TOTAL REFLECTION SPECTROSCOPIC MEASUREMENT DEVICE AND TOTAL REFLECTION SPECTROSCOPIC MEASUREMENT METHOD

    公开(公告)号:US20170336259A1

    公开(公告)日:2017-11-23

    申请号:US15597329

    申请日:2017-05-17

    Inventor: Yoichi KAWADA

    Abstract: A total reflection spectroscopic measurement device includes a terahertz wave generation unit, an internal total reflection prism, a detection unit configured to detect the terahertz wave, an electric field vector measurement unit configured to measure an electric field vector of the terahertz wave, and an analysis unit configured to acquire information about an optical constant of the object to be measured. Proportions of S polarization component and P polarization component of the terahertz wave are constant. The analysis unit acquires the information about the optical constant on the basis of a ratio between S polarization component and P polarization component of the measured electric field vector when the object is not arranged on the total reflection surface and a ratio between S polarization component and P polarization component of the measured electric field vector when the object is arranged on the total reflection surface.

    NDIR reflection sampling in liquids

    公开(公告)号:US09823185B1

    公开(公告)日:2017-11-21

    申请号:US15644775

    申请日:2017-07-08

    Applicant: Airware, Inc.

    Abstract: For determining concentration of a targeted molecule M in a liquid sample admixed with interfering molecules MJ which overlap its absorption band, a NDIR reflection sampling technique is used. Besides the signal source, a reference and an interference source are added. M is calculated by electronics which use Rave(t) from a pulsed signal and reference channel output and a calibration curve which is validated by use of RJava(t2) from a pulsed interference and reference channel output. Signal, interference and reference sources are pulsed at a frequency which is sufficiently fast so that a given molecule of M or MJ will not pass in and out of the liquid sampling matrix within the pulsing frequency.

    OPTICAL GAS SENSOR COMPRISING AN LED EMITTER FOR THE EMISSION OF LIGHT OF A NARROW BANDWIDTH

    公开(公告)号:US20170322149A1

    公开(公告)日:2017-11-09

    申请号:US15525338

    申请日:2015-11-02

    CPC classification number: G01N21/3504 G01J3/42 G01N21/1702 G01N21/31

    Abstract: An optical gas sensor (1), for quantitatively measuring a concentration of one or more gases, includes a radiation source (2) for emitting light waves (L), a cuvette (3) for holding a gas (G) to be measured, and a detector (4) for measuring light intensities. The light source (2) includes at least one emitter (5) of light waves (L) and is configured to emit light waves (L) of at least one first wavelength and of a second wavelength different from the first wavelength simultaneously or separately from each other. The emitter (5) is further configured to emit a spectrum the full half-life width of which is a maximum 50% of the effective wavelength, and to emit light waves (L) having a controlled beam path. The detector (4) is configured to quantitatively detect an intensity of emitted light waves (L) of the first wavelength and of the second wavelength.

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