

IPC: H01J49/10 ,  H01J49/04

CPC classification number: H01J49/0409 ,  H01J49/10

Abstract: An ionizer 1 detachably attached to a main body 2 of an ion analyzing device includes an ionization section 10 including a sample stage 14 and light irradiation units 11, 12, and 13 configured to irradiate a sample placed on the sample stage 14 with light, a base body, and a movably-holding mechanism which is provided on the base body and configured to hold the ionization section in a manner movable or rotatable about one or more axes.

公开(公告)号：US11996278B2

公开(公告)日：2024-05-28

申请号：US17912226

申请日：2021-03-29

Applicant: ATONARP INC.

Inventor： Naoki Takahashi

IPC: H01J49/10 ,  H01J49/42 ,  H05H1/30

CPC classification number: H01J49/105 ,  H05H1/30 ,  H01J49/4215

Abstract: A plasma generating device includes: a chamber which is equipped with a dielectric wall structure and into which sample gas to be measured flows; an RF supplying mechanism that generates plasma inside the chamber using an electric field and/or a magnetic field through the dielectric wall structure; and a floating potential supplying mechanism that includes a first electrode disposed along an inner surface of the chamber. The RF supplying mechanism may include an RF field forming unit disposed in a first direction with respect to the chamber and the first electrode may include an electrode disposed in a second direction with respect to the chamber.

公开(公告)号：US20240170272A1

公开(公告)日：2024-05-23

申请号：US18426363

申请日：2024-01-30

Applicant: FUJIFILM Corporation ,  The University of Tokyo

Inventor： Yasuhiko HIRANA ,  Takuro SUGIYAMA ,  Yuko TERAO ,  Kaoru IWATO ,  Takafumi HIRATA

IPC: H01J49/10 ,  H01J49/00 ,  H01J49/40

CPC classification number: H01J49/105 ,  H01J49/0009 ,  H01J49/40

Abstract: Provided are a standard sample film or a standard sample for use in laser ablation inductively coupled plasma mass spectrometry, the standard sample film or the standard sample containing an organic substance and having a small variation in signal intensity of an ion of a metal element depending on a measurement position; a method for producing a standard sample film; a sample set; a quantitative analysis method; and a transfer film. The standard sample film of the present invention is a standard sample film for use in laser ablation inductively coupled plasma mass spectrometry, the standard sample film containing a polymer, a metal element, and an internal standard, and having a maximum height difference in film thickness of the standard sample film of 0.50 μm or less.

公开(公告)号：US11984310B2

公开(公告)日：2024-05-14

申请号：US17663074

申请日：2022-05-12

Applicant: Analytik Jena GmbH

Inventor： Roland Lehmann ,  Wolfram Weisheit ,  Iouri Kalinitchenko

IPC: H01J49/10 ,  H01J49/00 ,  H01J49/04 ,  H01J49/06

CPC classification number: H01J49/105 ,  H01J49/0031 ,  H01J49/0495 ,  H01J49/067

Abstract: A method of operating an inductively coupled plasma mass spectrometry apparatus for analyzing an analyte sample, the mass spectrometry apparatus including a plasma ion source, a mass analyzer and an interface arrangement positioned between the plasma ion source and the mass analyzer of the mass spectrometer, the interface arrangement at least including an interface structure, including a sampling or skimmer cone, and at least one passage with an inlet and an outlet into a reaction zone, the method including: generating a plasma using the plasma ion source and forming a plasma flux to flow towards the mass analyzer; supplying the analyte sample into the reaction zone via the passage such that the analyte sample interacts with the plasma flux; and analyzing the analyte sample using the mass analyzer.

公开(公告)号：US20240153752A1

公开(公告)日：2024-05-09

申请号：US18500982

申请日：2023-11-02

Applicant: Thermo Fisher Scientific (Bremen) GmbH

Inventor： Jona THALMANN ,  Hans-Jürgen SCHLÜTER ,  Benno STRASSER ,  Norbert QUAAS

IPC: H01J49/10 ,  H01J49/00 ,  H01J49/42

CPC classification number: H01J49/105 ,  H01J49/0027 ,  H01J49/421

Abstract: Methods for operating a mass spectrometer having a skimmer and a circuit configured to apply an electric potential to the skimmer comprise obtaining an initial mass spectrum of a sample and measuring a value indicating an ion beam intensity of one or more ion species. A varying DC electric potential is applied to the skimmer to identify an operational electric potential, wherein the DC electric potential is varied until the value indicating the ion beam intensity of the one or more ion species changes by a predetermined amount. The mass spectrum with the operational electric potential applied to the skimmer is output. In some examples, a pressure within the mass spectrometer is varied to identify an operational pressure, and the mass spectrum with the pressure within the mass spectrometer at the operational pressure is output.

公开(公告)号：US11933706B2

公开(公告)日：2024-03-19

申请号：US17215711

申请日：2021-03-29

Applicant: TOKYO OHKA KOGYO CO., LTD.

