Imaging method and apparatus
    101.
    发明授权

    公开(公告)号:US10302491B2

    公开(公告)日:2019-05-28

    申请号:US15507502

    申请日:2015-08-28

    Abstract: Apparatus for hyperspectral imaging, the apparatus including input optics that receive radiation reflected or radiated from a scene, a spatial modulator that spatially samples radiation received from the input optics to generate spatially sampled radiation, a spectral modulator that spectrally samples the spatially sampled radiation received from the spatial modulator to generate spectrally sampled radiation, a sensor that senses spectrally sampled radiation received from the spectral modulator and generates a corresponding output signal and at least one electronic processing device that controls the spatial and spectral modulators to cause spatial and spectral sampling to be performed, receives output signals and processes the output signals in accordance with performed spatial and spectral sampling to generate a hyperspectral image.

    Three-mirror anastigmat having rectangular aperture stop

    公开(公告)号:US10191275B1

    公开(公告)日:2019-01-29

    申请号:US15643158

    申请日:2017-07-06

    Abstract: An off-axis optical system having a rectangular aperture stop to control rays of incident electromagnetic radiation passing through the optical system along an optical path is provided. The optical system includes one or more optical surfaces along the optical path, each surface being configured to change a direction of each ray on the surface based on a location of the ray relative to the surface. At least one of the surfaces is conjugate to and has the same shape as the rectangular aperture stop. In one embodiment, each optical surface is shaped to avoid vignetting the rays. In one embodiment, the optical system is a three-mirror anastigmat (TMA) and includes a concave primary mirror to collect and focus the electromagnetic radiation; a curved secondary mirror to reflect the electromagnetic radiation focused by the primary mirror; and a concave tertiary mirror to focus the electromagnetic radiation reflected by the secondary mirror.

    ATR REFLECTION ELEMENT AND ATR SPECTROSCOPY METHOD

    公开(公告)号:US20190011364A1

    公开(公告)日:2019-01-10

    申请号:US15760005

    申请日:2016-09-08

    Applicant: Lorenz SYKORA

    Inventor: Lorenz SYKORA

    Abstract: An ATR reflection element includes a main body with a first effective refractive index n1, a transmission layer which comprises a first layer boundary, and an opposite second layer boundary. The transmission layer takes up a fluid by way of the second layer boundary, wherein the transmission layer adjoins the main body. The boundary between the transmission layer and the main body is formed by the first layer boundary, wherein the transmission layer at the second layer boundary has a second effective refractive index n2. The first effective refractive index n1 is greater than the second effective refractive index n2 and the second effective refractive index n2 is greater than 1, wherein the first effective refractive index n1 and the second effective refractive index n2 are determined in each case in a vacuum at 25° C. at the IR wavelength λATR, wherein λATR is selected from the wavelength range between 2 μm and 20 μm. Furthermore, the disclosure relates to an ATR spectrometer comprising said ATR reflection element, and an ATR spectroscopy method.

    Total reflection spectroscopic measurement device and total reflection spectroscopic measurement method

    公开(公告)号:US10048129B2

    公开(公告)日:2018-08-14

    申请号:US15597329

    申请日:2017-05-17

    Inventor: Yoichi Kawada

    Abstract: A total reflection spectroscopic measurement device includes a terahertz wave generation unit, an internal total reflection prism, a detection unit configured to detect the terahertz wave, an electric field vector measurement unit configured to measure an electric field vector of the terahertz wave, and an analysis unit configured to acquire information about an optical constant of the object to be measured. Proportions of S polarization component and P polarization component of the terahertz wave are constant. The analysis unit acquires the information about the optical constant on the basis of a ratio between S polarization component and P polarization component of the measured electric field vector when the object is not arranged on the total reflection surface and a ratio between S polarization component and P polarization component of the measured electric field vector when the object is arranged on the total reflection surface.

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