Abstract:
In an electron beam-generating system including an electron-emitting cathode, a beam focusing electrode, and an anode electrode for accelerating the emitted electrons, the magnetic fields for deflecting the beam to material to be heated and for periodically deflecting the focal spot of the beam on the material are produced by a heavy current conductor, that is, a conductor carrying a high current, arranged in proximity to the curved path of the deflected electron beam and extending perpendicular to the plane of deflection of the electron beam. The anode electrode may be formed with an opening for the passage of the electron beam, and the heavy current conductor is arranged in the proximity of the opening and parallel to the latter. The heavy current conductor may be designed as an edge of a slot-shaped opening, and may comprise a plurality of individual conductors.
Abstract:
This invention relates to an electron beam generating source comprising a cathode and anode, the opposite and facing surfaces of the cathode and anode being flat and parallel so that the electrostatic field formed between the two electrodes is parallel and perpendicular to the surfaces of both electrodes, thereby preventing the electrons emitted from the electron emitter from being affected by lens effects, for example, spherical aberration.
Abstract:
A device for heating a metallic product of great length and small thickness, particularly a wire or sheet metal, by means of a flow of electrons comprises a container in which there is maintained a permanent vacuum of 10 3 to 10 5 torr. The container contains the metallic product to be heated, a means for the production of electrons which, by the action of an electrical field, are hurled onto the product, and reflecting means for returning toward the product any electrons which have escaped from said field.
Abstract:
A storage system for the mass recording and readout of digital data with ultra high resolution. An electron beam structure is provided for forming a beam of extremely small focused spot diameter, on the order of 0.1 microns, and high current density capability, on the order of 1,000 amperes per sq. cm., which records data by scanning over defined areas of the storage medium surface and micromachining elemental portions of said medium as a function of beam modulation. Readout may be subsequently accomplished by similarly scanning the beam at reduced power density and detecting electrons that have been transmitted by or reflected from the storage medium.
Abstract:
Electron beam heating apparatus for heating a large area workpiece in a vacuumized area by electron bombardment, including means for forming and beaming a plurality of ribbon-shaped electron beams which combine into a single beam of uniform current density and large cross-section for heating the workpiece.
Abstract:
An apparatus for generating an electrostatic space charge in a rotation-symmetrical magnetic field, in which an electron beam from an electron gun which is arranged laterally on the field space generates the space charge in the field space. The electron beam may be adjusted by mechanical adjustment of the gun and also by means of the potential of a conducting sleeve in the magnetic field. By means of this potential, it is also possible to adjust the ratio between the contributions to the space charge which are due to primary electrons and to secondary electrons produced by the primary electrons in a residual gas in the field space.
Abstract:
The electron beam B is projected on work W, usually in the atmosphere outside of the chamber where the beam is generated, through a plurality of aperture members 11, 13, 15, 17. The holes in the aperture members are as small as practicable to suppress the feedback of air into the chamber. The beam B is focussed in regions 85 and 87 (FIG. 3) with reference to the aperture members so as to preclude damage to the members by impingement of the beam on the walls of the holes through which the beam passes. The beam current is varied in dependence on the demands of the work but the focus of the beam is maintained by bias resistor 115 (FIG. 1), without damage to the aperture member, by instantaneous change in the bias impressed on the beam by a control electrode G.
Abstract:
The present disclosure addresses the problem of providing an electron gun that can directly monitor an intensity of an electron beam emitted from a photocathode using only the configuration provided to the electron gun, an electron beam applicator equipped with an electron gun, and a method for controlling an electron gun. The aforementioned problem can be solved by an electron gun comprising a light source, a photocathode that emits an electron beam in response to receiving light from the light source, an anode, an electron-beam-shielding member with which it is possible to shield part of the electron beam, and a measurement unit that measures the intensity of the electron beam emitted from the photocathode using a measurement electron beam shielded by the electron-beam-shielding member.
Abstract:
Provided is an ion beam processing apparatus including an ion generation chamber, a processing chamber, and electrodes to form an ion beam by extracting ions generated in the ion generation chamber to the processing chamber. The electrodes includes a first electrode disposed close to the ion generation chamber and provided with an ion passage hole to allow passage of the ions, and a second electrode disposed adjacent to the first electrode and closer to the processing chamber than the first electrode is, and provided with an ion passage hole to allow passage of the ions. The apparatus also includes a power unit which applies different electric potentials to the first electrode and the second electrode, respectively, so as to accelerate the ions generated by an ion generator in the ion generation chamber. A material of the first electrode is different from a material of the second electrode.