公开(公告)号：US20180275053A1

公开(公告)日：2018-09-27

申请号：US15542447

申请日：2015-01-26

Applicant: Hitachi High-Technologies Corporation

Inventor： Takayuki OBARA ,  Muneo MAESHIMA ,  Kazumichi IMAI ,  Yohei HANAZAKI

IPC: G01N21/552 ,  G01N1/38

CPC classification number: G01N21/553 ,  G01N1/38 ,  G01N2201/0638 ,  G01N2201/08

Abstract: This optical analyzing device is provided with a light source, a detector, a substrate having a metal film on at least one surface thereof, and an optical element for introducing a light beam from the light source to the substrate and delivering the light beam from the substrate toward the detector. A plurality of sample regions for holding samples are provided on the metal film; and a portion of the light beam from the light source is irradiated to any one of the sample regions, is reflected, at least once, by the surface of the substrate on the opposite side of the side on which the sample regions are provided, and is not irradiated to a sample region other than the aforementioned sample region in the path thereof until the portion of the light beam is delivered by the optical element.

公开(公告)号：US09989460B2

公开(公告)日：2018-06-05

申请号：US15022071

申请日：2014-07-25

Applicant: SCHAEFFLER TECHNOLOGIES AG & CO. KG ,  AEMTEC GMBH

Inventor： Ingolf Schlosser ,  Martin Kram

IPC: H01J40/14 ,  G01N21/47 ,  G01N33/28 ,  G01N21/85 ,  G01N21/55 ,  G01N21/31 ,  G01N21/3577 ,  G01N21/552 ,  H01L25/16 ,  H01L33/54

CPC classification number: G01N21/4738 ,  F16N2250/34 ,  G01N21/314 ,  G01N21/3577 ,  G01N21/474 ,  G01N21/55 ,  G01N21/552 ,  G01N21/8507 ,  G01N33/2888 ,  G01N2021/4769 ,  G01N2201/062 ,  G01N2201/0638 ,  G01N2201/068 ,  H01L25/167 ,  H01L33/54 ,  H01L2224/48091 ,  H01L2224/8592 ,  H01L2924/00014

Abstract: Rolling bearings include a plurality of rolling bodies which during operation roll on raceways. In order to reduce friction during rolling, it is customary to supply the rolling bearings with a lubricant. However, the quality of the lubricant can deteriorate during operation due to long-term stress, aging, or thermal influences, or get lost in gaps etc. The objective addressed by the invention is that of providing a sensor device, which can be operated in a functionally reliable manner. This objective is achieved by a sensor device for monitoring the state of a lubricant in a lubricant chamber, including a transmitter platform, wherein on the transmitter platform, a plurality of diode devices are arranged, having a measurement window device, wherein the measurement window device is arranged between a measuring chamber and the lubricant chamber, having a receiving device, wherein at least one of the diode devices comprises a die and a plastic dome. The plastic dome and the die are connected by way of a contact surface, wherein the contact surface is arranged on an upper side of the die.

公开(公告)号：US20170372114A1

公开(公告)日：2017-12-28

申请号：US15631472

申请日：2017-06-23

Applicant: Samsung Electronics Co., Ltd.

Inventor： Gyu Sang Cho ,  Hee Cheul Moon ,  Hyung Dal Kim ,  Kyung Hoon Song ,  Kwang Sub Lee ,  Se Young Jang ,  Myung Su Kang ,  Heung Sik Shin

IPC: G06K9/00 ,  G01J5/10 ,  G01J1/58 ,  G06T11/00 ,  G01J1/02 ,  G01J1/08

CPC classification number: G06K9/00006 ,  G01J1/0219 ,  G01J1/0233 ,  G01J1/0266 ,  G01J1/08 ,  G01J1/58 ,  G01J5/10 ,  G01J2001/0257 ,  G01N2201/061 ,  G01N2201/0638 ,  G06F3/0412 ,  G06F3/0421 ,  G06F2203/04109 ,  G06K9/00033 ,  G06K9/00114 ,  G06K9/00161 ,  G06T11/003 ,  G06T2207/10 ,  G06T2207/10008 ,  G06T2207/10048

Abstract: An electronic device is provided which includes a light emitting module that radiates infrared light, a window disposed on the light emitting module and having a specific refractive index with respect to the infrared light, wherein the window includes a refraction part that totally reflects the infrared light inside the window in correspondence with the specific refractive index, and a fingerprint sensor disposed under the window and obtaining a fingerprint of a user based on a user input on the window by using scattered light of the infrared light.

