公开(公告)号：US20170138789A1

公开(公告)日：2017-05-18

申请号：US15352175

申请日：2016-11-15

Applicant: ANALOG DEVICES, INC.

Inventor： Evgueni Ivanov

IPC: G01J3/02 ,  G02B6/122 ,  G02B6/12 ,  G01J3/45 ,  G01J3/18

CPC classification number: G01J3/0205 ,  G01J3/0216 ,  G01J3/0256 ,  G01J3/0259 ,  G01J3/1895 ,  G01J3/4532 ,  G01J2001/4242 ,  G01J2003/1213 ,  G02B6/124 ,  G02B6/305

Abstract: Embodiments of the present disclosure provide systems and methods for providing integrated waveguide-based spectrometer systems. In one aspect, the system includes an optical spectrometer comprising one or more waveguides configured to support propagation of optical radiation (i.e. light) through the waveguides to a photodetector. The spectrometer further includes an input coupler for each waveguide, the input coupler configured to couple the radiation from free space into the waveguide in absence of fiber-optic coupling of the radiation into the waveguide. Because at least a portion of the light propagated through the waveguides has interacted with a sample to be spectroscopically evaluated, the light detected by the photodetector allows to carry out the spectroscopic evaluation of the sample. At least some components of the spectrometer are provided on a single die using conventional CMOS techniques, yielding a compact and low cost device.

公开(公告)号：US09625314B2

公开(公告)日：2017-04-18

申请号：US14419576

申请日：2013-07-29

Applicant: HAMAMATSU PHOTONICS K.K.

Inventor： Katsumi Shibayama ,  Takafumi Yokino

IPC: G01J3/28 ,  G01J3/02 ,  G01J3/04 ,  G01J3/18

CPC classification number: G01J3/02 ,  G01J3/0256 ,  G01J3/0291 ,  G01J3/04 ,  G01J3/18 ,  G01J3/28

Abstract: A spectrometer comprises a package having a stem and a cap, an optical unit arranged on the stem, and a lead pin penetrating through the stem. The optical unit has a dispersive part for dispersing and reflecting light entering from a light entrance part of the cap, a light detection element for detecting the light dispersed and reflected by the dispersive part, a support for supporting the light detection element such as to form a space between the dispersive part and the light detection element, a projection projecting from the support, and a wiring electrically connected to the light detection element. The projection is arranged at such a position as to be in contact with the stem. The lead pin is electrically connected to a second terminal part of the wiring arranged in the projection.

公开(公告)号：US09618323B2

公开(公告)日：2017-04-11

申请号：US14911583

申请日：2014-07-31

Applicant: HAMAMATSU PHOTONICS K.K.

Inventor： Tomofumi Suzuki ,  Yoshihisa Warashina ,  Kohei Kasamori ,  Tatsuya Sugimoto ,  Jo Ito

IPC: G01B9/02 ,  G01J3/02 ,  G01J3/453

CPC classification number: G01B9/02051 ,  G01J3/0256 ,  G01J3/4532 ,  G01J3/4535

Abstract: A method of manufacturing an optical interferometer includes a first step of forming a first semiconductor portion for a beam splitter and a second semiconductor portion for a movable mirror on a main surface of a support substrate and a first insulating layer formed on the main surface, a second step of disposing a first wall portion between a first side surface of the first semiconductor portion and a second side surface in the second semiconductor portion, and a third step of forming a mirror surface in the second semiconductor portion by forming a first metal film on the second side surface using a shadow mask. In the third step, the first side surface is masked by the mask portion and the first wall portion and the first metal film is formed in a state in which the second side portion is exposed from an opening portion.

公开(公告)号：US20170067780A1

公开(公告)日：2017-03-09

申请号：US15122530

申请日：2015-02-06

Applicant: MICRO-EPSILON Optronic GmbH

Inventor： Tobias Otto

IPC: G01J3/14 ,  G01J3/18 ,  G01J3/22 ,  G01J3/02

CPC classification number: G01J3/14 ,  G01J3/0208 ,  G01J3/0256 ,  G01J3/18 ,  G01J3/22 ,  G01J3/2803 ,  G01J2003/1208

Abstract: The invention relates to a spectrometer comprising a combination of at least one grid (1) and at least one prism (2), characterised in that total reflexion is used to produce a compact spectrometer in at least one prism (2).

