INSPECTION METHOD AND APPARATUS
    1.
    发明申请
    INSPECTION METHOD AND APPARATUS 审中-公开
    检验方法和装置

    公开(公告)号:WO2010049348A3

    公开(公告)日:2011-03-17

    申请号:PCT/EP2009063918

    申请日:2009-10-22

    CPC classification number: G03F7/70625

    Abstract: In a method for determining one or more properties of a substrate, scatterometry spectra can be measured from one or more targets on the substrate. Reconstructions of each of said spectra can be performed to derive one or more values for the property of the substrate, by comparing representations of each of the measured spectra with one or more modeled representations of spectra calculated using variable parameter values. At least one parameter in the reconstruction for each spectrum can be linked to the value of the parameter used in the reconstruction for a different spectrum.

    Abstract translation: 在确定衬底的一个或多个特性的方法中,可以从衬底上的一个或多个靶测量散射光谱。 可以通过将每个测量光谱的表示与使用可变参数值计算的光谱的一个或多个建模表示进行比较,来执行每个所述光谱的重建以导出衬底性质的一个或多个值。 每个频谱的重建中至少有一个参数可以链接到在不同频谱的重构中使用的参数的值。

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