Inventor： Kohei Suzuki ,  Isao Nouchi ,  Toshio Nomura

IPC: G01N1/38 ,  G01N27/623 ,  G01N33/44 ,  H01J49/10

CPC classification number: G01N1/38 ,  G01N27/623 ,  G01N33/442 ,  H01J49/105 ,  G01N2001/383

Abstract: A method of analyzing a metal component contained as an impurity in a polymer composition that contains a polymer and an organic solvent including a step (i) of preparing a dispersion by mixing the polymer composition with an acid aqueous solution, a step (ii) of separating the dispersion prepared in the step (i) into a dispersoid layer containing the polymer and a dispersion medium layer containing the metal component, and a step (iii) of quantifying the metal component contained in the dispersion medium layer separated in the step (ii).

公开(公告)号：US11917744B2

公开(公告)日：2024-02-27

申请号：US17383060

申请日：2021-07-22

Applicant: PERKINELMER SCIENTIFIC CANADA ULC

Inventor： Tak Shun Cheung ,  Chui Ha Cindy Wong ,  William Fisher ,  Hamid Badiei

IPC: H05H1/28 ,  H01J49/10 ,  H05H1/46 ,  H01J49/04 ,  G01J3/44 ,  G01J3/443

CPC classification number: H05H1/28 ,  H01J49/0468 ,  H01J49/105 ,  H05H1/4652 ,  G01J3/443

Abstract: A system for cooling an inductively coupled plasma (ICP) instrument includes: the ICP instrument; a pump in fluid communication with the instrument via a first conduit; and a micro-channel heat exchanger in fluid communication with the instrument via a second conduit, and in fluid communication with the pump via a third conduit. The pump is configured to generate a pump outlet pressure of coolant that exceeds a back pressure of the instrument such that a pressure of the coolant traveling through the second conduit and into the heat exchanger is less than or equal to 5 pounds per square inch (psi) above atmospheric pressure, as measured at an inlet to the heat exchanger.

公开(公告)号：US20240060950A1

公开(公告)日：2024-02-22

申请号：US18494030

申请日：2023-10-25

Applicant: Quest Diagnostics Investments LLC

Inventor： Nigel Clarke

IPC: G01N33/15 ,  H01J49/00 ,  G01N30/72 ,  G01N33/94 ,  G01N33/49 ,  H01J49/10

CPC classification number: G01N33/15 ,  H01J49/0031 ,  H01J49/0045 ,  G01N30/7233 ,  G01N33/94 ,  G01N33/49 ,  H01J49/004 ,  H01J49/10 ,  Y10T436/17 ,  G01N33/48

Abstract: Provided are methods for determining the amount of tamoxifen and its metabolites in a sample by mass spectrometry. In some aspects, the methods provided herein determine the amount of N-Desmethyl Tamoxifen. In some aspects, the methods provided herein determine the amount of N-Desmethyl Tamoxifen and other tamoxifen metabolites. In some aspects, the methods provided herein determine the amount of tamoxifen, N-Desmethyl Tamoxifen, and other tamoxifen metabolites.

公开(公告)号：US11862450B2

公开(公告)日：2024-01-02

申请号：US17612092

申请日：2020-05-19

Applicant: Thermo Fisher Scientific (Bremen) GmbH

Inventor： Henning Wehrs ,  Johannes Schwieters ,  Gerhard Jung

IPC: H01J49/10 ,  H01J49/42 ,  H01J49/06 ,  H01J49/00 ,  H01J49/02 ,  F16K1/20

CPC classification number: H01J49/063 ,  F16K1/2007 ,  H01J49/005 ,  H01J49/0077 ,  H01J49/022 ,  H01J49/065 ,  H01J49/067 ,  H01J49/068 ,  H01J49/105 ,  H01J49/421 ,  H01J49/4215

Abstract: An ion optical arrangement (1) for use in a mass spectrometer comprises a collision cell defining an ion optical axis along which ions may pass, electrodes comprising a set of parallel poles (11A, 11B, 11C) arranged in the collision cell, and a voltage source for providing voltages to the electrodes to produce electric fields. The ion optical arrangement is arranged for switching between a first operation mode in which the collision cell is pressurized and a second operation mode in which the collision cell is substantially evacuated. The ion optical arrangement is further arranged for producing a radio frequency electric focusing field in the first operation mode and a static electric focusing field in the second operation mode.

公开(公告)号：US20230395406A1

公开(公告)日：2023-12-07

申请号：US18320748

申请日：2023-05-19

Applicant: Elemental Scientific, Inc.

Inventor： Tyler Yost ,  Daniel R. Wiederin ,  Beau A. Marth ,  Jared Kaser ,  Jonathan Hein ,  Jae Seok Lee ,  Jae Min Kim ,  Stephen H. Sudyka

IPC: H01L21/67 ,  H01L21/66 ,  H01L21/677 ,  H01J49/10 ,  G01N21/73

CPC classification number: H01L21/6719 ,  H01L21/67126 ,  H01L22/34 ,  H01L21/67772 ,  H01J49/105 ,  H01L21/67748 ,  H01L21/67051 ,  H01L21/67259 ,  H01L21/6708 ,  G01N21/73 ,  H01L22/14 ,  H01L21/6715 ,  H01L22/12 ,  H01J49/00

Abstract: Systems and methods are described for integrated decomposition and scanning of a semiconducting wafer, where a single chamber is utilized for decomposition and scanning of the wafer of interest.