Abstract translation: 本发明涉及一种包括至少一个格栅（1）和至少一个棱镜（2）的组合的光谱仪，其特征在于，全反射用于在至少一个棱镜（2）中产生紧凑的光谱仪。

公开(公告)号：US20170026588A1

公开(公告)日：2017-01-26

申请号：US14700567

申请日：2015-04-30

Applicant: REBELLION PHOTONICS, INC.

Inventor： Robert Timothy Kester ,  Nathan Adrian Hagen

IPC: H04N5/33 ,  G01J5/00 ,  G02B5/20 ,  G01J5/08 ,  H04N5/225 ,  G06K9/00

CPC classification number: H04N5/33 ,  G01J3/0232 ,  G01J3/0256 ,  G01J3/2803 ,  G01J3/36 ,  G01J5/0014 ,  G01J5/0834 ,  G01J2003/2826 ,  G01J2005/0077 ,  G01N21/3504 ,  G01N2021/3531 ,  G01N2201/0221 ,  G02B5/201 ,  G02B5/208 ,  G06K9/00624 ,  G06K9/00664 ,  G06K9/2018 ,  G06K9/209 ,  G06K9/22 ,  H04N5/2258

Abstract: Various embodiments disclosed herein describe a divided-aperture infrared spectral imaging (DAISI) system that is adapted to acquire multiple IR images of a scene with a single-shot (also referred to as a snapshot). The plurality of acquired images having different wavelength compositions that are obtained generally simultaneously. The system includes at least two optical channels that are spatially and spectrally different from one another. Each of the at least two optical channels are configured to transfer IR radiation incident on the optical system towards an optical FPA unit comprising at least two detector arrays. One of the at least two detector arrays comprises a cooled mid-wavelength infra-red FPA. The system further comprises at least one temperature reference source or surface that is used to dynamically calibrate the two detector arrays and compensate for a temperature difference between the two detector arrays.

Abstract translation: 本文公开的各种实施例描述了分光孔径红外光谱成像（DAISI）系统，其适于用单次拍摄（也称为快照）获取场景的多个IR图像。 通常同时获得具有不同波长成分的多个获取图像。 该系统包括在空间上和光谱上彼此不同的至少两个光学通道。 所述至少两个光学通道中的每一个被配置为将入射在所述光学系统上的IR辐射传送到包括至少两个检测器阵列的光学FPA单元。 至少两个检测器阵列中的一个包括冷却的中波长红外FPA。 该系统还包括用于动态地校准两个检测器阵列并补偿两个检测器阵列之间的温度差的至少一个温度参考源或表面。

公开(公告)号：US20170016817A1

公开(公告)日：2017-01-19

申请号：US14799894

申请日：2015-07-15

Applicant: International Business Machines Corporation

Inventor： Tymon Barwicz ,  William M. Green ,  Yves C. Martin ,  Jason S. Orcutt ,  Lionel Tombez

IPC: G01N21/39 ,  G01N21/3504

CPC classification number: G01N21/39 ,  G01J3/0218 ,  G01J3/0256 ,  G01J3/42 ,  G01J2003/423 ,  G01N21/3504 ,  G01N21/552 ,  G01N2021/399 ,  G01N2201/06113 ,  G01N2201/063 ,  G01N2201/08 ,  G02B6/12004 ,  G02B6/12007 ,  G02B6/122 ,  G02B2006/12138 ,  G02B2006/1215

Abstract: A method of fabricating a gas sensor on a substrate and a gas sensor fabricated on a substrate that includes optical and electronic components are described. The method includes fabricating a laser to output light over a range of wavelengths within a waveguide, fabricating a splitter to split the light output by the laser to a reference waveguide and to a detection waveguide, fabricating a reference cell to house the reference waveguide and a reference gas. An output of the reference waveguide is coupled to a first optical detector and an output of the detection waveguide is coupled to a second optical detector to identify or quantify an ambient gas.

