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101.
公开(公告)号:US20180136394A1
公开(公告)日:2018-05-17
申请号:US15578966
申请日:2016-06-02
Applicant: LG INNOTEK CO., LTD.
Inventor: Lee Im KANG , Chang Hyuck LEE
CPC classification number: G02B6/12011 , G01J3/0205 , G01J3/021 , G01J3/0237 , G01J3/0256 , G01J3/1895 , G01J3/2823 , G01J2003/2826 , G02B6/12 , G02B6/12002 , G02B6/12014 , G02B6/2938 , G02B2006/12164
Abstract: An optical array waveguide grating-type multiplexer and demultiplexer according to an embodiment of the present invention comprise: a first substrate, a plurality of first waveguides disposed on the first substrate to be superposed in the vertical direction, which is the thickness direction of the first substrate; a 1-1st cladding layer disposed between the first substrate and a 1-1st waveguide, which is nearest to the first substrate among the plurality of first waveguides; a 1-2nd cladding layer disposed between the plurality of first waveguides; and a 1-3rd cladding layer disposed on a 1-2nd waveguide, which is furthest from the first substrate among the plurality of first waveguides.
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公开(公告)号:US09915565B2
公开(公告)日:2018-03-13
申请号:US14438641
申请日:2013-10-24
Applicant: Applied Spectral Imaging Ltd.
Inventor: Nir Katzir
CPC classification number: G01J3/4532 , G01J3/0237 , G01J3/0297 , G01J3/2823 , G01J3/45 , G02B27/144
Abstract: A method of calibrating a spectral imaging system is disclosed. The spectral imaging system comprises an interferometer having a beam splitter and at least a first reflector and a second reflector. The method comprises: obtaining data pertaining to an interference pattern model, operating the spectral imaging system to provide an interference pattern of a received light beam, and varying a relative orientation between at least two of: the beam splitter, the first reflector and the second reflector, until the interference pattern of the input light beam substantially matches the interference pattern model.
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公开(公告)号:US09906688B2
公开(公告)日:2018-02-27
申请号:US15292885
申请日:2016-10-13
Applicant: Nobuyuki Satoh , Yasuyuki Suzuki , Masato Kobayashi , Suguru Yokozawa , Tatsuhiko Okada , Mamoru Yorimoto , Daisaku Horikawa , Yuichi Sakurada
Inventor: Nobuyuki Satoh , Yasuyuki Suzuki , Masato Kobayashi , Suguru Yokozawa , Tatsuhiko Okada , Mamoru Yorimoto , Daisaku Horikawa , Yuichi Sakurada
IPC: H04N1/00 , H04N1/60 , H04N1/028 , H04N5/225 , G06K15/02 , G01J3/02 , G01J3/06 , G01J3/52 , G01J3/46 , H04N1/41 , H04N1/50 , H04N1/034 , G06K15/10
CPC classification number: H04N1/6033 , G01J3/0208 , G01J3/0237 , G01J3/06 , G01J3/46 , G01J3/52 , G01J3/524 , G06K15/027 , G06K15/102 , G06K2215/0094 , G06K2215/101 , H04N1/00005 , H04N1/00015 , H04N1/00023 , H04N1/00034 , H04N1/00045 , H04N1/00047 , H04N1/00068 , H04N1/00087 , H04N1/00278 , H04N1/00323 , H04N1/0282 , H04N1/034 , H04N1/41 , H04N1/50 , H04N1/6008 , H04N1/6044 , H04N5/2253 , H04N5/2254 , H04N2201/0082
Abstract: An image capturing unit includes a sensor unit that image-captures a predetermined area including a subject; and a reference chart unit that is arranged in the predetermined area and captured with the subject by the sensor unit.
