Wavelength reference device
    11.
    发明授权

    公开(公告)号:US11662250B2

    公开(公告)日:2023-05-30

    申请号:US17112583

    申请日:2020-12-04

    CPC classification number: G01J3/0297 G01J3/0218 G01J3/0286 G01J3/45 H04B10/25

    Abstract: Described herein is a wavelength reference device comprising a housing defining an internal environment having a known temperature. A broadband optical source is disposed within the housing and configured to emit an optical signal along an optical path. The optical signal has optical power within a wavelength band of interest. An optical etalon is also disposed within the housing and positioned in the optical path to filter the optical signal to define a filtered optical signal that includes one or more reference spectral features having a known wavelength at the known temperature. The device also includes an optical output for outputting the filtered optical signal.

    PULSED LIGHT WAVEFORM MEASUREMENT METHOD AND WAVEFORM MEASUREMENT DEVICE

    公开(公告)号:US20190128741A1

    公开(公告)日:2019-05-02

    申请号:US16088875

    申请日:2017-03-15

    Abstract: In a waveform measurement method, first, initial pulsed light is spatially dispersed for respective wavelengths. Next, the initial pulsed light is input to a polarization dependent type SLM in a state where a polarization plane is inclined with respect to a modulation axis direction, and a phase spectrum of a first polarization component of the initial pulsed light along the modulation axis direction is modulated, to cause a time difference between first pulsed light Lp1 including the first polarization component and second pulsed light Lp2 including a second polarization component orthogonal to the first polarization component. After combining the wavelength components, an object is irradiated with the pulsed light Lp1 and the pulsed light Lp2, and light generated in the object is detected. The above detection operation is performed while changing the time difference, and a temporal waveform of the pulsed light Lp1 is obtained.

    SPECTROSCOPIC ANALYSIS
    15.
    发明申请

    公开(公告)号:US20180313691A1

    公开(公告)日:2018-11-01

    申请号:US15921517

    申请日:2018-03-14

    Abstract: A method and analyser for identifying or verifying or otherwise characterising a sample comprising: using or having an electromagnetic radiation source for emitting electromagnetic radiation in at least one beam at a sample, the electromagnetic radiation comprising at least two different wavelengths, using or having a sample detector that detects affected electromagnetic radiation resulting from the emitted electromagnetic radiation affected by the sample and provides output representing the detected affected radiation, and using or having a processor for determining sample coefficients from the output, and identifying or verifying or otherwise characterising the sample using the sample coefficients and training coefficients determined from training samples, wherein the coefficients reduce sensitivity to a sample retainer variation and/or are independent of concentration.

    RADIATION MEASURING SYSTEMS AND METHODS THEREOF

    公开(公告)号:US20180188109A1

    公开(公告)日:2018-07-05

    申请号:US15907359

    申请日:2018-02-28

    Abstract: A radiation measuring device for measuring electromagnetic radiation originating from an external source. The radiation measuring device includes, a spectrometer, a pyranometer, a pyrgeometer, a diffuser, and a control unit. The spectrometer and a pyranometer are positioned in a sensor zone of a housing of the radiation measuring device. The spectrometer measures visible shortwave radiation and near-infrared shortwave radiation received at the sensor zone. The pyranometer measures shortwave radiation received at the sensor zone. The pyrgeometer is positioned in another sensor zone of the housing and measures longwave radiation received at the other sensor zone. The control unit receives radiation measurements from the spectrometer, pyranometer, and pyrgeometer. A corrected amount of radiation received at the sensor zones of the radiation measuring device is determined from the received radiation measurements. Other embodiments are described and claimed.

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