31.
    发明专利
    未知

    公开(公告)号:DE60219343D1

    公开(公告)日:2007-05-16

    申请号:DE60219343

    申请日:2002-10-09

    Applicant: LAM RES CORP

    Abstract: A tunable multi-zone injection system for a plasma processing system for plasma processing of substrates such as semiconductor wafers. The injector can include an on-axis outlet supplying process gas at a first flow rate to a central zone and off-axis outlets supplying the same process gas at a second flow rate to an annular zone surrounding the central zone. The arrangement permits modification of gas delivery to meet the needs of a particular processing regime by allowing independent adjustment of the gas flow to multiple zones in the chamber. In addition, compared to consumable showerhead arrangements, a removably mounted gas injector can be replaced more easily and economically.

    32.
    发明专利
    未知

    公开(公告)号:AT358887T

    公开(公告)日:2007-04-15

    申请号:AT02801663

    申请日:2002-10-09

    Applicant: LAM RES CORP

    Abstract: A tunable multi-zone injection system for a plasma processing system for plasma processing of substrates such as semiconductor wafers. The injector can include an on-axis outlet supplying process gas at a first flow rate to a central zone and off-axis outlets supplying the same process gas at a second flow rate to an annular zone surrounding the central zone. The arrangement permits modification of gas delivery to meet the needs of a particular processing regime by allowing independent adjustment of the gas flow to multiple zones in the chamber. In addition, compared to consumable showerhead arrangements, a removably mounted gas injector can be replaced more easily and economically.

    HEATING PLATE WITH PLANAR HEATER ZONES FOR SEMICONDUCTOR PROCESSING

    公开(公告)号:SG189923A1

    公开(公告)日:2013-06-28

    申请号:SG2013029137

    申请日:2011-10-31

    Applicant: LAM RES CORP

    Inventor: SINGH HARMEET

    Abstract: Abstract A heating plate for a substrate support assembly in a semiconductor plasma processing apparatus, comprises multiple independently controllable planar heater zones arranged in a scalable multiplexing layout, and electronics to independently control and power the planar heater zones. Each planar heater zone includes one or more heater elements made of an insulator-conductor composite. A substrate support assembly in which the heating plate is incorporated includes an electrostatic clamping electrode and a temperature controlled base plate. Methods for manufacturing the heating plate include bonding together ceramic sheets having planar heater zones, power supply lines, power return lines and vias.

    36.
    发明专利
    未知

    公开(公告)号:DE60219343T2

    公开(公告)日:2007-12-13

    申请号:DE60219343

    申请日:2002-10-09

    Applicant: LAM RES CORP

    Abstract: A tunable multi-zone injection system for a plasma processing system for plasma processing of substrates such as semiconductor wafers. The injector can include an on-axis outlet supplying process gas at a first flow rate to a central zone and off-axis outlets supplying the same process gas at a second flow rate to an annular zone surrounding the central zone. The arrangement permits modification of gas delivery to meet the needs of a particular processing regime by allowing independent adjustment of the gas flow to multiple zones in the chamber. In addition, compared to consumable showerhead arrangements, a removably mounted gas injector can be replaced more easily and economically.

    E-BEAM ENHANCED DECOUPLED SOURCE FOR SEMICONDUCTOR PROCESSING

    公开(公告)号:SG10201602785TA

    公开(公告)日:2016-05-30

    申请号:SG10201602785T

    申请日:2012-04-10

    Applicant: LAM RES CORP

    Abstract: PROBLEM TO BE SOLVED: To improve separate control of the ion concentration and the radical concentration in plasma.SOLUTION: A semiconductor substrate processing system 300 includes a chamber 301, a substrate support 303, and a separate plasma generation chamber 355. The system also includes a plurality of fluid transmission pathways 316 fluidly connecting the plasma generation chamber 355 to the chamber 301. The system further includes an electron beam source 363 for injecting electrons into the processing chamber to control an electron energy distribution within the processing chamber so as to in turn control an ion-to-radical density ratio within the processing chamber. The electron beam source 363 is defined to transmit an electron beam through the processing chamber above and across the substrate support 303.SELECTED DRAWING: Figure 3A

    METHODS OF FAULT DETECTION FOR MULTIPLEXED HEATER ARRAY

    公开(公告)号:SG10201508636RA

    公开(公告)日:2015-11-27

    申请号:SG10201508636R

    申请日:2011-09-28

    Applicant: LAM RES CORP

    Inventor: SINGH HARMEET

    Abstract: Described herein is a method of detecting fault conditions in a multiplexed multi-heater-zone heating plate for a substrate support assembly used to support a semiconductor substrate in a semiconductor processing apparatus.

    INTERNAL PLASMA GRID FOR SEMICONDUCTOR FABRICATION

    公开(公告)号:SG10201401112YA

    公开(公告)日:2014-11-27

    申请号:SG10201401112Y

    申请日:2014-03-31

    Applicant: LAM RES CORP

    Abstract: The embodiments disclosed herein pertain to improved methods and apparatus for etching a semiconductor substrate. A plasma grid assembly is positioned in a reaction chamber to divide the chamber into upper and lower sub-chambers. The plasma grid assembly may include one or more plasma grids having slots of a particular aspect ratio, which allow certain species to pass through from the upper sub-chamber to the lower sub-chamber. Where multiple plasma grids are used, one or more of the grids may be movable, allowing for tenability of the plasma conditions in at least the lower sub-chamber. In some cases, an electron-ion plasma is generated in the upper sub-chamber. Electrons that make it through the grid to the lower sub-chamber are cooled as they pass through. In some cases, this results in an ion-ion plasma in the lower sub-chamber.

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