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公开(公告)号:US20180024004A1
公开(公告)日:2018-01-25
申请号:US15665596
申请日:2017-08-01
Applicant: DREXEL UNIVERSITY
Inventor: ADAM K. FONTECCHIO , SAMEET K. SHRIYAN , ALYSSA BELLINGHAM
IPC: G01J3/02 , G01J3/50 , G03F7/20 , G02B27/01 , G02F1/1334 , G02F1/1347 , G03F7/26 , G01J3/51
CPC classification number: G01J3/0237 , G01J3/502 , G01J3/51 , G02B27/0103 , G02F1/13342 , G02F1/13476 , G02F2203/055 , G03F7/20 , G03F7/26
Abstract: A holographic polymer dispersed liquid crystal (HPDLC) tunable filter exhibits switching times of no more than 20 microseconds. The HPDLC tunable filter can be utilized in a variety of applications. An HPDLC tunable filter stack can be utilized in a hyperspectral imaging system capable of spectrally multiplexing hyperspectral imaging data acquired while the hyperspectral imaging system is airborne. HPDLC tunable filter stacks can be utilized in high speed switchable optical shielding systems, for example as a coating for a visor or an aircraft canopy. These HPDLC tunable filter stacks can be fabricated using a spin coating apparatus and associated fabrication methods.
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公开(公告)号:US09876995B2
公开(公告)日:2018-01-23
申请号:US14959928
申请日:2015-12-04
Applicant: VisEra Technologies Company Limited
Inventor: Kuo-Feng Lin , Wu-Cheng Kuo , Chung-Hao Lin , Yu-Kun Hsiao
IPC: H04N9/04 , H04N9/083 , H04N5/369 , G01J3/02 , G01J3/36 , G01J3/18 , G02B5/18 , G02B6/293 , G01J3/12
CPC classification number: H04N9/045 , G01J3/0205 , G01J3/0224 , G01J3/0237 , G01J3/1895 , G01J3/36 , G01J2003/1204 , G01J2003/1213 , G02B5/1828 , G02B5/1842 , G02B6/29329 , G02B6/29395 , G02B6/29397 , H04N5/3696 , H04N9/083
Abstract: The present invention provides an image sensor, including: a sensor array layer formed of a plurality of normal sensor units and a plurality of spectrometer sensor units; a first guided mode resonance (GMR) structure having a first grating pitch and disposed on the sensor array layer to cover N (where N is an integer) of the spectrometer sensor units; a second GMR structure having a second grating pitch and disposed on the sensor array layer to cover N of the spectrometer sensor units; and a plurality of color filter units disposed on the sensor array layer to cover the normal sensor units.
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公开(公告)号:US20170314990A1
公开(公告)日:2017-11-02
申请号:US15652458
申请日:2017-07-18
Applicant: H2Optx Inc.
Inventor: Rudolf J. Hofmeister , Donald A. Ice , Scott W. Tandy
IPC: G01J3/42 , B01D46/00 , G01N33/15 , G01N23/00 , G01N21/65 , G01N21/3577 , G01N21/3504 , G01N21/33 , G01N21/25 , G01N21/01 , G01N1/06 , G01J3/44 , G01J3/10 , G01J3/06 , G01J3/00 , B01D46/42 , G01N35/10
CPC classification number: G01J3/42 , B01D46/0002 , B01D46/42 , G01J3/00 , G01J3/0202 , G01J3/0205 , G01J3/0237 , G01J3/0267 , G01J3/0286 , G01J3/0291 , G01J3/06 , G01J3/10 , G01J3/2823 , G01J3/44 , G01N1/06 , G01N21/01 , G01N21/25 , G01N21/253 , G01N21/33 , G01N21/3504 , G01N21/3577 , G01N21/65 , G01N23/00 , G01N33/15 , G01N35/10 , G01N2021/0106 , G01N2201/0231
Abstract: In some aspects, a device for apportioning granular samples includes a sample feeder defining a conduit, the conduit including a first opening to receive the granular samples and a second opening. The device includes a shuttle operably coupled to the sample feeder to receive the granular samples from the conduit via the second opening. The shuttle is configured to apportion the granular samples to incrementally enter a sample chamber to be analyzed. The device includes an outlet conduit fluidly coupled to the sample chamber and configured to permit the sample chamber to be evacuated.
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公开(公告)号:US20170254755A1
公开(公告)日:2017-09-07
申请号:US15061769
申请日:2016-03-04
Applicant: Applied Materials, Inc.