公开(公告)号：US09851296B2

公开(公告)日：2017-12-26

申请号：US15355762

申请日：2016-11-18

Applicant: UT-Battelle, LLC

Inventor： William P. Partridge, Jr. ,  Gurneesh Singh Jatana ,  Ji Hyung Yoo ,  James E. Parks, II

IPC: G01N21/3504 ,  G01N21/85 ,  G01N33/00

CPC classification number: G01N21/3504 ,  G01N21/8507 ,  G01N33/004 ,  G01N2021/8521 ,  G01N2201/06113 ,  G01N2201/0638 ,  Y02A50/244

Abstract: A diagnostic system for measuring temperature, pressure, CO2 concentration and H2O concentration in a fluid stream is described. The system may include one or more probes that sample the fluid stream spatially, temporally and over ranges of pressure and temperature. Laser light sources are directed down pitch optical cables, through a lens and to a mirror, where the light sources are reflected back, through the lens to catch optical cables. The light travels through the catch optical cables to detectors, which provide electrical signals to a processer. The processer utilizes the signals to calculate CO2 concentration based on the temperatures derived from H2O vapor concentration. A probe for sampling CO2 and H2O vapor concentrations is also disclosed. Various mechanical features interact together to ensure the pitch and catch optical cables are properly aligned with the lens during assembly and use.

公开(公告)号：US20170227521A1

公开(公告)日：2017-08-10

申请号：US15015244

申请日：2016-02-04

Applicant: Nova Biomedical Corporation

Inventor： Michael S. Cafferty ,  Scott P. Cionek

IPC: G01N33/49 ,  G01N21/25 ,  G01N21/03

CPC classification number: G01N33/49 ,  G01J3/0202 ,  G01J3/0205 ,  G01J3/0208 ,  G01J3/0218 ,  G01J3/0286 ,  G01J3/0291 ,  G01J3/0297 ,  G01J3/10 ,  G01J3/14 ,  G01J3/28 ,  G01J3/42 ,  G01J2003/2866 ,  G01N21/0303 ,  G01N21/255 ,  G01N21/274 ,  G01N21/31 ,  G01N33/492 ,  G01N2021/0321 ,  G01N2021/0389 ,  G01N2201/062 ,  G01N2201/0633 ,  G01N2201/0634 ,  G01N2201/0638

Abstract: A system of measuring hemoglobin and bilirubin parameters in a whole blood sample using optical absorbance. The system includes an optical-sample module, a spectrometer module, an optical fiber module optically connecting the optical-sample module to the spectrometer module, and a processor module. The optical-sample module has a light-emitting module having a LED light source, a cuvette and a calibrating-light module. The processor module receives and processes an electrical signal from the spectrometer module and transforms the electrical signal into an output signal useable for displaying and reporting hemoglobin parameter values and/or total bilirubin parameter values for the whole blood sample.

公开(公告)号：US20170199131A1

公开(公告)日：2017-07-13

申请号：US15314346

申请日：2015-05-27

Applicant: Japan Science and Technology Agency

Inventor： Hiroyuki Yoshida

IPC: G01N21/71 ,  G01J3/02 ,  H01J37/244 ,  G01J3/443

CPC classification number: G01N21/71 ,  G01J3/0208 ,  G01J3/443 ,  G01N21/62 ,  G01N23/2254 ,  G01N2201/0638 ,  G01N2201/068 ,  G01N2223/6116 ,  H01J3/02 ,  H01J3/18 ,  H01J37/244 ,  H01J37/252 ,  H01J2237/06308 ,  H01J2237/06375 ,  H01J2237/2445

Abstract: An inverse photoemission spectroscopy apparatus is configured to detect a light generated by the relaxation of electrons to an unoccupied state of a sample. The apparatus includes an electron source for generating electrons with which a sample is irradiated, a wavelength selector for extracting a light having a certain wavelength from the light generated in the sample, a photodetector for detecting the light extracted by the wavelength selector; and a focusing optics disposed between the sample and the photodetector. The electron source contains yttrium oxide as a thermionic emission material.

公开(公告)号：US09678021B2

公开(公告)日：2017-06-13

申请号：US14821075

申请日：2015-08-07

Applicant: HITACHI HIGH-TECHNOLOGIES CORPORATION

Inventor： Yuta Urano ,  Toshifumi Honda

IPC: G01N21/00 ,  G01N21/956 ,  G01N21/95

CPC classification number: G01N21/95623 ,  G01N21/9501 ,  G01N2021/9513 ,  G01N2201/0638

Abstract: In optical dark field defect inspection, the present invention provides including: condensing laser emitted from a light source in a line shape; reflecting the laser, with a mirror; irradiating the reflected laser via an objective lens to a sample placed on a table from a vertical direction; condensing reflected scattered light from the sample with the objective lens; shielding diffraction light occurred from a periodical pattern formed on the sample, in the reflected scattered light from the sample and scattered light occurred from the mirror, with a spatial filter; receiving the reflected scattered light from the sample, not shielded with the spatial filter, with an imaging lens, and forming an image of the reflected scattered light; detecting the image of the reflected scattered light; and processing a detection signal obtained by detecting the image of the reflected scattered light and detecting a defect on the sample.

