Abstract:
There is provided a semiconductor device low in profile, having high heat radiation property, A binding electrode, and draw-out electrodes are formed integrally with the top of an insulting film made out of an aramid non-woven fabric epoxy film, a semiconductor element is attached onto the binding electrode through the intermediary of a solder layer, electrodes provided on the upper surface of the semiconductor element are bonded to the draw-out electrodes by a gold wire, respectively, and all those elements are encapsulated with a synthetic resin. On the other hand, at portions of the insulting film, corresponding to the underside of the binding electrode, and the undersides of the draw-out electrodes, respectively, there is provided an opening having an optional area smaller than that for each of the undersides described, and the draw-out electrodes are bonded to bumps, respectively, through the respective openings, while the lower end face of the binding electrode is exposed to the atmosphere.
Abstract:
Provided is a reliable optical pick-up which can prevent deterioration of a performance of a component, shortening of a service life or malfunctioning due to heat generation of an laser driver IC, wherein a metallic pattern is provided on a flexible printed board, having an area wider than the external shape of the laser driver IC and having an exposed outer surface, and made of the same material as that of a wiring pattern. It is preferable to bent the flexible printed board in a mounting part for the laser driver IC so that the metallic pattern is faced to and superposed with a surface of the flexible printed board on the side remote from the surface on which the laser driver IC is mounted.
Abstract:
A head gimbal assembly for a disk drive. The head gimbal assembly includes a trace suspension assembly backing layer including a gimbal. The trace suspension assembly backing layer is formed of a conductive material having a first oxidation rate. The head gimbal assembly further includes a gimbal conductive layer disposed upon the gimbal and formed of a conductive material having a second oxidation rate lower than the first oxidation rate. The head gimbal assembly further includes a slider supported by the gimbal. The head gimbal assembly further includes a conductive compound disposed between the gimbal conductive layer and the slider for electrically grounding the slider to the trace suspension assembly backing layer.
Abstract:
A method for shielding one or more circuits (21, 21′) of a printed circuit board includes depositing a layer of dielectric material (43) over a printed circuit board substrate (22) and the printed circuits (21, 21′), creating a trench-like opening (44) in the dielectric layer (43) such that the trench-like opening (44) surrounds the one or more circuits (21, 21′) to be shielded, depositing a layer of metal (27) over the layer of dielectric material (43) and within the trench-like openings (44), creating a solder pad (24) at each location where an electrical connection is to be made to the printed circuits (21, 21′) by removing a border of the metal layer (27) surrounding each connection location, and providing a microvia (25) through each solder pad (24) penetrating the dielectric layer (43) and terminating at the metal of the printed circuit (21, 21′).
Abstract:
A printed circuit board on which a connector is mounted includes a conductive layer, insulating layers, and a supporting member. A part of the conductive layer is exposed on a top surface of the PCB in order to form a connecting pad portion for connecting the connector. The insulating layers are disposed proximate to both sides of the conductive layer. The supporting member is connected to the conductive layer and covers a surface of a hole formed by opening an orifice through the conductive layer and the insulating layer. The hole is disposed adjacent to the connecting pad portion.
Abstract:
A semiconductor device provided with a shallow metal basin having a flange outwardly extending from the top edge of the side wall of the shallow metal basin, to receive a semiconductor device chip having one or more semiconductor device elements disposed therein and one or more bonding pads arranged thereon, an insulator frame having one or more external terminals arranged thereon, the external terminals being connected with the bonding pads, and the insulator frame being arranged on the flange of the shallow metal basin, and a plastic layer molded to cover the semiconductor device chip, resultantly realizing a semiconductor device packaged in a chip scale package of which the production procedure is simplified and the heat dissipation efficiency and the integration are remarkably improved.
Abstract:
A high-frequency package comprises a dielectric substrate, on an upper face of which a mounting portion of a high-frequency circuit component is formed, a first line conductor formed on the upper face for transmitting high-frequency signals, a first coplanar grounding conductor, a second line conductor formed on a lower face, a second coplanar grounding conductor, a through conductor formed inside for connecting the first and second line conductors, a grounding through conductor connecting the first and second coplanar grounding conductors, a metal terminal bonded to the second line conductor, and grounding metal terminals bonded to the second coplanar grounding conductor, wherein a gap between the grounding metal terminals is equal to or less than ½ of a wavelength of high-frequency signals.
Abstract:
An electronic component includes an organic interposer (160, 460, 560, 660, 760, 860, 960), a semiconductor chip (220) mounted over the organic interposer, copper pads (250, 751, 851) under the organic interposer, a solder attachment (110, 510, 610, 910) between certain ones of the copper pads, and solder interconnects (120, 420) between certain other ones of the copper pads and located around an outer perimeter (111, 511, 911) of the solder attachment. The solder attachment is placed at locations within the electronic component that experience the greatest stress, which may include, for example, locations adjacent to at least a portion of a perimeter (221) of the semiconductor chip. In one embodiment, a surface area of the solder attachment is larger than a surface area of each one of the solder interconnects. In the same or another embodiment, the electronic component includes multiple solder attachments.
Abstract:
An electrical circuit apparatus (300) that includes: a substrate (330) having a ground layer (336), at least one device aperture (332), and at least one solder aperture (334); a heat sink (310); and an adhesive layer (320) for mechanically coupling the heat sink to the ground layer of the substrate such that at least a portion of the substrate device aperture overlaps the heat sink, the adhesive layer having at least one device aperture and at least one solder aperture, wherein aligning the at least one substrate solder aperture with the at least one adhesive layer solder aperture and aligning the at least one substrate device aperture with the at least one adhesive layer device aperture enables solder wetting in a predetermined area between the heat sink and the ground layer of the substrate.
Abstract:
To mount a TSOP on an interposer substrate, leads provided to the TSOP are joined to pads of the interposer substrate by a thermosetting conductive resin, and the TSOP exclusive of the leads is joined to ground layers formed in the interposer substrate by a thermosetting conductive resin. The interposer substrates with the TSOPs mounted thereon are stacked in eight layers in such a manner that the TSOPs face downward. Then, leads of the upper interposer substrate are joined to pads formed in the rear face of the lower interposer substrate by a thermosetting conductive resin, so that the interposer substrates adjacent in a vertical direction are connected.