中科微点-全球专利检索

  1. Login
  2. Sign Up

Search Results

278 records (took 0.022 seconds)

    MODULAR IMAGING SPECTROMETER ASSEMBLY AND METHOD
    103.
    发明申请
    MODULAR IMAGING SPECTROMETER ASSEMBLY AND METHOD 审中-公开

    公开(公告)号：US20180292258A1

    公开(公告)日：2018-10-11

    申请号：US15481834

    申请日：2017-04-07

    Applicant: RAYTHEON COMPANY

    Inventor： Susan B. Spencer ,  Lacy G. Cook ,  Andrew L. Bullard ,  John F. Silny

    IPC: G01J3/02

    CPC classification number: G01J3/0202 ,  G01J3/0208 ,  G01J3/021 ,  G01J3/0235 ,  G01J3/0291 ,  G01J3/0294 ,  G01J3/18 ,  G01J3/2823 ,  G01J2003/045

    Abstract: Aspects and embodiments are generally directed to modular imaging spectrometer assemblies and methods of operation thereof. In one example, a modular imaging spectrometer assembly includes foreoptics to receive electromagnetic radiation and produce a real exit pupil, the foreoptics having a first f-number, a first imaging spectrometer to receive and disperse the electromagnetic radiation into a first plurality of spectral bands at a first image plane, the first imaging spectrometer having a second f-number independent of the first f-number, a second imaging spectrometer separated from the first imaging spectrometer, the second imaging spectrometer to receive and disperse the electromagnetic radiation into a second plurality of spectral bands, the second imaging spectrometer having a third f-number independent of the first f-number, and at least one slit aperture positioned to receive the electromagnetic radiation from the real exit pupil and direct the electromagnetic radiation to the first and second imaging spectrometers.

    Spectroscopic camera
    108.
    发明授权
    Spectroscopic camera 有权

    公开(公告)号：US09766125B2

    公开(公告)日：2017-09-19

    申请号：US14185473

    申请日：2014-02-20

    Applicant: SEIKO EPSON CORPORATION

    Inventor： Tsugio Gomi

    IPC: G01J3/28 ,  G01J3/51 ,  G01J3/02 ,  G01J3/26

    CPC classification number: G01J3/2823 ,  G01J3/0208 ,  G01J3/0232 ,  G01J3/0235 ,  G01J3/027 ,  G01J3/0286 ,  G01J3/0291 ,  G01J3/26 ,  G01J3/513

    Abstract: A spectrometry apparatus includes a light incident section on which incident light from an image pickup target is made incident, an image pickup section provided on an optical path of the incident light input from the light incident section, a variable wavelength interference filter configured to transmit light having a predetermined wavelength from the incident light input from the light incident section and capable of changing the wavelength of the light to be transmitted, and a filter-position switching section configured to advance and retract the variable wavelength interference filter to and from an optical path of the incident light.

    Filter wheel spectrometer
    110.
    发明授权
    Filter wheel spectrometer 有权
    过滤轮光谱仪

    公开(公告)号：US08937720B2

    公开(公告)日：2015-01-20

    申请号：US13916683

    申请日：2013-06-13

    Applicant: Koninklijke Philips N.V.

    Inventor： James Torrance Russell

    IPC: G01N21/25 ,  G01J3/02 ,  G01J3/36 ,  G01J3/12 ,  G01N21/35 ,  G01N21/31

    CPC classification number: G01N21/255 ,  G01J3/02 ,  G01J3/0202 ,  G01J3/0235 ,  G01J3/36 ,  G01J2003/1213 ,  G01J2003/1226 ,  G01N21/3504 ,  G01N2021/317

    Abstract: A filter wheel and a spectrometer including the filter wheel are disclosed. The filter wheel has a first support structure on which a first plurality of filters are mounted and a second support structure on which at least one filter is provided. A radiation source generates a radiation beam, and a beam splitter splits the radiation beam into a first detection path and a second detection path. The first plurality of filters are selectively movable into the first detection path. The at least one filter on the second support structure is arranged to be disposed in the second detection path. The spectrometer includes a first radiation detector that detects radiation that passes through the selected filter in the first detection path, and a second radiation detector that detects radiation passing through the filter in the second detection path.

    Abstract translation: 公开了一种滤光轮和包括滤光轮的光谱仪。 滤光轮具有第一支撑结构，第一多个滤光器安装在该第一支撑结构上，第二支撑结构设置有至少一个滤光片。 辐射源产生辐射束，并且分束器将辐射束分裂成第一检测路径和第二检测路径。 第一多个滤波器可选择性地移动到第一检测路径中。 第二支撑结构上的至少一个过滤器布置成设置在第二检测路径中。 光谱仪包括：第一辐射检测器，其检测穿过第一检测路径中的所选滤波器的辐射;以及第二辐射检测器，其检测通过第二检测路径中的滤波器的辐射。

Patent Agency Ranking