Abstract:
A miniaturized spectrometer/spectrophotometer system and methods are disclosed. A probe tip including one or more light sources and a plurality of light receivers is provided. A first spectrometer system receives light from a first set of the plurality of light receivers. A second spectrometer system receives light from a second set of the plurality of light receivers. A processor, wherein the processor receives data generated by the first spectrometer system and the second spectrometer system, wherein an optical measurement of a sample under test is produced based on the data generated by the first and second spectrometer systems.
Abstract:
A waveguide optical monitor is disclosed. The device has an optical input port coupled through a switch to a plurality of input waveguides. A dispersive element disperses light within the input optical waveguides toward a plurality of output waveguides. There are a plurality of photodetectors each optically coupled to an output waveguide. The photodectors are for sensing an intensity of light within the waveguide with which it is optically coupled. An optical switch in optical communication with the optical input port and for switching light received at the optical input port to one of the plurality of input waveguides. Also, an angular dispersive element is present for receiving light from any one of the waveguides and for dispersing the light toward a plurality of output waveguides in dependence upon the input waveguide position and a wavelength of the light such that light directed from the first of the plurality of input waveguides toward the plurality of output waveguides has a first centre wavelength within each of the output waveguides and light directed from the second of the plurality of input waveguides toward the plurality of output waveguides has a second different centre wavelength within each of the output waveguides, the second different centre wavelength different form any first centre wavelength.
Abstract:
Plural electronic or optical images are provided in a streak optical system, as for instance by use of plural slits instead of the conventional single slit, to obtain a third, fourth, etc. dimensionnullrather than only the conventional two, namely range or time and azimuth. Such additional dimension or dimensions are thereby incorporated into the optical information that is to be streaked and thereby time resolved. The added dimensions may take any of an extremely broad range of forms, including wave-length, polarization state, or one or more spatial dimensionsnullor indeed virtually any optical parameter that can be impressed upon a probe beam. Resulting capabilities remarkably include several new forms of lidar spectroscopy, fluorescence analysis, polarimetry, spectropolarimetry, and combinations of these, as well as a gigahertz wavefront sensor.
Abstract:
Systems and methods for filter based spectrographic analysis are provided that permit rapid analysis of bioanalytes. Systems include devices for illuminating a sample with electromagnetic radiation and capturing radiation emitted from the sample. Emitted radiation can be collected by a plurality of waveguides each associated with a filter for a particular wavelength of radiation. Focusing devices are associated with filters and waveguides in certain embodiments. Radiation captured by waveguides can then be transmitted to a remote detector, which can determine the intensity of radiation for each waveguide. The use of a plurality of filters having different, band pass characteristics can permits the simultaneous detection of a plurality of different wavelengths of radiation emitted by a sample, thereby providing spectrographic information about the sample under study. Systems can include computers for storing acquired spectrographic information, addressable arrays of samples, and information security measures. Spectrographic information of samples can be diagnostic tools for identifying and quantifying a variety of different materials, including bioanalytes.
Abstract:
An optical system having a first order spectral range that is usable in an optical spectrum analyzer receives an broadband optical test signal and a optical calibration signal and couples the optical signals via two optically isolated paths to separate optical detectors. First and second pairs of optical fibers, with each pair having an input fiber and an output fiber, are positioned in a focal plane of a collimating optic that has an optical axis. The fiber pairs are symmetrically positioned on either side of the optical axis with the input fibers positioned on one side of the optical axis and the output fibers positioned on the opposite side of the optical axis. The input fibers receive the optical test signal and the optical calibration signal. The output optical fibers are coupled to first and second optical detectors. An optical calibration source generates second order or greater spectral lines that fall within the first order spectral range of the optical system. A diffraction grating receives the optical test signal and the optical calibration signal from the collimating optic and separates the first order spectral components of the broadband optical test signal and passes the second order or greater spectral lines of the optical calibration signal. The first optical detector that is responsive to the first order spectral components of the optical test signal receives the optical test signal from the collimating optic and converts the optical test signal to an electrical signal. A second optical detector that is responsive to the second order or greater spectral lines of the optical calibration signal concurrently receives the optical calibration signal from the collimating optic and converts the calibrations signal to an electrical signal.
Abstract:
An optical measurement system for evaluating a sample has a azimuthally rotatable measurement head. A motor-driven rotating mechanism is coupled to the measurement head to allow the optics to rotate with respect to the sample. In particular, a preferred embodiment is a polarimetric scatterometer (FIG. 1) for measuring optical properties of a periodic structure on a wafer sample (12). This scatterometer has optics (30) directing a polarized illumination beam at non-normal incidence onto the periodic structure. In addition to a polarizer (8), the illumination path can also be provided with an E-O modulator for modulating the polarization. The measurement head optics also collect light reflected from the periodic structure and feed that light to a spectrometer (17) for measurement. A polarization beamsplitter (18) is provided in the collection path so that both S and P polarization from the sample can be separately measured. The entire measurement head can be mounted for rotation of the plane of incidence to different azimuthal directions relative to the periodic structures on the wafer. The instrument can be integrated within a wafer process tool in which wafers may be provided at arbitrary orientation.
Abstract:
A capillary spectrometer is disclosed for observing radiation from a source. The spectrometer comprises a capillary array, a dispersive element, and a short wavelength imaging detector. The capillary guide comprises a receiving end and an emitting end. The receiving end is positioned so that it may receive radiation from the source. As radiation travels through the capillary guide, the course of the radiation is changed so that it is emitted in a predetermined path or paths from the emitting end. The emitted radiation falls on the dispersing element which disperses the radiation into a predetermined pattern. The radiation then falls on sensors of the short wavelength imaging detector which generate electrical signals in response to the frequency and intensity of radiation. Insulators may be used to prevent discrete rays of radiation from interfering with each other as they pass from the capillary guide to the short wavelength imaging detector. The short wavelength imaging detector may be adapted to gather data for specific periods of time during an emitting event so that changes in the radiation may be observed over time. The present invention is particularly well adapted to observe short wavelength light in the extreme ultraviolet, soft x-ray, and regular x-ray regions.
Abstract:
An optical system for a multidetector array spectrophotometer which includes multiple light sources for emitting light of selected wavelength ranges and means for selectively transmitting the selected wavelength ranges of light to respective slits of a multi-slit spectrograph for multiple wavelength range detection. The spectrograph has two or more slits which direct the selected wavelength ranges of the light spectra to fall upon a dispersive and focusing system which collects light from each slit, disperses the light by wavelength and refocuses the light at the positions of a single set of detectors.
Abstract:
A dispersive optical spectrometer is disclosed which comprises light detection means, dispersion means for separating light radiation into spectral components and for directing the spectral components toward the light detection means, means for admitting light radiation into the entrance focal plane and for directing the light radiation toward the dispersion means, the light radiation admitting means including a plurality of spaced-apart apertures, and light transmission means for transmitting light radiation from a light source to one or more of the apertures.
Abstract:
Systems and methods for determining one or more properties of a sample are disclosed. The systems and methods disclosed can be capable of measuring along multiple locations and can reimage and resolve multiple optical paths within the sample. The system can be configured with one-layer or two-layers of optics suitable for a compact system. The optics can be simplified to reduce the number and complexity of the coated optical surfaces, etalon effects, manufacturing tolerance stack-up problems, and interference-based spectroscopic errors. The size, number, and placement of the optics can enable multiple simultaneous or non-simultaneous measurements at various locations across and within the sample. Moreover, the systems can be configured with an optical spacer window located between the sample and the optics, and methods to account for changes in optical paths due to inclusion of the optical spacer window are disclosed.