公开(公告)号：US09952159B2

公开(公告)日：2018-04-24

申请号：US15235170

申请日：2016-08-12

Applicant: Sean Xiaolu Wang ,  Qun Li

Inventor： Sean Xiaolu Wang ,  Qun Li

IPC: G01J3/30 ,  G01N21/71 ,  G01J3/10 ,  G01J3/28 ,  G01J3/443 ,  G01J3/02

CPC classification number: G01N21/718 ,  G01J3/0208 ,  G01J3/10 ,  G01J3/28 ,  G01J3/2803 ,  G01J3/443 ,  G01N2201/0612 ,  G01N2201/129

Abstract: This invention discloses a laser induced breakdown spectroscopy (LIBS) apparatus based on high repetition rate pulsed laser. The laser produces a train of laser pulses at a high repetition rate in the kHz (or even higher) range. When the laser beam hits the biological sample, it generates several thousands of micro-plasmas per second. Synchronized miniature CCD array optical spectrometer modules collect the LIBS signal from these micro-plasmas. By adjusting the integration time of the spectrometer to cover a plurality of periods of the laser pulse train, the spectrometer integrates the LIBS signal produced by this plurality of laser pulses. Hence the intensity of the obtained LIBS spectrum can be greatly improved to increase the signal-to-noise ratio (SNR) and lower the level of detection (LOD).

公开(公告)号：US09874475B2

公开(公告)日：2018-01-23

申请号：US14795954

申请日：2015-07-10

Applicant: SciAps, Inc.

Inventor： David Day

IPC: G01J3/02 ,  G01J3/443 ,  G01J3/06 ,  H01L21/66 ,  G01J3/44

CPC classification number: G01J3/443 ,  G01J3/0208 ,  G01J3/0237 ,  G01J3/0272 ,  G01J3/06 ,  G01J3/44 ,  H01L22/26

Abstract: An analysis system (e.g., LIBS) includes a laser source generating a laser beam, a movable optic configured to move said laser beam to multiple locations on a sample, and a spectrometer responsive to photons emitted by the sample at those locations and having an output. A controller is responsive to a trigger signal and is configured in a moving spot cycle to adjust the moveable optic, activate the laser source sequentially generating photons at multiple locations on the sample, and process the spectrometer output at each location.

公开(公告)号：US09847217B2

公开(公告)日：2017-12-19

申请号：US14551039

申请日：2014-11-23

Applicant: PerkinElmer Health Sciences, Inc.

Inventor： Peter Morrisroe

IPC: G01J3/30 ,  H01J49/10 ,  F23C99/00 ,  F23G5/10 ,  G01J3/443 ,  H01J49/04 ,  G01N21/68

CPC classification number: H01J49/105 ,  F23C99/003 ,  F23G5/10 ,  F23G2209/18 ,  G01J3/443 ,  G01N21/68 ,  H01J49/0431

Abstract: A device for mass spectroscopy comprising a chamber configured to provide an atomization source, a boost device configured to provide radio frequency energy to the chamber, and a mass analyzer in fluid communication with the chamber and configured to separate species based on mass-to-charge ratios is disclosed. In certain examples, a boost device may be used with a flame or plasma to provide additional energy to a flame or plasma to enhance desolvation, atomization, and/or ionization.

公开(公告)号：US20170343416A1

公开(公告)日：2017-11-30

申请号：US15607829

申请日：2017-05-30

Applicant: Oxford Instruments Industrial Products Ltd.

Inventor： Jukka HASSI

IPC: G01J3/443 ,  G01J3/02 ,  G01N21/71

CPC classification number: G01J3/443 ,  G01J3/0208 ,  G01J3/0237 ,  G01J3/0272 ,  G01N21/359 ,  G01N21/65 ,  G01N21/718 ,  G01N2201/0221

Abstract: According to an example embodiment, a detector assembly for use in analysis of elemental composition of a sample by using optical emission spectroscopy is provided, the detector assembly including a rotatable element that is rotatable about an axis and that has attached thereto a laser source for generating laser pulses for invoking optical emission on a surface of the sample, the laser source arranged to generate laser pulses focused at a predefined distance from said axis at a predefined distance from a front end of the detector assembly, and a detector element for capturing optical emission invoked by said laser pulses.

公开(公告)号：US09766182B2

公开(公告)日：2017-09-19

申请号：US14708638

申请日：2015-05-11

Applicant: Xin Jack Zhou ,  Sean Xiaolu Wang ,  Qun Li

Inventor： Xin Jack Zhou ,  Sean Xiaolu Wang ,  Qun Li

IPC: G01J3/30 ,  G01N21/71 ,  G01J3/443

CPC classification number: G01N21/718 ,  G01J3/443

Abstract: This invention discloses a compact laser induced breakdown spectroscopy (LIBS) apparatus suitable for field operations. The LIBS apparatus comprises a Q-switched laser with laser pulse energy between several tens and several thousands of micro joules (μJ), which is significantly lower than that of traditional LIBS lasers. The spectrograph of the LIBS apparatus employs a dual CCD (charge coupled device) design, which maintains compact size and in the meantime offers large spectral coverage and high spectral resolution.

