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    SPECTRAL CHARACTERISTIC ACQUISITION DEVICE, IMAGE EVALUATION DEVICE, AND IMAGE FORMATION APPARATUS
    131.
    发明申请
    SPECTRAL CHARACTERISTIC ACQUISITION DEVICE, IMAGE EVALUATION DEVICE, AND IMAGE FORMATION APPARATUS 有权
    光谱特征获取装置，图像评估装置和图像形成装置

    公开(公告)号：US20150235114A1

    公开(公告)日：2015-08-20

    申请号：US14614497

    申请日：2015-02-05

    Applicant: Yoichi KUBOTA ,  Kohei SHIMBO ,  Naohiro KAMIJO

    Inventor： Yoichi KUBOTA ,  Kohei SHIMBO ,  Naohiro KAMIJO

    IPC: G06K15/02 ,  H04N1/60

    CPC classification number: G06K15/1878 ,  G01J3/28 ,  G01J3/2803 ,  G01J3/52 ,  G01J3/524 ,  G01N21/276 ,  G01N21/278 ,  G01N21/4788 ,  G06K15/027 ,  H04N1/6027 ,  H04N1/6041 ,  H04N1/6044 ,  H04N1/6097

    Abstract: A spectral characteristic acquisition device includes a light irradiation part configured to irradiate an object with light, a diffraction part configured to diffract light reflected from the object to provide diffracted light, a light-receiving part configured to receive the diffracted light and output a signal based on an amount of the diffracted light, a calibration color index configured to include a color with a known spectral characteristic, and an operation part configured to calculate a spectral characteristic of the object from a signal output from the light-receiving part by using a predetermined transformation matrix and calibrate the transformation matrix by using the calibration color index.

    Abstract translation: 光谱特征获取装置包括被配置为用光照射物体的光照射部分，被配置为衍射从物体反射的光以衍射光的衍射部分，被配置为接收衍射光并输出基于信号的光接收部分 对于衍射光的量，被配置为包括具有已知光谱特性的颜色的校准颜色指标，以及被配置为通过使用预定的从光接收部分输出的信号来计算物体的光谱特性的操作部分 转换矩阵，并使用校准颜色指数校准变换矩阵。

    High speed microscope with spectral resolution
    132.
    发明授权
    High speed microscope with spectral resolution 有权
    具有光谱分辨率的高速显微镜

    公开(公告)号：US09103721B2

    公开(公告)日：2015-08-11

    申请号：US13439951

    申请日：2012-04-05

    Applicant: Valerica Raicu ,  Gabriel Biener

    Inventor： Valerica Raicu ,  Gabriel Biener

    IPC: G01J3/00 ,  G01J3/28 ,  G02B21/00 ,  G01J3/02 ,  G01J3/06 ,  G01J3/44 ,  G02B21/16 ,  G02B27/09

    CPC classification number: G01J3/2803 ,  G01J3/027 ,  G01J3/0294 ,  G01J3/06 ,  G01J3/4406 ,  G01N15/1434 ,  G01N15/1463 ,  G01N15/1475 ,  G01N2015/1006 ,  G02B21/002 ,  G02B21/0076 ,  G02B21/16 ,  G02B27/0927 ,  G02B27/0983

    Abstract: A system and method of high-speed microscopy using a two-photon microscope with spectral resolution. The microscope is operable to provide two- to five-dimensional fluorescence images of samples, including two or three spatial dimensions, a spectral dimension (for fluorescence emission), and a temporal dimension (on a scale of less than approximately one second). Two-dimensional (spatial) images with a complete wavelength spectrum are generated from a single scan of a sample. The microscope may include one of a multi-beam point scanning microscope, a single beam line scanning microscope, and a multi-beam line scanning microscope. The line scans may be formed using one or more of curved mirrors and lenses. The multiple beams may be formed using one of a grating, an array of lenses, and a beam splitter.

    Abstract translation: 使用具有光谱分辨率的双光子显微镜的高速显微镜的系统和方法。 显微镜可操作以提供样品的二维至五维荧光图像，包括两个或三个空间维度，光谱维度（用于荧光发射）和时间维度（小于约一秒的刻度）。 从样品的单次扫描产生具有完整波长谱的二维（空间）图像。 显微镜可以包括多光束点扫描显微镜，单束线扫描显微镜和多光束线扫描显微镜中的一个。 线扫描可以使用一个或多个弯曲镜和透镜来形成。 多个光束可以使用光栅，透镜阵列和分束器中的一个来形成。

    SPECTROSCOPIC APPARATUS
    133.
    发明申请
    SPECTROSCOPIC APPARATUS 有权
    光谱仪

    公开(公告)号：US20150211928A1

    公开(公告)日：2015-07-30

    申请号：US14427481

    申请日：2014-06-20

    Applicant: Panasonic Intellectual Property Management Co., Lt

    Inventor： Tatsuo Itoh ,  Koichi Kusukame ,  Aki Yoneda

    IPC: G01J3/427 ,  G01J3/10

    CPC classification number: G01J3/427 ,  G01J3/0208 ,  G01J3/021 ,  G01J3/0224 ,  G01J3/0237 ,  G01J3/0243 ,  G01J3/0278 ,  G01J3/0289 ,  G01J3/10 ,  G01J3/2803 ,  G01J3/32 ,  G01J3/42 ,  G01J3/433 ,  G01J2001/4242 ,  G01J2003/064 ,  G01J2003/102 ,  G01J2003/104 ,  G01J2003/106 ,  G01N21/359

