Adjustment for irregular sensor movement during spectral imaging

    公开(公告)号:US09784615B1

    公开(公告)日:2017-10-10

    申请号:US15362108

    申请日:2016-11-28

    Applicant: BaySpec, Inc.

    Abstract: Systems for adjusting for irregular movement during spectral imaging are provided herein. Exemplary systems include: a spectrograph measuring a plurality of spectrographic data sets; a camera capturing images, a processor communicatively coupled to the spectrograph and the camera; and a memory coupled to the processor, the memory storing instructions executable by the processor to perform a method comprising: receiving a plurality of spectrographs for a series of respective locations and the images corresponding to the respective locations; generating a continuous image using the images; identifying a respective corresponding position in the continuous image for each spectrograph, such that each spectrograph is a measurement of the respective position; and associating each spectrograph with the respective position.

    SPECTROMETER
    13.
    发明申请
    SPECTROMETER 有权
    光谱仪

    公开(公告)号:US20170010152A1

    公开(公告)日:2017-01-12

    申请号:US15116232

    申请日:2015-02-03

    Abstract: A spectrometer includes a first spectroscopic unit and a second spectroscopic unit. A light passing part, a reflection part, a common reflection part, a dispersive part, and a light detection part included in the first spectroscopic unit are arranged along a first reference line when viewed in a Z-axis direction. A light passing part, a reflection part, the common reflection part, a dispersive part, and a light detection part included in the second spectroscopic unit are arranged along a second reference line when viewed in the Z-axis direction. The first reference line and the second reference line intersect with one another.

    Abstract translation: 光谱仪包括第一分光单元和第二分光单元。 沿Z轴方向观察时,沿着第一基准线配置第一分光单元中包括的光通过部分,反射部分,共同反射部分,分散部分和光检测部分。 沿Z轴方向观察时,沿着第二基准线配置第二分光单元中包括的光通过部分,反射部分,共同反射部分,色散部分和光检测部分。 第一参考线和第二参考线彼此相交。

    CONFIGURABLE COMBINATION SPECTROMETER AND IMAGER
    16.
    发明申请
    CONFIGURABLE COMBINATION SPECTROMETER AND IMAGER 有权
    可配置的组合光谱仪和图像

    公开(公告)号:US20150211926A1

    公开(公告)日:2015-07-30

    申请号:US14166067

    申请日:2014-01-28

    Abstract: An imaging transform spectrometer, and method of operation thereof, that is dynamically configurable “on demand” between an interferometric spectrometer function and a broadband spatial imaging function to allow a single instrument to capture both broadband spatial imagery and spectral data of a scene. In one example, the imaging transform spectrometer is configured such that the modulation used for interferometric imaging may be dynamically turned ON and OFF to select a desired mode of operation for the instrument.

    Abstract translation: 成像变换光谱仪及其操作方法,其可以在干涉测量光谱仪功能和宽带空间成像功能之间“按要求”动态配置,以允许单个仪器捕获场景的宽带空间图像和光谱数据。 在一个示例中,成像变换光谱仪被配置为使得用于干涉成像的调制可以被动态地接通和断开以选择仪器的期望的操作模式。

    Spectrum measuring apparatus
    17.
    发明授权
    Spectrum measuring apparatus 有权
    光谱测量仪

    公开(公告)号:US09036147B2

    公开(公告)日:2015-05-19

    申请号:US13322019

    申请日:2009-05-29

    Abstract: Disclosed is a spectrum measuring apparatus for shortening such a measurement time period for an object being measured including two or more mutually different measurement portions as is required for the spectrum measurements of the lights from individual measurement portions. The spectrum measuring apparatus comprises a slit group having two or more slits, a spectroscope for separating the lights extracted by the slit group, for the individual slits, and a measuring unit for measuring the intensities of the individual components, which are separated by the spectroscope, for the slits. The individual slits extract such ones of the lights coming from an object being measured including two or more mutually different measurement portions, as come from the individual measurement portions.