公开(公告)号：US20170205354A1

公开(公告)日：2017-07-20

申请号：US15321143

申请日：2015-06-19

Applicant: TSI, INCORPORATED

Inventor： Steven G. BUCKLEY ,  Darrick L. NICCUM

IPC: G01N21/71 ,  B07C5/342 ,  B07C5/36 ,  G01J3/443

CPC classification number: G01N21/718 ,  B07C5/3425 ,  B07C5/365 ,  B07C2501/0018 ,  B07C2501/0036 ,  G01J3/443

Abstract: A LIBS measurement system is described herein that provides an orifice, aperture or opening in a substantially V-shaped chute or sleeve that allows access to the material to be analyzed from the underside of the chute. The laser beam is aimed through the hole and return light (signal) is collected through the hole by a photodetector assembly. A diverter device, which is located at an output end of the chute, diverts certain particles away from the chute upon receipt of an actuation signal.

公开(公告)号：US20170199131A1

公开(公告)日：2017-07-13

申请号：US15314346

申请日：2015-05-27

Applicant: Japan Science and Technology Agency

Inventor： Hiroyuki Yoshida

IPC: G01N21/71 ,  G01J3/02 ,  H01J37/244 ,  G01J3/443

CPC classification number: G01N21/71 ,  G01J3/0208 ,  G01J3/443 ,  G01N21/62 ,  G01N23/2254 ,  G01N2201/0638 ,  G01N2201/068 ,  G01N2223/6116 ,  H01J3/02 ,  H01J3/18 ,  H01J37/244 ,  H01J37/252 ,  H01J2237/06308 ,  H01J2237/06375 ,  H01J2237/2445

Abstract: An inverse photoemission spectroscopy apparatus is configured to detect a light generated by the relaxation of electrons to an unoccupied state of a sample. The apparatus includes an electron source for generating electrons with which a sample is irradiated, a wavelength selector for extracting a light having a certain wavelength from the light generated in the sample, a photodetector for detecting the light extracted by the wavelength selector; and a focusing optics disposed between the sample and the photodetector. The electron source contains yttrium oxide as a thermionic emission material.

公开(公告)号：US09677934B2

公开(公告)日：2017-06-13

申请号：US14470875

申请日：2014-08-27

Applicant: Thermo Electron Manufacturing Limited

Inventor： Stephen Hartwell ,  Nigel Cooper Bailey

IPC: G01J3/36 ,  G01J3/02 ,  G01J3/443 ,  G01J3/28

CPC classification number: G01J3/0297 ,  G01J3/28 ,  G01J3/443

Abstract: A method for deriving a background-corrected portion of a measured optical emission spectrum comprising the steps of identifying two or more background correction points from the portion of the measured emission spectrum; deriving a background correction function fitted to the identified background correction points, and applying the background correction function to the portion of the measured emission spectrum so as to produce a background-corrected portion of the emission spectrum, wherein the background correction points are identified from the measured data points by consideration of the gradients between the measured data points.

公开(公告)号：US09664564B2

公开(公告)日：2017-05-30

申请号：US14381742

申请日：2013-02-26

Applicant: KYOTO UNIVERSITY

Inventor： Hiroyuki Yoshida

IPC: G01J3/30 ,  G01J3/443 ,  G01N23/225 ,  G01N21/66 ,  H01J37/06

CPC classification number: G01J3/30 ,  G01J3/443 ,  G01N21/66 ,  G01N23/2251 ,  G01N2223/08 ,  H01J37/06

Abstract: Intensity of near-ultraviolet light or visible light of 180 to 700 nm emitted from a solid sample, such as an organic semiconductor, irradiated with an electron beam is measured, while kinetic energy (accelerating energy) of the electron beam is changed in a range of 0 to 5 eV so as to obtain a spectrum. Peaks are detected from the spectrum, and the energy thereof is defined as unoccupied-states energy of the sample. The onset energy of the first peak represents electronic affinity energy (electron affinity) of the sample. Since the energy of the electron beam irradiated onto the sample is 5 eV or less, almost no damage is exerted on the sample even when the sample is an organic semiconductor.

公开(公告)号：US09606065B2

公开(公告)日：2017-03-28

申请号：US14104888

申请日：2013-12-12

Applicant: GWANGJU INSTITUTE OF SCIENCE AND TECHNOLOGY

Inventor： Sungho Jeong ,  Jeonghwan In ,  Chan Kyu Kim ,  Seokhee Lee

IPC: G01N21/71 ,  G01J3/443 ,  G01J3/28

CPC classification number: G01N21/718 ,  G01J3/28 ,  G01J3/443

Abstract: Disclosed herein is a quantitative analysis method for measuring a target element in a specimen using laser-induced plasma spectrum. More particularly, the present invention relates to a method for analyzing a composition ratio of a target element by calculating peak intensities when peaks overlap each other in a spectrum, and a method for selecting a peak of a wavelength at which the highest precision and reproducibility are secured through linearity of a correlation plot of the peak intensities and a value by dividing a standard deviation value of calibration curve data (peak intensity ratios) by a slope when an internal standard method is used for quantitative analysis of a target element.