    Abstract: A light radiating portion (11a, 11b, 12, 51, 52) radiates light with wavelength λ1 having predetermined absorptivity for an object (16) and light with wavelength λ2 having smaller absorptivity for the object (16) than the wavelength λ1, to a target, so as to scan in 2-dimensional directions. A light receiving portion (17) receives scattered lights reflected by the target based on light with wavelength λ1 and light with wavelength λ2. A measuring portion (18) generates information used for detection of the object (16) at the target, based on difference between the two scattered lights with wavelength λ1 and wavelength λ2 received by the light receiving portion (17). An output portion (53) outputs whether or not the object is present at the target, by 2-dimensional area information, based on scanning by the light radiating portion (11a, 11b, 12, 51, 52) and information generated by the measuring portion (18).

    Abstract translation: 光辐射部分（11a，11b，12,51,52）将对物体（16）具有预定吸收率的波长λ1的光和对象（16）的波长λ1的波长λ2的波长比波长λ1辐射到 目标，以便在二维方向扫描。 光接收部分（17）基于具有波长λ1的光和波长λ2的光接收由目标反射的散射光。 测量部分（18）基于由光接收部分（17）接收的波长λ1和波长λ2的两个散射光之间的差异，生成用于目标物体（16）的检测的信息。 输出部（53）基于由光照射部（11a，11b，12,51,52）的扫描和由测量生成的信息，通过二维区域信息，输出对象是否存在于目标 部分（18）。

    HYPERSPECTRAL IMAGING SYSTEMS AND METHODS FOR IMAGING A REMOTE OBJECT
    135.
    发明申请
    HYPERSPECTRAL IMAGING SYSTEMS AND METHODS FOR IMAGING A REMOTE OBJECT 有权
    用于成像远程对象的高精度成像系统和方法

    公开(公告)号：US20150153226A1

    公开(公告)日：2015-06-04

    申请号：US14093814

    申请日：2013-12-02

    Applicant: Corning Incorporated

    Inventor： Lovell Elgin Comstock, II ,  James Dixon Cornell ,  Jeffry John Santman ,  Kenneth Smith Woodard

    IPC: G01J3/28

    CPC classification number: G01J3/2823 ,  G01J3/0208 ,  G01J3/0229 ,  G01J3/0256 ,  G01J3/04 ,  G01J3/2803 ,  G01J3/36 ,  G01J2003/042 ,  G01J2003/045 ,  G01J2003/2813 ,  G01J2003/2826 ,  H04N5/347 ,  H04N9/04

    Abstract: A hyperspectral imaging system and a method are described herein for providing a hyperspectral image of an area of a remote object. In one aspect, the hyperspectral imaging system includes a fore optic with optics for acquiring and projecting an image from a remote object, a scannable slit mechanism with a plurality of slits for receiving the projected image, where the projected image simultaneously illuminates two or more of the plurality of slits, a spectrometer for receiving and dispersing images passing through the two or more simultaneously-illuminated slits, and a two-dimensional image sensor for recording images received from the spectrometer, where the images received from different slits are recorded on different sets of detection elements of the two-dimensional image sensor.

    Abstract translation: 本文描述了一种高光谱成像系统和方法，用于提供远程对象的区域的高光谱图像。 一方面，高光谱成像系统包括具有用于从远程物体获取和投影图像的光学器件的前视镜，具有用于接收投影图像的多个狭缝的可扫描狭缝机构，其中投影图像同时照亮两个或更多个 多个狭缝，用于接收和分散通过两个或更多个同时照射的狭缝的图像的光谱仪，以及用于记录从光谱仪接收的图像的二维图像传感器，其中从不同狭缝接收的图像被记录在不同的组上 的二维图像传感器的检测元件。

    COMPACT SPECTROMETER FOR TWO-DIMENSIONAL SAMPLING
    136.
    发明申请
    COMPACT SPECTROMETER FOR TWO-DIMENSIONAL SAMPLING 有权
    用于二维采样的精密光谱仪

    公开(公告)号：US20150116720A1

    公开(公告)日：2015-04-30

    申请号：US12935772

    申请日：2009-03-17

    Applicant: Yassine Hadjar ,  Sylvain Blaize ,  Aurélien Bruyant ,  Gilles Lerondel ,  Pascal Royer

    Inventor： Yassine Hadjar ,  Sylvain Blaize ,  Aurélien Bruyant ,  Gilles Lerondel ,  Pascal Royer

    IPC: G01J3/02 ,  G01J3/45

    CPC classification number: G01J3/0205 ,  G01J3/02 ,  G01J3/021 ,  G01J3/2803 ,  G01J3/45 ,  G01J3/453

    Abstract: The present invention relates to a spectrometer including a diopter (11); capturing means (15, 18) at said diopter (11) of an interferogram (12) originating from two interference beams (F1, F2) and forming interference lines (13) along the transverse axis (Ox) of the interferogram (12) within the plane (xOy) of the diopter (11), said capturing means (15, 18) including a network (18) of detection elements (19) so arranged to detect the spatial distribution of said interferogram (12), characterized in that said network (18) of detection elements (19) is two-dimensional and in that at least a portion of said capturing means (15, 18) and said interferogram (12) are tilted with regard to each other along the transverse axis (Ox) of the interferogram (12). The present invention also relates to a spectroscopic imaging device, including means for emitting two interference beams (F1, F2), and to such a spectrometer.

