Abstract:
Methods and systems are provided, which pattern an illumination of a metrology target with respect to spectral ranges and/or polarizations, illuminate a metrology target by the patterned illumination, and measure radiation scattered from the target by directing, at a pupil plane, selected pupil plane pixels from a to respective single detector(s) by applying a collection pattern to the pupil plane pixels. Single detector measurements (compressive sensing) has increased light sensitivity which is utilized to pattern the illumination and further enhance the information content of detected scattered radiation with respect to predefined metrology parameters.
Abstract:
The invention relates to angle-limiting optical reflectors and optical dispersive devices such as optical spectrum analyzers using the same. The reflector has two reflective surfaces arranged in a two-dimensional corner reflector configuration for reflecting incident light back with a shift, and includes two prisms having a gap therebetween that is tilted to reflect unwanted light and transmit wanted light. A two-pass optical spectrum analyzer utilizes the reflector to block unwanted multi-pass modes that may otherwise exist and degrade the wavelength selectivity of the device.
Abstract:
A multi-wavelength optical imaging system and method. In one example, an optical imaging system includes an integrated dewar assembly housing a staring detector that includes a plurality of focal plane array sensors spatially distributed over a common focal plane and aligned relative to one another, each of the plurality of focal plane array sensors being configured for a different waveband. The optical imaging system further includes foreoptics, such as a telescope, optically coupled to the integrated dewar assembly and configured to direct and focus light from an entrance pupil of the optical imaging system into an optical beam incident on at least one of the plurality of focal plane array sensors.
Abstract:
Embodiments of the invention are directed to integrated resonance detectors and arrays of integrated resonance detectors and to methods for making and using the integrated resonance detectors and arrays. Integrated resonance detectors comprise a substrate, a conducting mirror layer, an active layer, and a patterned conducting layer. Electromagnetic radiation is detected by transducing a specific resonance-induced field enhancement in the active layer to a detection current that is proportional to the incident irradiance.
Abstract:
A tunable spectrometer is described. A tunable spectrometer may include an optical filter, having a first reflector stack and a second reflector stack separated by a half-wave spacer, a heater, a heat-sink and a detector array. At least one of the first reflector stack, the second reflector stack, and the half-wave spacer is made from a thermo-optic material. The heater and the heat sink are separately in contact with at least one of the first reflector stack, the second reflector stack, and the half-wave spacer. The detector array is configured to collect an output from the optical filter. In various embodiments, the heat and the heat sink may be separated by an optically transparent thermal isolator.
Abstract:
A hyperspectral imaging system having an optical path. The system including an illumination source adapted to output a light beam, the light beam illuminating a target, a dispersing element arranged in the optical path and adapted to separate the light beam into a plurality of wavelengths, a digital micromirror array adapted to tune the plurality of wavelengths into a spectrum, an optical device having a detector and adapted to collect the spectrum reflected from the target and arranged in the optical path and a processor operatively connected to and adapted to control at least one of: the illumination source; the dispersing element; the digital micromirror array; the optical device; and, the detector, the processor further adapted to output a hyperspectral image of the target. The dispersing element is arranged between the illumination source and the digital micromirror array, the digital micromirror array is arranged to transmit the spectrum to the target and the optical device is arranged in the optical path after the target.
Abstract:
A spectrometer (100) for analyzing the spectrum of an upstream light beam (1), includes an entrance slit (101) and collimating elements (110) suitable for generating, from the upstream light beam, a collimated light beam (10), characterized in that it also includes: a polarization-dependent diffraction grating (120) suitable for diffracting, at each wavelength (11, 12) of the spectrum of the upstream light beam, the collimated light beam into a first diffracted light beam (11, 12) and a second diffracted light beam (21, 22); optical recombining elements (130) including a planar optical reflecting surface (130) perpendicular to the grating and suitable for deviating at least the second diffracted light beam; and focussing elements (140) suitable for focussing, at each wavelength, the first diffracted light beam and the second diffracted light beam onto one and the same focussing area (141).
Abstract:
An interrogation device for detecting luminescent light produced by analytes in a sample excited by multiple excitation light beams each having individual spectral contents, comprising a plurality of light sources each generating an excitation light beam; at least one detector for detecting the luminescent light produced by the sample; and an optical assembly defining distinct and fixed excitation light paths for each of the excitation light beams from the light sources to a common excitation site on the sample and defining a shared luminescence light path for the luminescent light from the excitation site on sample to the at least one detector, the excitation light paths and the luminescence light path being on a same side of the sample, the optical assembly including sample-side optics projecting the excitation light towards the sample and collecting luminescent light from the sample.
Abstract:
A spark optical emission spectrometer comprising: a spark source for causing spark induced emission of light from a sample; a single entrance slit; a toroidal mirror for directing the light through the single entrance slit; a plurality of diffraction gratings for diffracting light that has been directed through the entrance slit by the mirror, whereby the plurality of diffraction gratings are simultaneously illuminated; and at least one array detector for detecting the diffracted light from the plurality of diffraction gratings, wherein the minor is for directing the light through the entrance slit such that light from different regions in the spark source is spatially separated in an image of the light at the gratings whereby a first diffraction grating is preferentially illuminated with light from a first region of the spark source and simultaneously a second diffraction grating is preferentially illuminated with light from a second region of the spark source.
Abstract:
A sensor apparatus for measuring characteristics of optical radiation has a substrate and a low profile spectrally selective detection system located within the substrate at one or more spatially separated locations. The spectrally selective detection system includes a generally laminar array of wavelength selectors optically coupled to a corresponding array of optical detectors. It is emphasized that this abstract is provided to comply with the rules requiring an abstract that will allow a searcher or other reader to quickly ascertain the subject matter of the technical disclosure. It is submitted with the understanding that it will not be used to interpret or limit the scope or meaning of the claims.