신규의 텅스텐 실릴아미드 화합물, 이의 제조방법 및 이를 이용하여 박막을 형성하는 방법
    111.
    发明授权
    신규의 텅스텐 실릴아미드 화합물, 이의 제조방법 및 이를 이용하여 박막을 형성하는 방법 有权
    新型钨酸钠化合物,其制备方法和使用该薄膜形成薄膜的方法

    公开(公告)号:KR101306812B1

    公开(公告)日:2013-09-10

    申请号:KR1020120049233

    申请日:2012-05-09

    CPC classification number: C07F19/00 C07F7/10 C07F11/005 C23C16/18 C23C16/45553

    Abstract: PURPOSE: A novel tungsten silylamide compound is provided to have thermal stability and high volatility, thereby easily manufacturing a thin film containing high quality tungsten. CONSTITUTION: A tungsten compound is denoted by chemical formula 1. A method for preparing the tungsten compound of chemical formula 1 comprises the step of reacting a compound of chemical formula 2 and a compound of chemical formula 3. A thin film containing tungsten is grown by chemical vapor deposition (CVD) or atomic layer deposition (ALD) using the tungsten compound.

    Abstract translation: 目的:提供新的钨甲硅烷基化合物以具有热稳定性和高挥发性,从而容易地制造含有高质量钨的薄膜。 构成:化学式1表示钨化合物。化学式1的钨化合物的制备方法包括使化学式2的化合物与化学式3的化合物反应的工序。含有钨的薄膜通过 化学气相沉积(CVD)或原子层沉积(ALD)。

    아연주석산화물 박막의 제조방법
    112.
    发明公开
    아연주석산화물 박막의 제조방법 有权
    氧化锌薄膜的制备

    公开(公告)号:KR1020130091615A

    公开(公告)日:2013-08-19

    申请号:KR1020120013032

    申请日:2012-02-08

    Abstract: PURPOSE: A method for manufacturing a zinc tin oxide thin film is provided to form various zinc tin oxide thin films by controlling compositions. CONSTITUTION: A substrate is introduced into a deposition chamber. A zinc tin oxide thin film is manufactured by supplying tin, oxygen, and zinc. The zinc tin oxide thin film is manufactured by a chemical vapor deposition method or an atomic layer deposition method. The tin, the oxygen, and the zinc are supplied at the same time in the chemical vapor deposition method. The tin, the oxygen, and the zinc are alternatively supplied in the atomic layer deposition method.

    Abstract translation: 目的:提供一种制造锌锡氧化物薄膜的方法,通过控制组合物形成各种氧化锌锡薄膜。 构成:将衬底引入沉积室。 通过供给锡,氧和锌来制造氧化锌锡薄膜。 氧化锌锡薄膜通过化学气相沉积法或原子层沉积法制造。 同时在化学气相沉积法中提供锡,氧和锌。 锡,氧和锌交替地以原子层沉积方法提供。

    단결정 성장용 압력용기
    114.
    发明公开
    단결정 성장용 압력용기 有权
    用于生长单晶的压力容器

    公开(公告)号:KR1020120140279A

    公开(公告)日:2012-12-31

    申请号:KR1020110059903

    申请日:2011-06-21

    CPC classification number: Y02P20/544 C30B7/10 B01J3/04

    Abstract: PURPOSE: A pressure vessel for growing a single crystal is provided to easily replace a liner by including a constant taper part in the inner wall of an external vessel and an outer wall of an inner liner. CONSTITUTION: A pressure vessel body(120) is made of heat resistant alloy. A liner(110) is made of corrosion resistant materials and is inserted into the pressure vessel body. A lower support stand(130) passes through the lower side of the pressure vessel body and supports the lower side of the liner. A liner is separated from the pressure vessel body by upwardly pushing and raising the lower support stand.

    Abstract translation: 目的:提供用于生长单晶的压力容器,以通过在外部容器的内壁和内衬的外壁中包括恒定的锥形部分来容易地更换衬里。 构成:压力容器本体(120)由耐热合金制成。 衬套(110)由耐腐蚀材料制成,并被插入到压力容器本体中。 下支撑支架(130)穿过压力容器主体的下侧并支撑衬套的下侧。 通过向上推动下支撑架将衬套与压力容器本体分开。

    에너지 고 효율이 가능한 ReRAM의 제조 방법

    公开(公告)号:KR102226767B1

    公开(公告)日:2021-03-11

    申请号:KR1020190017882

    申请日:2019-02-15

    Abstract: 본발명은에너지고 효율이가능한 ReRAM의제조방법을공개한다. 이방법은기판상에증착된하부전극층의상부에가변저항막이증착되는단계; 및상기가변저항막상부에상부전극층이증착되는단계; 를포함하고, 상기상부전극층과상기가변저항막의인터페이스근처에서산소부족층이형성되어, 고저항상태를수반하지않고복수개의저 저항상태사이에서저항이전환됨에따라 ReRAM 동작중 소거동작이제거되는것을특징으로한다. 본발명에의할경우, 종래의반복적인증분단계펄스프로그래밍 / 오류검사및 교정알고리즘이멀티비트저항스위칭동작동안시간소모적인문제점을극복하고, 높은신뢰성과에너지고 효율적인저항스위칭동작을달성할수 있는에너지고 효율적인멀티비트저항스위칭동작이가능하게된다.

    신규한 인듐 전구체, 이의 제조 방법 및 이를 이용한 박막
    120.
    发明公开
    신규한 인듐 전구체, 이의 제조 방법 및 이를 이용한 박막 有权
    新型染料衍生物,其制备方法和使用其的薄膜

    公开(公告)号:KR1020160010992A

    公开(公告)日:2016-01-29

    申请号:KR1020140091846

    申请日:2014-07-21

    CPC classification number: C07F5/00 C23C16/305 C23C16/407

    Abstract: 본발명은신규한인듐전구체, 이의제조방법및 이를이용한박막에관한것으로, 열적안정성및 휘발성이우수하고, 다루기용이한인듐 3가의신규한인듐전구체및 이의제조방법, 그리고이를이용한고순도의인듐함유박막에관한것이다.

    Abstract translation: 本发明涉及一种新颖的铟前体及其制备方法和使用该铟前体的薄膜,更具体地说,涉及一种具有优异的热稳定性和挥发性,易于处理的新颖的三价铟铟前体, 其制造方法,以及使用该薄膜的含有高纯度的铟的薄膜。 铟前体由化学式1表示。

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