    Abstract translation: 本发明涉及一种包括屈光度（11）的光谱仪; 在来自两个干涉光束（F1，F2）的干涉图（12）的所述屈光度（11）的所述屈光度计（11）处的捕获装置（15,18），并沿着干涉图（12）的横轴（Ox）形成干涉线 屈光度计（11）的平面（xOy），所述捕获装置（15,18）包括检测元件（19）的网络（18），以便检测所述干涉图（12）的空间分布，其特征在于： 检测元件（19）的网络（18）是二维的，并且所述捕获装置（15,18）和所述干涉图（12）的至少一部分相对于彼此沿着横向轴线（Ox）倾斜， 的干涉图（12）。 本发明还涉及一种分光成像装置，包括用于发射两个干涉光束（F1，F2）的装置以及这种光谱仪。

    SPECTROSCOPIC MEASUREMENT DEVICE AND SPECTROSCOPIC MEASUREMENT METHOD
    137.
    发明申请
    SPECTROSCOPIC MEASUREMENT DEVICE AND SPECTROSCOPIC MEASUREMENT METHOD 审中-公开
    光谱测量装置和光谱测量方法

    公开(公告)号：US20150116707A1

    公开(公告)日：2015-04-30

    申请号：US14525719

    申请日：2014-10-28

    Applicant: Seiko Epson Corporation

    Inventor： Tetsuo TATSUDA

    IPC: G01J3/32 ,  G01J3/26

    CPC classification number: G01J3/32 ,  G01J3/26 ,  G01J3/2803

    Abstract: A spectroscopic measurement device includes a variable wavelength interference filter capable of selectively emitting light with a predetermined wavelength out of incident light, and changing the wavelength of the light to be emitted, a light receiving element adapted to output a detection signal corresponding to a light exposure in response to an exposure to the light emitted from the variable wavelength interference filter, a detection signal acquisition section adapted to obtain a plurality of detection signals different in the light exposure from each other with respect to each of the wavelengths, and a selection section adapted to select the detection signal having a highest signal level out of signal levels of the detection signals obtained, which are lower than a maximum signal level corresponding to a saturated light exposure of the light receiving element.

    Abstract translation: 光谱测量装置包括：可变波长干涉滤光器，其能够选择性地发射入射光中具有预定波长的光，并且改变要发射的光的波长;光接收元件，适于输出对应于曝光的检测信号 响应于从可变波长干涉滤光器发射的光的曝光，检测信号获取部分，适于获得相对于每个波长的彼此的曝光不同的多个检测信号，以及适于 从所获得的检测信号的信号电平中选择具有最高信号电平的检测信号，该信号电平低于对应于光接收元件的饱和光照射的最大信号电平。

    Multi-function spectrometer-on-chip with a single detector array
    139.
    发明授权
    Multi-function spectrometer-on-chip with a single detector array 有权
    具有单个检测器阵列的多功能光谱仪芯片

    公开(公告)号：US08937717B2

    公开(公告)日：2015-01-20

    申请号：US14035348

    申请日：2013-09-24

    Applicant: Tornado Medical Systems, Inc.

    Inventor： Kyle Preston ,  Arthur Nitkowski ,  Nicholas Sherwood ,  Arsen Hajian

    IPC: G01J3/447 ,  G01J3/02

    CPC classification number: G01J3/447 ,  G01J3/0205 ,  G01J3/0218 ,  G01J3/0224 ,  G01J3/0259 ,  G01J3/18 ,  G01J3/1804 ,  G01J3/1895 ,  G01J3/2803 ,  G01J3/36

    Abstract: Various embodiments of apparatuses, systems and methods are described herein for a spectrometer comprising at least two dispersive elements configured to receive at least one input optical signal and generate two or more pluralities of spatially separated spectral components, at least a portion of the at least two dispersive elements being implemented on a first substrate; and a single detector array coupled to the at least two dispersive elements and configured to receive and measure two or more pluralities of narrowband optical signals derived from the two or more pluralities of spatially separated spectral components, respectively.

    Abstract translation: 本文描述了用于光谱仪的装置，系统和方法的各种实施例，其包括至少两个分散元件，其被配置为接收至少一个输入光信号并产生两个或更多个空间上分离的光谱分量，至少两个 分散元件被实施在第一基板上; 以及耦合到所述至少两个色散元件并被配置为分别接收和测量从所述两个或更多个空间分离的光谱分量导出的两个或更多个窄带光信号的单个检测器阵列。

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