    Abstract translation: 本发明公开了一种频谱测量装置,用于根据来自各个测量部分的光的光谱测量所需的,缩短测量对象的测量时间段,包括两个或更多个相互不同的测量部分。 光谱测量装置包括具有两个或更多个狭缝的狭缝组,用于分离由狭缝组提取的光的分光镜,用于各狭缝的测量单元,以及用于测量由分光镜分离的各个部件的强度的测量单元 ,为狭缝。 各个狭缝从各个测量部分提取来自被测量物体的那些光,包括两个或更多个相互不同的测量部分。

    SPECTROMETER AND METHOD OF SPECTROSCOPY
    19.
    发明申请
    SPECTROMETER AND METHOD OF SPECTROSCOPY 有权
    光谱仪和光谱学方法

    公开(公告)号:US20140368818A1

    公开(公告)日:2014-12-18

    申请号:US14361840

    申请日:2012-12-11

    Abstract: A spark optical emission spectrometer comprising: a spark source for causing spark induced emission of light from a sample; a single entrance slit; a toroidal mirror for directing the light through the single entrance slit; a plurality of diffraction gratings for diffracting light that has been directed through the entrance slit by the mirror, whereby the plurality of diffraction gratings are simultaneously illuminated; and at least one array detector for detecting the diffracted light from the plurality of diffraction gratings, wherein the minor is for directing the light through the entrance slit such that light from different regions in the spark source is spatially separated in an image of the light at the gratings whereby a first diffraction grating is preferentially illuminated with light from a first region of the spark source and simultaneously a second diffraction grating is preferentially illuminated with light from a second region of the spark source.

    Abstract translation: 一种火花光发射光谱仪,包括:火花源,用于引起火花诱发的来自样品的光的发射; 单个入口狭缝; 用于将光引导通过单个入口狭缝的环形镜; 多个用于衍射光的衍射光栅,所述衍射光栅通过所述反射镜被引导通过所述入射狭缝,由此所述多个衍射光栅同时被照亮; 以及用于检测来自多个衍射光栅的衍射光的至少一个阵列检测器,其中,次要用于引导光通过入口狭缝,使得来自火花源中的不同区域的光在光的图像中在空间上分离 其中由来自火花源的第一区域的光优先照射第一衍射光栅并且同时第二衍射光栅的光栅优先用来自火花源的第二区域的光照射。

    Analysis apparatus and analysis method
    20.
    发明授权
    Analysis apparatus and analysis method 有权
    分析仪器及分析方法

    公开(公告)号:US08879062B2

    公开(公告)日:2014-11-04

    申请号:US13839748

    申请日:2013-03-15

    Inventor: Yuji Ikeda

    Abstract: An analysis apparatus includes a plasma generation unit and an optical analysis unit. The plasma generation unit generates initial plasma by momentarily energizing a target substance to be turned into a plasma state, and maintains the target substance in the plasma state by irradiating the initial plasma with an electromagnetic wave for a predetermined period of time. The optical analysis unit identifies the target substance based on information with respect to emission intensity during a period from when the emission intensity reaches a peak due to the initial plasma until when the emission intensity increases and reaches approximately a constant value due to electromagnetic wave plasma maintained by the electromagnetic wave, or information with respect to emission intensity after the electromagnetic wave irradiation is terminated.

    Abstract translation: 分析装置包括等离子体产生单元和光学分析单元。 等离子体产生单元通过暂时激励要变成等离子体状态的目标物质来产生初始等离子体,并且通过用电磁波照射初始等离子体一定时间来将目标物质维持在等离子体状态。 光分析单元基于从发射强度由于初始等离子体到达峰值的时间段的发光强度的信息来识别目标物质,直到发射强度增加并且由于电磁波等离子体维持而达到大致恒定值 通过电磁波,或者关于电磁波照射后的发光强度的信息终止。

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