Abstract:
The invention relates to a measuring instrument and a measuring method for chip card-shaped biosensors (1), and methods for the production thereof. The biosensor (1) is provided with a semiconductor chip (2) having a bioactive structure (3) and contact areas (4). The biosensor (1) is covered by a rewiring substrate (6) which protrudes from the semiconductor chip (2) such that outer contact surfaces of the rewiring substrate (6) are freely accessible. Both the biosensor (1) and the measuring instrument that is adapted thereto are designed as disposable products.
Abstract:
The invention relates to an electronic component, in which a semiconductor chip (3) is arranged, with a plastic housing (2) and method for production thereof. The lower side (6) of the plastic housing (2) comprises external contacts (7). The external contacts (7) are connected to contact surfaces (11) on the active upper side (12) of the semiconductor chip (3) by means of contact pegs (8) on the semiconductor chip (3) and by interconnecting lines (10) arranged on the plastic housing body (9). The contact pegs (8) thus represent an electrically-conducting projection of the contact surfaces (11).
Abstract:
Das Verfahren umfasst das Bereitstellen eines Halbleiter-Die, wobei der Halbleiter-Die eine erste Hauptfläche und eine zweite Hauptfläche gegenüber der ersten Hauptfläche und mindestens ein elektrisches Kontaktelement auf der ersten Hauptfläche umfasst, das Aufbringen einer Isolierschicht auf der zweiten Hauptfläche des Halbleiter-Die, das Aufbringen einer Interconnect-Lotschicht auf der Isolierschicht und das Anbringen des Halbleiter-Die mit der Interconnect-Lotschicht an einem Träger.
Abstract:
An electronic component with a plastic package and to a method for its production, includes a semiconductor chip. An underside of the plastic package has external contacts. The external contacts are connected to contact areas on an active upper side of the semiconductor chip by contact pillars of the semiconductor chip and wiring lines arranged on the plastic package molding compound. In this case, the contact pillars represent an electrically conducting elevation of the contact areas.
Abstract:
Semiconductor component comprises a wiring substrate (2) with bond surfaces (5) and a chip on an island where there is a metal layer structure (15) comprises a copper base layer (10) facing the wiring substrate and a noble metal cover layer (12) facing the chip with an intermediate layer (11) of nickel or nickel alloy. The intermediate layer facing the cover layer has a surface roughness of 0.1-3 mu m : An independent claim is also included for a production process for the above.
Abstract:
A semiconductor component with solder balls (2), plastic housing and a lower wiring substrate (4) of a base semiconductor component (5) comprises a central upper region of the wiring having a spatially limited plastic mass (3) and with solder balls on the upper side of the lower wiring substrate in edge regions (11) surrounded by a film template (15) having openings (16) in which the solder balls are arranged in a spatially limited manner. Independent claims are also included for production processes for the above.
Abstract:
An electronic semiconductor module component with a semiconductor stack includes semiconductor components arranged in a vertically stacked relationship. A basic semiconductor component includes a lower interposing unit, on which lower external contact pads are arranged. The basic semiconductor component further includes an upper interposing unit, on which upper external contact pads are arranged. The two interposing units are electrically connected to one another via bonding connections disposed at their edge areas. The basic semiconductor component is a compact component on which different, customer-specific semiconductor components can be stacked.
Abstract:
Electronic component comprises a semiconductor chip (3) having chip contacts (4) on its contact surfaces. The chip contacts are mechanically fixed on contact connecting surfaces (5) of a rewiring structure (6) and electrically connected to the rewiring structure. The rewiring structure is formed as a region of a structured metal plate or structured metal layer of a metal-laminated base plate. Independent claims are also included for the following: (1) Process for the production of an electronic component; and (2) Panel for the electronic component having a shape-stable plastic plate.
Abstract:
Herstellungsverfahren für ein elektronisches Bauelement, mit den Schritten: – Bereitstellen eines Opfersubstrates (20), – Verankern eines Halbleiterelementes auf dem Opfersubstrat, – Kontaktieren des Halbleiterelementes mit dem Opfersubstrat mit einem Ausbilden von Kontaktierungspunkten (30) auf dem Opfersubstrat, – Ausbilden einer Verkapselung (40) auf der mit dem Halbleiterelement bestückten Oberseite des Opfersubstrates, – Abtragen des Opfersubstrates mit einer Freilegung der Kontaktierungspunkte auf der Unterseite der Verkapselung, wobei als Opfersubstrat (20) ein auf der Oberseite metallisiertes ätz- und ablösbares Papier verwendet wird und das Abtragen des Opfersubstrats mittels eines kombinierten Ätz- und Abweichprozesses erfolgt.