Abstract translation: 描述了在衬底上制造气体传感器的方法和制造在包括光学和电子部件的衬底上的气体传感器。 该方法包括制造激光器以在波导内的波长范围上输出光，制造分离器以将由激光器输出的光分成参考波导和检测波导，制造参考单元以容纳参考波导和 参考气体 参考波导的输出耦合到第一光学检测器，并且检测波导的输出耦合到第二光学检测器以识别或定量环境气体。

公开(公告)号：US20160356720A1

公开(公告)日：2016-12-08

申请号：US15119055

申请日：2015-02-28

Applicant: Imec VZW

Inventor： Pol VAN DORPE ,  Peter PEUMANS

IPC: G01N21/65 ,  A61B5/00 ,  A61B5/1455 ,  G01N33/49 ,  A61B5/145

CPC classification number: G01N21/65 ,  A61B5/0066 ,  A61B5/14532 ,  A61B5/1455 ,  A61B5/443 ,  A61B2562/0233 ,  A61B2562/0238 ,  G01J1/0204 ,  G01J1/0425 ,  G01J1/0477 ,  G01J3/0205 ,  G01J3/0208 ,  G01J3/021 ,  G01J3/0227 ,  G01J3/0256 ,  G01J3/0264 ,  G01J3/0291 ,  G01J3/1895 ,  G01J3/26 ,  G01J3/36 ,  G01J3/44 ,  G01J2003/1213 ,  G01N33/49 ,  G01N2201/06113 ,  G01N2201/0633 ,  G01N2201/0636 ,  G02B6/0026 ,  G02B6/0031 ,  G02B6/0038 ,  G02B6/0048

Abstract: The present disclosure relates to systems, methods, and sensors configured to characterize a radiation beam. At least one embodiment relates to an optical system. The optical system includes an optical radiation guiding system. The optical radiation guiding system includes a collimator configured to collimate the radiation beam into a collimated radiation beam. The optical radiation guiding system also includes a beam shaper configured to distribute power of the collimated radiation beam over a discrete number of line shaped fields. A spectrum of the collimated radiation beam entering the beam shaper is delivered to each of the discrete number of line shaped fields. The optical system further includes a spectrometer chip. The spectrometer chip is configured to process the spectrum of the collimated radiation beam in each of the discrete number of line shaped fields coming from the beam shaper.

Abstract translation: 本公开涉及被配置为表征辐射束的系统，方法和传感器。 至少一个实施例涉及光学系统。 光学系统包括光学辐射引导系统。 光辐射引导系统包括准直器，其被配置成将辐射束准直成准直的辐射束。 光学辐射引导系统还包括光束整形器，其被配置为分布在离散数量的线状场上的准直辐射束的功率。 进入光束整形器的准直辐射束的光谱被传送到离散数量的线状场中的每一个。 光学系统还包括光谱仪芯片。 光谱仪芯片被配置为处理来自光束整形器的离散数量的线状场中的每一个中的准直辐射束的光谱。

公开(公告)号：US20160327433A1

公开(公告)日：2016-11-10

申请号：US15110981

申请日：2014-09-08

Applicant: EMPIRE TECHNOLOGY DEVELOPMENT LLC

Inventor： Mordehai MARGALIT

IPC: G01J3/42 ,  G01J3/10 ,  G01J3/02 ,  G01N21/27

CPC classification number: G01J3/42 ,  G01J3/0224 ,  G01J3/0256 ,  G01J3/0264 ,  G01J3/10 ,  G01N21/27 ,  G01N2201/0612 ,  G01N2201/062 ,  G01N2201/0636 ,  G01N2201/0638 ,  G01N2201/0683

Abstract: Technologies are generally described for fabrication of a multi-component device, and employment thereof. The device may include a substrate, and a multitude of light sources and one or more photo detectors positioned on a surface of the substrate. The light sources may be configured to illuminate at least a portion of an object with light, and the photo detectors may be configured to detect reflected light from the object in response to the illumination. In some examples, the reflected light may be analyzed to determine a spectral profile of the object. The device may further include a structure applied to the substrate adjacent to the photo detectors, where the structure may be configured to reduce direct light transmission from the light sources to the photo detectors. The structure may include a deposited material, a protrusion, and/or a recession on the surface of the substrate, for example.

