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公开(公告)号:NL2012052A
公开(公告)日:2014-08-04
申请号:NL2012052
申请日:2014-01-07
Applicant: ASML NETHERLANDS BV
Inventor: SMEETS DRIES , BLEEKER ARNO , LEE CHRIS , JAGER PIETER , MULDER HEINE , PELLENS RUDY
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公开(公告)号:NL2006254A
公开(公告)日:2011-08-24
申请号:NL2006254
申请日:2011-02-18
Applicant: ASML NETHERLANDS BV
Inventor: ONVLEE JOHANNES , JAGER PIETER , ZWET ERWIN
IPC: G03F7/20
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公开(公告)号:NL2010761A
公开(公告)日:2013-12-04
申请号:NL2010761
申请日:2013-05-07
Applicant: ASML NETHERLANDS BV
Inventor: MULDER HEINE , JAGER PIETER
IPC: G03F7/20
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4.
公开(公告)号:NL2009239A
公开(公告)日:2013-03-04
申请号:NL2009239
申请日:2012-07-27
Applicant: ASML NETHERLANDS BV
Inventor: JAGER PIETER , BLEEKER ARNO , BOEF ARIE , LOOPSTRA ERIK , PANDEY NITESH
IPC: G03F7/20
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公开(公告)号:NL2006262A
公开(公告)日:2011-08-24
申请号:NL2006262
申请日:2011-02-18
Applicant: ASML NETHERLANDS BV
Inventor: JAGER PIETER , ONVLEE JOHANNES , ZWET ERWIN
IPC: G03F7/20
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公开(公告)号:NL2006256A
公开(公告)日:2011-08-24
申请号:NL2006256
申请日:2011-02-18
Applicant: ASML NETHERLANDS BV
Inventor: ZWET ERWIN , JAGER PIETER , ONVLEE JOHANNES , FRITZ ERIK
IPC: G03F7/20
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公开(公告)号:NL2006255A
公开(公告)日:2011-08-24
申请号:NL2006255
申请日:2011-02-18
Applicant: ASML NETHERLANDS BV
Inventor: ZWET ERWIN , JAGER PIETER , ONVLEE JOHANNES , FRITZ ERIK
IPC: G03F7/20
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公开(公告)号:NL2013663A
公开(公告)日:2015-05-07
申请号:NL2013663
申请日:2014-10-22
Applicant: ASML NETHERLANDS BV
Inventor: AKKERMANS JOHANNES , AMENT LUCAS , BANINE VADIM , COENEN TEIS JOHAN , JAGER PIETER , VRIES GOSSE , FRIJNS OLAV , GRIMMINCK LEONARDUS , KATALENIC ANDELKO , LOOPSTRA ERIK , LUITEN OTGER , NIKIPELOV ANDREY
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公开(公告)号:NL2013518A
公开(公告)日:2015-03-30
申请号:NL2013518
申请日:2014-09-24
Applicant: ASML NETHERLANDS BV
Inventor: BANINE VADIM , BARTRAIJ PETRUS , AMENT LUCAS , JAGER PIETER , VRIES GOSSE , DONKER RILPHO , ENGELEN WOUTER , FRIJNS OLAV , GRIMMINCK LEONARDUS , KATALENIC ANDELKO , LOOPSTRA ERIK , NIENHUYS HAN-KWANG , NIKIPELOV ANDREY , RENKENS MICHAEL , GORKOM RAMON , JANSSEN FRANCISCUS , KRUIZINGA BORGERT
Abstract: A delivery system for use within a lithographic system. The beam delivery system comprises optical elements arranged to receive a radiation beam from a radiation source and to reflect portions of radiation along one or more directions to form a one or more branch radiation beams for provision to one or more tools.
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公开(公告)号:NL2013014A
公开(公告)日:2014-12-22
申请号:NL2013014
申请日:2014-06-17
Applicant: ASML NETHERLANDS BV
Inventor: NIKIPELOV ANDREY , FRIJNS OLAV , VRIES GOSSE , LOOPSTRA ERIK , BANINE VADIM , JAGER PIETER , DONKER RILPHO , NIENHUYS HAN-KWANG , KRUIZINGA BORGERT , ENGELEN WOUTER , LUITEN OTGER , AKKERMANS JOHANNES , GRIMMINCK LEONARDUS , LITVINENKO VLADIMIR
IPC: G03F7/20
Abstract: A method of patterning lithographic substrates, the method comprising using a free electron laser to generate EUV radiation and delivering the EUV radiation to a lithographic apparatus which projects the EUV radiation onto lithographic substrates, wherein the method further comprises reducing fluctuations in the power of EUV radiation delivered to the lithographic substrates by using a feedback-based control loop to monitor the free electron laser and adjust operation of the free electron laser accordingly.
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