Abstract:
PROBLEM TO BE SOLVED: To provide a forming method which is self-adjustable and forms a structure width especially of ≤2 μm technically and simply in the forming method for at least one mesa structure or ridge structure, or at least one region electrically pumped in a layer or in a layer sequence. SOLUTION: A mesa size or a ridge size is decided by structuring by mounting a mask layer on a sacrificial layer attached on the layer or on the layer sequence. The mesa structure or the ridge structure is formed in the layer or in the layer sequence by partially removing the sacrificial layer and the layer or the layer sequence. A sacrificial layer whose width is narrower compared with a layer remained on the sacrificial layer is left by selectively remove a part of the sacrificial layer from a side face of the exposed sacrificial layer. A coating is attached to an edge portion of the formed structure. The sacrificial layer is removed by fully coating the side face of the residual sacrificial layer by a coating material. Layers remained on the sacrificial layer are peeled off. COPYRIGHT: (C)2005,JPO&NCIPI
Abstract:
PROBLEM TO BE SOLVED: To provide a method of manufacturing an optical semiconductor device capable of improving quantum efficiency. SOLUTION: An indium content of at least one well layer is increased in a step of growing the well layer. In the optical semiconductor device, the well layer has a first composition based on a nitride semiconductor material with first electron energy, and a barrier layer has a second composition based on the nitride semiconductor material with second electron energy higher than the first electron energy. A beam activated quantum well layer is grown on the barrier layer. Non-radiative well layers and the barrier layers form a superlattice for the beam activated quantum well layer. The layer thickness of the beam activated quantum well layer is larger than the layer thickness of the well layer of the superlattice. COPYRIGHT: (C)2011,JPO&INPIT
Abstract:
PROBLEM TO BE SOLVED: To provide an optoelectronic device having lateral distribution for uniform current density and high ESD stability. SOLUTION: In this optoelectronic device, a first current diffusion layer and a second current diffusion layer, which interface with the semiconductor layer of a semiconductor layer array, are positioned between the semiconductor layer array and its connection contacts; the first current diffused layer has layer resistance larger than the second one and forms an ohmic contact with an adjacent semiconductor layer; and the second current diffused layer is positioned at a partial domain with a side clearance of the first current diffused layer. COPYRIGHT: (C)2006,JPO&NCIPI
Abstract:
The invention relates to an optoelectronic semiconductor body having an epitaxial semiconductor layer sequence based on nitride compound semiconductors. The semiconductor layer sequence comprises a buffer layer that is nominally undoped or doped in an at least partially n-conductive manner, an active zone suitable for emitting or receiving electromagnetic radiation, and a contact layer disposed between the buffer layer and the active zone that is doped in an n-conductive manner. The concentration of n-doping medium is greater in the contact layer than in the buffer layer. The semiconductor layer sequence comprises a recess extending through the buffer layer in which an electrical contact material is disposed, said recess adjoining the contact layer. The invention further relates to a method suitable for producing such a semiconductor body.
Abstract:
The invention relates to a thin-film LED comprising an active layer (7) consisting of a nitride compound semiconductor that emits electromagnetic radiation (19) in a main radiation direction (15), a current-dispersing layer (9) succeeding the active layer (7) in the main radiation direction and consisting of a first nitride compound semiconductor material, a main surface (14) through which the radiation emitted in the main radiation direction (15) is decoupled, and a first contact layer (11, 12, 13) located on the main surface (14). According to the invention, the transversal conductivity of the current-dispersing layer (9) is increased by the formation of a two-dimensional electron or hole gas. The two-dimensional electron or hole gas is advantageously formed by embedding at least one layer (10) consisting of a second nitride compound semiconductor material in the current-dispersing layer (9).
Abstract:
Disclosed is an optoelectronic semiconductor chip comprising a first contact point (1) and a second contact point (2) as well as a reflective layer (3) which is directly connected in an electrically conducting manner to the second contact point. The reflective layer contains a metal that tends to migrate. Furthermore, the reflective layer is arranged such that a migration path (4) for the metal can form between the second and the first contact point. The semiconductor chip further comprises a means (6) which generates an electric field counteracting the migration of the metal during operation of the semiconductor chip.
Abstract:
A light-emitting diode chip (1) with a semiconductor layer sequence (2) is described, which is contacted electrically by contacts (5) via a current spreading layer (3). The contacts (5) cover around 1%-8% of the surface of the semiconductor layer sequence (2). The contacts (5) consist for example of separate contact points (51), which are arranged at the nodes of a regular grid (52) with a grid constant of 12 mum. The current spreading layer (3) contains for example indium-tin oxide, indium-zinc oxide or zinc oxide and has a thickness in the range from 15 nm to 60 nm.
Abstract:
A thin-film LED comprising a barrier layer (3), a first mirror layer (2) succeeding the barrier layer (3), a layer stack (5) succeeding the first mirror layer (2), and at least one contact structure (6) succeeding the layer stack (5). The layer stack (5) has at least one active layer (5a) which emits electromagnetic radiation. The contact structure (6) is arranged on a radiation exit area (4) and has a contact area (7). The first mirror layer (2) has, in a region lying opposite the contact area of the contact structure (6), a cutout which is larger than the contact area (7) of the contact structure (6). The efficiency of the thin-film LED is increased as a result.
Abstract:
Process for preparation of a mesa- or bridge structure in a layer or layer series (LLS) in which their sides are coated by the steps: (a) application of a sacrificial layer (SL) to the LLS; (b) application and structuring of a mask layer onto the SL; (c) partial removal of the SP and the LLS, especially by anisotropic etching; (d) selective removal of part of the SL layer from the sides; (e) application of a coating to the sides of the structures obtained. An independent claim is included for a process for preparation of a Ridge-Waveguide-Laser diode chip.