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公开(公告)号:NL2004808A
公开(公告)日:2011-01-12
申请号:NL2004808
申请日:2010-06-03
Applicant: ASML NETHERLANDS BV
Inventor: PATEL HRISHIKESH , STEFFENS KOEN , LEMPENS HAN , LIEROP MATHIEUS , METSENAERE CHRISTOPHE , SPRUYTENBURG PATRICK , VERSTRAETE JORIS , BLOKS RUUD , MIRANDA MARCIO , JACOBS JOHANNES , LIEBREGTS PAULUS , HAM RONALD , SIMONS WILHELMUS , DIRECKS DANIEL , JANSSEN FRANCISCUS , BERKVENS PAUL , BRANDS GERT-JAN
IPC: G03F7/20
Abstract: A fluid handling structure configured to supply and confine immersion liquid to a space defined between a projection system and a facing surface facing the fluid handling structure is disclosed. The fluid handling structure includes a supply passage formed therein for the passage of fluid from outside the fluid handling structure to the space, and a thermal isolator positioned adjacent the supply passage at least partly to isolate fluid in the supply passage from a thermal load induced in the fluid handling structure.
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公开(公告)号:NL2004305A
公开(公告)日:2010-09-14
申请号:NL2004305
申请日:2010-02-26
Applicant: ASML NETHERLANDS BV
Inventor: STAVENGA MARCO , SHULEPOV SERGEI , STEFFENS KOEN , LIEROP MATHIEUS , DAVID SAMUEL , BESSEMS DAVID
Abstract: A substrate table for an immersion lithographic apparatus is disclosed having a recess, configured to receive a substrate of a given size, and a fluid extraction system, configured to extract fluid from a gap between the edge of the substrate and the edge of the recess, the fluid extraction system configured such that the rate of flow of fluid extracted from a localized section of the gap is greater than the rate of flow of fluid extracted from another section of the gap.
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