Inventor: Tae Seung CHO , Junghoon KIM , Soonwook JUNG , Soonam PARK , Dmitry LUBOMIRSKY
CPC classification number: G01N21/68 , G01J3/0208 , G01J3/0229 , G01J3/0237 , G01J3/0289 , G01J3/06 , G01J3/443 , G01N21/73 , G01N2201/0638 , G01N2201/068 , H01J37/10 , H01J37/32458 , H01J37/32935 , H01J37/32963 , H01J37/32972 , H01J2237/103 , H01J2237/3341
Abstract: Implementations of the present disclosure relate to a plasma chamber having an optical device for measuring emission intensity of plasma species. In one implementation, the plasma chamber includes a chamber body defining a substrate processing region therein, the chamber body having a sidewall, a viewing window disposed in the sidewall, and a plasma monitoring device coupled to the viewing window. The plasma monitoring device includes an objective lens and an aperture member having a pinhole, wherein the aperture member is movable relative to the objective lens by an actuator to adjust the focal point in the plasma using principles of optics, allowing only the light rays from the focal point in the plasma to reach the pinhole. The plasma monitoring device therefore enables an existing OES (coupled to the plasma monitoring device through an optical fiber) to monitor emission intensity of the species at any specific locations of the plasma.
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公开(公告)号:US20170248468A1
公开(公告)日:2017-08-31
申请号:US15594345
申请日:2017-05-12
Applicant: TruTag Technologies, Inc.
Inventor: Timothy Learmonth , Hod Finkelstein
CPC classification number: G01J3/26 , B82Y20/00 , G01J3/0208 , G01J3/0237 , G01J3/0259 , G01J3/0272 , G01J3/10 , G01J2003/102 , G01N21/255 , G01N21/27 , G01N2201/061 , G01N2201/0636
Abstract: A system for wide-range spectral measurement includes one or more broadband sources, an adjustable Fabry-Perot etalon, and a detector. The one or more broadband sources is to illuminate a sample, wherein the one or more broadband sources have a short broadband source coherence length. The adjustable Fabry-Perot etalon is to optically process the reflected light to extract spectral information with fine spectral resolution. The detector is to detect reflected light from the sample, wherein the reflected light is comprised of multiple narrow-band subsets of the illumination light having long coherence lengths and is optically processed using a plurality of settings for the adjustable Fabry-Perot etalon, and wherein the plurality of settings includes a separation of the Fabry-Perot etalon plates that is greater than the broadband source coherence length.
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109.
公开(公告)号:US09739663B2
公开(公告)日:2017-08-22
申请号:US14397814
申请日:2013-04-29
Inventor: Clifton R. Haider , Barry K. Gilbert , Gary S. Delp , James A. Rose
CPC classification number: G01J3/42 , A61B5/0075 , A61B5/14532 , A61B5/14552 , G01J3/0237 , G01N21/49 , G01N33/4925
Abstract: A system and method of dynamically localizing a measurement of parameter characterizing tissue sample with waves produced by spectrometric system at multiple wavelengths and detected at a fixed location of the detector of the system. The parameter is calculated based on impulse response of the sample, reference data representing characteristics of material components of the sample, and path lengths through the sample corresponding to different wavelengths. Dynamic localization is effectuated by considering different portions of a curve representing the determined parameter, and provides for the formation of a spatial map of distribution of the parameter across the sample. Additional measurement of impulse response at multiple detectors facilitates determination of change of the measured parameter across the sample as a function of time.
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公开(公告)号:US09677933B2
公开(公告)日:2017-06-13
申请号:US14010675
申请日:2013-08-27
Applicant: University of Maribor
Inventor: Denis Donlagic , Simon Pevec
CPC classification number: G01J3/0218 , G01B2290/25 , G01J3/0208 , G01J3/0224 , G01J3/0237 , G01J3/0289 , G01J3/10 , G01J3/26 , G01J3/28 , G01J3/2803 , G01J3/32 , G01J3/42 , G01J3/427 , G01J2003/102 , G01J2003/104 , G01L9/0079
Abstract: An optical system having an optical sensor with an ultra-short FP cavity, and a low-resolution optical interrogation system coupled to the optical sensor and operational to send light signals and receive light signals to and from the optical sensor is disclosed. The optical system may operate in a wavelength range including the visible and near-infrared range. Methods of interrogating optical sensors are provided, as are numerous other aspects.
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