Resin identification device
    234.
    发明授权

    公开(公告)号:US09903760B2

    公开(公告)日:2018-02-27

    申请号:US14989806

    申请日:2016-01-07

    Inventor: Toyohiko Tanaka

    Abstract: A resin identification device capable of measuring samples having various shapes is provided. The resin identification device includes a Fourier transform infrared spectrophotometer (FTIR), and sample placing plates 31 and 32 having an opening 33. The FTIR includes: an infrared light source section 10, irradiating a sample S with infrared light; an infrared light detection section 20, detecting light intensity information of the infrared light reflected from the sample S; and a control section 50, obtaining the light intensity information. By replacement of the sample S in a predetermined position so as to block off the opening 33, the infrared light source section 10 irradiates infrared light on a lower surface of the sample S, and the infrared light detection section 20 detects the light intensity information of the infrared light reflected by the lower surface of the sample S.

    Apparatus and method for measuring reference spectrum for sample analysis, and apparatus and method for analyzing sample

    公开(公告)号:US09885607B2

    公开(公告)日:2018-02-06

    申请号:US15241762

    申请日:2016-08-19

    Inventor: Kun Sun Eom

    Abstract: An apparatus for measuring a reference spectrum includes a parameter adjuster configured to adjust a parameter of a spectroscope so that an intensity of a reflection spectrum of a sample has a value in a range, a reference material spectrum measurer configured to adjust reflectance of a reference material so an intensity of a reflection spectrum of the reference material is not saturated, and measure the reflection spectrum of the reference material, using the spectroscope having the adjusted parameter, a first reference spectrum calculator configured to, in response to the adjusted reflectance of the reference material not being one hundred percent, calculate a first reference spectrum based on the measured reflection spectrum of the reference material, and a second reference spectrum measurer configured to measure a second reference spectrum of the reference material, using the spectroscope having the adjusted parameter, when a light source of the spectroscope is turned off.

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