Abstract:
PURPOSE: A linearity improved MDAC(Multiplying Digital to Analog Converter) is provided to secure linearity regardless of the error factors according to processes. CONSTITUTION: A linearity improved MDAC is provided with a capacitor array(30) having a plurality of unit capacitors(C1,C2,C3,C4) and an amplifying part(31) for outputting an analog signal by forming a feed-back loop with the unit capacitors. At this time, the unit capacitors selectively form the feed-back loop with the amplifying part according to an inputted digital code. Preferably, the linearity improved MDAC further includes a switching part for controlling the feed-back of the capacitor array according to the digital code.
Abstract:
PURPOSE: A current output type digital/analog converter is provided, which reduces a differential linearity of an output current value by increasing a channel width of a transistor included in a 16 times or 32 times current source. CONSTITUTION: According to a current output type digital/analog converter comprising units outputting current value respectively and being connected to a common port, each unit comprises the first and the second current sources(192,196) outputting an upper data bit group and including a plurality of serially connected transistors, and the third current source(194) outputting a lower data bit group and including at least one transistor. At least one of the transistors of the first and the second current source has a different channel width from other transistors.
Abstract:
PURPOSE: A digital-analog converter is provided which minimizes differential non-linearity error and integral non-linearity error. CONSTITUTION: A current segment type digital-analog converter includes a decoder, a selection control circuit, a current source circuit and a current compensation control circuit. The selection control circuit(110) generates signals for selecting current sources according to the output signal of the decoder. A current cell array(120) is configured of LSB binary current cells, MSB segment current cells and switch paris corresponding to the current cells. Odd-numbered switches(S1,S3,S5,S9,Sn-1) among the switch paris are connected to the current compensation control circuit(130) in common. The current compensation control circuit measures current provided by the selected current cells to determine the amount of current to be compensated. The output of the current compensation circuit enters the segment current cells to compensate for current.
Abstract:
디지털 아날로그 컨버터의 정적 선형성 향상을 위한 분할 계층적 대칭 스위칭 기법 및 그를 위한 장치에 관한 것이다. 더욱 상세하게는, 시스템 에러의 대칭성을 이용하여 스위칭 순서를 제어하여 시스템 에러의 크기를 줄일 수 있는 디지털 아날로그 컨버터의 정적 선형성 향상을 위한 분할 계층적 대칭 스위칭 기법 및 그를 위한 장치에 관한 것이다.
Abstract:
PURPOSE: A comparator, an analog-to-digital (A/D) converter, a ramp signal slope compensating circuit, a complementary metal-oxide semiconductor (CMOS) image sensor containing the circuit, and a ramp signal slope compensating method in accordance with the above are provided to prevent the slope ratio of a fine ramp signal to a coarse ramp signal from being distorted due to the slope change of the fine ramp signal and to improve linearity of A/D conversion. CONSTITUTION: An A/D converter (10) includes an amplifier, a comparator (12), a first memory part (16), and a second memory part (18). The amplifier receives a pixel voltage, a reference voltage, a fine ramp voltage, and a coarse ramp voltage. The comparator is equipped with a switch, which is connected between a coarse ramp voltage input terminal receiving coarse ramp voltage input and the amplifier, and a capacitor. One end of the capacitor is connected between the switch and the amplifier, and the other end is connected to a ground voltage. The first memory part stores the most significant bit among 1 least significant bit (LSB) for the coarse ramp voltage. The second memory part stores the least significant bit among 1 LSB for the coarse ramp voltage. [Reference numerals] (12) Comparator; (14) Sink block part; (16) First memory part; (18) Second memory part; (21) Fine ramp generator; (22) Coarse ramp generator; (30) N bit counter
Abstract:
A multi-bit sigma delta modulator with one DAC capacitor and a DAC(Digital-Analog Converter) for the multi-bit sigma delta modulator are provided to increase the number of output levels of the DAC by expanding the DAC capacitor. A multi-bit sigma delta modulator includes an operation amplifier(21), a sampling capacitor(22), an integration capacitor(23), a DAC capacitor(24), switches(25,26,27), and a switching controller(28). The sampling capacitor(22) is connected between the first switch(26) and an input terminal of the operation amplifier(21). The first switch(26) is connected between the input terminal of the operation amplifier(21) and a ground. The second switch(27) is connected between an input(IN) and the sampling capacitor(22). The integration capacitor(23) connects an output(OUT) and the input terminal of the operation amplifier(21) to form a negative feedback loop. The DAC capacitor(24) is connected between the DAC switch(25) and the input terminal of the operation amplifier(21). The DAC switch(25) connects reference voltages(Vrefp,Vcm,Vrefn) to the DAC capacitor(24) for a DAC of a switched capacitor structure to perform a desired operation. The switching controller(28) controls operation of the DAC switch(25) by generating a control signal according to an ADC output code of a modulator.
Abstract:
A dynamic linearization digital-to-analog converter is provided to obtain high dynamic linearity by dynamically compensating deterioration of linearity due to mismatch caused by spatial arrangement of unit current sources. A dynamic linearization digital-to-analog converter includes a decoder(12), a current switch driver(14), and a random selecting switch(13). The decoder(12) selects a current source(15) from a digital input. The current switch driver(14) drives a current switch of the current source(15). The random selecting switch(13) is located between the decoder(12) and the current switch driver(14), and resets connection between an output of the decoder(12) and an input of the current switch driver(14) randomly every clock.
Abstract:
본 발명은 센서에 의해 측정된 물리적 신호의 크기를 원하는 측정값으로 매핑하는 방법에 있어서 물리적 신호의 크기를 디지털 값으로 변환하는 아날로그 디지털 컨버터의 게인 편차에 의한 에러를 보상하는 캘리브레이션 방법에 관한 것이다. 본 발명에 따른 ADC의 캘리브레이션 방법은 ADC를 게인의 크기에 따라 표준의 게인을 가지는 표준 게인 그룹, 표준보다 높은 게인을 가지는 하이 게인 그룹, 그리고 표준보다 낮은 게인을 가지는 로우 게인 그룹들로 분류하는 과정; 상기 분류된 그룹들 각각에 상당하는 변환식들을 설정하는 과정; ADC에 의해 아날로그값을 디지털 값으로 변환하고, 디지털 변환된 값을 ADC가 속한 그룹에 해당하는 변환식에 의해 원하는 측정값으로 매핑하는 과정; 및 매핑된 측정값을 상기 ADC가 속한 그룹을 참조하여 캘리브레이션하는 과정을 포함하는 것을 특징으로 한다. 본 발명에 따른 ADC의 캘리브레이션 방법은 ADC의 게인 편차에 의한 측정값의 오류를 보상함으로써 정확한 측정값을 얻게 하는 효과를 가진다.
Abstract:
PURPOSE: A D/A(Digital to Analog) transformer is provided to reduce a linear error due to discordance between resistors and an occupied area by decreasing the number of resistors necessary for generating an analog level in half. CONSTITUTION: A D/A transformer comprises a reference current source(Iref) for deciding a voltage level of resistors(R) arrayed in series, a reference voltage source(Vcom) for supplying a center voltage of an output signal of the D/A transformer, switches(SW1-SW6) for varying a voltage level by changing a flow direction of a current flowing to the arrayed resistors(R), a decoder(10) for selecting an output level by decoding a digital signal, and a buffer(20) for supplying an analog signal by buffering the analog signal selected from the decoder(10).