Abstract translation: 技术通常被描述为用于制造多组件装置，以及其使用。 该装置可以包括基板和多个光源以及位于基板的表面上的一个或多个光电检测器。 光源可以被配置为用光照亮物体的至少一部分，并且光电检测器可以被配置为响应于照明来检测来自物体的反射光。 在一些示例中，可以分析反射光以确定对象的光谱轮廓。 该装置还可以包括施加到与光电检测器相邻的衬底的结构，其中该结构可被配置为减少从光源到光电检测器的直接光透射。 该结构可以包括例如在基底表面上的沉积材料，突起和/或凹陷。

公开(公告)号：US09488524B2

公开(公告)日：2016-11-08

申请号：US14430658

申请日：2013-10-02

Applicant: NATIONAL UNIVERSITY CORPORATION KAGAWA UNIVERSITY

Inventor： Ichiro Ishimaru

IPC: G01J3/02 ,  G01J3/45 ,  G01J3/28 ,  G01J3/453 ,  G01N21/35

CPC classification number: G01J3/45 ,  G01J3/0208 ,  G01J3/0237 ,  G01J3/0256 ,  G01J3/0291 ,  G01J3/2803 ,  G01J3/4531 ,  G01J3/4532 ,  G01N2021/3595

Abstract: A spectroscopic measurement device includes: a dividing optical system for dividing a measurement beam emitted from each of a plurality of measurement points located within a measurement area of an object to be measured, into a first measurement beam and a second measurement beam; an imaging optical system; an optical path length difference providing means; a detector including a plurality of pixels; a processor for acquiring an interferogram of a measurement point of the object to be measured; a conjugate plane imaging optical system located between the object to be measured and the dividing optical system; and a periodicity providing means located on the conjugate plane.

Abstract translation: 光谱测量装置包括：分割光学系统，用于将位于待测物体的测量区域内的多个测量点中的每一个发射的测量光束分成第一测量光束和第二测量光束; 成像光学系统; 光路长度差提供装置; 检测器，包括多个像素; 用于获取待测量对象的测量点的干涉图的处理器; 位于待测物体与分光光学系统之间的共轭平面成像光学系统; 以及位于共轭平面上的周期性提供装置。

公开(公告)号：US20160313546A1

公开(公告)日：2016-10-27

申请号：US15136465

申请日：2016-04-22

Applicant: Martin Feldman

Inventor： Martin Feldman

IPC: G02B21/24 ,  G01N21/65 ,  G01J3/44 ,  G02B21/02

CPC classification number: G02B21/242 ,  G01J3/0208 ,  G01J3/0237 ,  G01J3/0256 ,  G01J3/0272 ,  G01J3/44 ,  G01N21/658 ,  G02B21/02

Abstract: According to some embodiments of the present invention, a fine focus microscope includes an objective lens for collecting light from an object being imaged, and a tube lens for forming a first image from light received from the objective lens. The fine focus microscope further includes a fine focus lens for forming a second image from the first image, and an eyepiece for forming a third image from the second image, wherein the third image is viewable by a user. The fine focus microscope further includes a field lens for directing light from the second image to the eyepiece, and a positioning system mechanically coupled to the fine focus lens, the eyepiece, and the field lens. The positioning system changes a position of the fine focus lens, the eyepiece, and the field lens with respect to the objective lens to provide a change in focus of the object being imaged.

Abstract translation: 根据本发明的一些实施例，精细对焦显微镜包括用于收集来自被成像物体的光的物镜和用于从物镜接收的光形成第一图像的管透镜。 精细对焦显微镜还包括用于从第一图像形成第二图像的精细聚焦透镜和用于从第二图像形成第三图像的目镜，其中第三图像可由用户观看。 精细对焦显微镜还包括用于将来自第二图像的光引导到目镜的场透镜，以及机械耦合到微调透镜，目镜和场透镜的定位系统。 定位系统相对于物镜改变微调透镜，目镜和场透镜的位置，以提供被成像物体的焦点变化。