公开(公告)号：US09625726B2

公开(公告)日：2017-04-18

申请号：US14871943

申请日：2015-09-30

Applicant: KLA-Tencor Corporation

Inventor： Qibiao Chen

IPC: G01N21/00 ,  G02B27/09 ,  G01N21/47 ,  G01N21/95 ,  G02B13/14 ,  G01N21/88

CPC classification number: G02B27/0927 ,  G01N21/4738 ,  G01N21/8806 ,  G01N21/9501 ,  G01N2021/8822 ,  G01N2201/0631 ,  G01N2201/0638 ,  G02B13/143 ,  G02B27/0961

Abstract: Systems configured to provide illumination for wafer inspection performed by a wafer inspection tool are provided. One system includes one or more pupil lenses configured to focus a first far field pattern having a shape different than a shape of light generated by a light source. The system also includes a field lens array positioned between the one or more pupil lenses and an aperture stop. In addition, the system includes a lens group configured to focus a second far field pattern generated by the field lens array to a back focal plane of the lens group. The back focal plane of the lens group is a field plane of a wafer inspection tool at which a wafer to be inspected is placed during wafer inspection.

公开(公告)号：US20160363568A1

公开(公告)日：2016-12-15

申请号：US15241786

申请日：2016-08-19

Applicant: Agilent Technologies, Inc.

Inventor： Kevin P. Killeen ,  Hubert Kuderer ,  Karsten Kraiczek

IPC: G01N30/74 ,  G01N21/05 ,  G01N21/31

CPC classification number: G01N30/74 ,  G01J2003/102 ,  G01N21/05 ,  G01N21/31 ,  G01N2021/0346 ,  G01N2021/3129 ,  G01N2021/3133 ,  G01N2021/3148 ,  G01N2021/317 ,  G01N2030/027 ,  G01N2201/06153 ,  G01N2201/0627 ,  G01N2201/0638

Abstract: A fluid separation system for separating compounds of a sample fluid in a mobile phase comprises a detector adapted to detect separated compounds by providing an optical stimulus signal to the sample fluid and receiving a response signal on the optical stimulus signal. The detector comprises a light source adapted to provide an output light beam as the optical stimulus signal. The light source comprises a plurality of light emitting elements each adapted to emit a light beam having a respective wavelength, and a diffracting element. The plurality of light emitting elements are arranged that emitted light beams impinging on the diffracting element in a respective angle dependent on the respective wavelength are diffracted by the diffracting element into the output light beam.

Abstract translation: 用于分离流动相中样品流体的化合物的流体分离系统包括适于通过向样品流体提供光刺激信号并且在光刺激信号上接收响应信号来检测分离的化合物的检测器。 检测器包括适于提供输出光束作为光刺激信号的光源。 光源包括多个适于发射具有各自波长的光束的发光元件和衍射元件。 多个发光元件被布置成使得衍射元件以相应的角度照射在衍射元件上的发射光束被衍射元件衍射成输出光束。

公开(公告)号：US20160315114A1

公开(公告)日：2016-10-27

申请号：US15201028

申请日：2016-07-01

Applicant: KLA-Tencor Corporation

Inventor： Yung-Ho Alex Chuang ,  Jingjing Zhang ,  John Fielden

IPC: H01L27/146 ,  H01L31/107 ,  G01N21/88 ,  H01L27/148 ,  G01N21/95

CPC classification number: H01L27/14632 ,  G01N21/8806 ,  G01N21/9501 ,  G01N2201/061 ,  G01N2201/0638 ,  G01N2201/12 ,  H01L27/14609 ,  H01L27/1461 ,  H01L27/14612 ,  H01L27/1462 ,  H01L27/1464 ,  H01L27/14643 ,  H01L27/14645 ,  H01L27/14647 ,  H01L27/14681 ,  H01L27/14685 ,  H01L27/14687 ,  H01L27/14689 ,  H01L27/14698 ,  H01L27/14825 ,  H01L27/14831 ,  H01L27/14856 ,  H01L31/028 ,  H01L31/107 ,  H01L31/1804

Abstract: A high sensitivity image sensor comprises an epitaxial layer of silicon that is intrinsic or lightly p doped (such as a doping level less than about 1013 cm−3). CMOS or CCD circuits are fabricated on the front-side of the epitaxial layer. Epitaxial p and n type layers are grown on the backside of the epitaxial layer. A pure boron layer is deposited on the n-type epitaxial layer. Some boron is driven a few nm into the n-type epitaxial layer from the backside during the boron deposition process. An anti-reflection coating may be applied to the pure boron layer. During operation of the sensor a negative bias voltage of several tens to a few hundred volts is applied to the boron layer to accelerate photo-electrons away from the backside surface and create additional electrons by an avalanche effect. Grounded p-wells protect active circuits as needed from the reversed biased epitaxial layer.