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    Image forming apparatus and dirtiness detection method
    262.
    发明授权
    Image forming apparatus and dirtiness detection method 有权
    图像形成装置和污垢检测方法

    公开(公告)号：US09522538B2

    公开(公告)日：2016-12-20

    申请号：US15061136

    申请日：2016-03-04

    Applicant: Seiko Epson Corporation

    Inventor： Ryohei Kuri

    IPC: B41J2/165

    CPC classification number: B41J2/165 ,  G01J3/0205 ,  G01J3/0278 ,  G01J3/0297 ,  G01J3/524

    Abstract: A printer includes a printing section that ejects an ink, and a spectrometer that disperses incident light. The spectrometer includes a window section that transmits the light, an optical filter device, and a light receiving section. The optical filter device includes a variable wavelength interference filter as a dispersing element that disperses light transmitted by the window section. The light receiving section receives the light which is dispersed by the variable wavelength interference filter. A dirtiness of the window section is detected based on measured values corresponding to each of a plurality of wavelengths obtained by spectrally measuring light from a reference object, and reference values corresponding to each of the plurality of wavelengths.

    Abstract translation: 打印机包括喷射墨的打印部分和分散入射光的光谱仪。 光谱仪包括透光的窗口部分，滤光器装置和光接收部分。 滤光器装置包括可变波长干涉滤光器，作为分散由窗口部分透射的光的分散元件。 光接收部接收由可变波长干涉滤光器分散的光。 基于通过光谱测量来自参考对象的光获得的多个波长中的每个波长的测量值，以及对应于多个波长中的每一个的参考值，来检测窗口部分的灰尘。

    METHODS FOR COLLECTION, DARK CORRECTION, AND REPORTING OF SPECTRA FROM ARRAY DETECTOR SPECTROMETERS
    264.
    发明申请
    METHODS FOR COLLECTION, DARK CORRECTION, AND REPORTING OF SPECTRA FROM ARRAY DETECTOR SPECTROMETERS 审中-公开

    公开(公告)号：US20160356647A1

    公开(公告)日：2016-12-08

    申请号：US14950598

    申请日：2015-11-24

    Applicant: Kaiser Optical Systems Inc.

    Inventor： Patrick Wiegand ,  James M. Tedesco ,  Joseph B. Slater ,  Francis Esmonde-White ,  Darren Schipper

    IPC: G01J3/02 ,  G01J3/44

    CPC classification number: G01J3/0297 ,  G01J3/027 ,  G01J3/28 ,  G01J3/44 ,  G01N21/65

    Abstract: Methods and systems for spectrometer dark correction are described which achieve more stable baselines, especially towards the edges where intensity correction magnifies any non-zero results of dark subtraction, and changes in dark current due to changes in temperature of the camera window frame are typically more pronounced. The resulting induced curvature of the baseline makes quantitation difficult in these regions. Use of the invention may provide metrics for the identification of system failure states such as loss of camera vacuum seal, drift in the temperature stabilization, and light leaks. In system aspects of the invention, a processor receives signals from a light detector in the spectrometer and executes software programs to calculate spectral responses, sum or average results, and perform other operations necessary to carry out the disclosed methods. In most preferred embodiments, the light signals received from a sample are used for Raman analysis.

    INFRARED SPECTROMETERS
    266.
    发明申请
    INFRARED SPECTROMETERS 审中-公开
    红外光谱仪

    公开(公告)号：US20160327474A1

    公开(公告)日：2016-11-10

    申请号：US14705203

    申请日：2015-05-06

    Applicant: Goodrich Corporation

    Inventor： Christopher Gittins ,  John A. Tejada

    IPC: G01N21/35 ,  G01N21/39 ,  G01N21/27

    CPC classification number: G01N21/35 ,  G01J3/02 ,  G01J3/0208 ,  G01J3/0229 ,  G01J3/0297 ,  G01J3/18 ,  G01J3/2803 ,  G01N21/274 ,  G01N21/39

    Abstract: An infrared spectrometer includes an entrance slit and a collimating optical element aligned with the entrance slit. A diffractive optical element is optically coupled to the collimating optical element. A focusing optical element optically coupled to the diffractive optical element. A detector array is optically coupled to the focusing optical element. A linear variable filter (LVF) is optically coupled between the focusing optical element and the detector array. A method for filtering a baseline signal emitted from spectrometer components in the infrared spectrometer assembly includes transmitting radiation into a spectrometer and passing the radiation through the LVF to filter the baseline signal being emitted from spectrometer components. The method includes receiving the radiation in the detector array.

    Abstract translation: 红外光谱仪包括入口狭缝和与入口狭缝对准的准直光学元件。 衍射光学元件光学耦合到准直光学元件。 光学耦合到衍射光学元件的聚焦光学元件。 检测器阵列光学耦合到聚焦光学元件。 线性可变滤波器（LVF）光学耦合在聚焦光学元件和检测器阵列之间。 用于过滤在红外光谱仪组件中从光谱仪组件发射的基线信号的方法包括将辐射传输到光谱仪中并使辐射通过LVF以过滤从光谱仪部件发射的基线信号。 该方法包括在检测器阵列中接收辐射。

    MULTI-CHANNEL UP-CONVERSION INFRARED SPECTROMETER AND METHOD OF DETECTING A SPECTRAL DISTRIBUTION OF LIGHT
    267.
    发明申请
    MULTI-CHANNEL UP-CONVERSION INFRARED SPECTROMETER AND METHOD OF DETECTING A SPECTRAL DISTRIBUTION OF LIGHT 有权
    多通道上变换红外光谱仪和检测光谱分布的方法

    公开(公告)号：US20160153834A1

    公开(公告)日：2016-06-02

    申请号：US14900329

    申请日：2014-07-09

    Applicant: DANMARKS TEKNISKE UNIVERSITET

    Inventor： Peter Tidemand-Lichtenberg ,  Jeppe Seidelin Dam ,  Christian Pedersen

    IPC: G01J3/02 ,  G01J3/28

    CPC classification number: G01J3/0297 ,  G01J3/0294 ,  G01J3/08 ,  G01J3/26 ,  G01J3/2803 ,  G01J3/2823 ,  G01J3/443 ,  G01J2003/1291

    Abstract: A multi-channel infrared spectrometer for detecting an infrared spectrum of light received from an object. The spectrometer comprises a wavelength converter system comprising a nonlinear material and having an input side and an output side. The wavelength converter system comprises at least a first up-conversion channel and a second up-conversion channel, and is arranged such that light traversing the wavelength converter system at different angles in the nonlinear material is imaged into different positions in an image plane. The first up-conversion channel is configurable for phase-matching infrared light in a first input wavelength range incident on the first side and light in a first output wavelength range output on the second side, and correspondingly, the second up-conversion channel is configurable for phase-matching infrared light in a second input wavelength range incident on the first side into light in a second output wavelength range output on the second side. The spectrometer further comprises a demultiplexer configured for demultiplexing light in the first up-conversion channel and light in the second up-conversion channel. The demultiplexer is located on the first side or the second side of the wavelength converter system. Finally, the spectrometer comprises a spatially resolved detector arranged in the image plane to detect light in the first output wavelength range and second output wavelength range output of the wavelength converter system.

    Abstract translation: 一种用于检测从物体接收的光的红外光谱的多通道红外光谱仪。 光谱仪包括一个波长转换器系统，它包括非线性材料并具有一个输入侧和一个输出侧。 波长转换器系统至少包括第一上变换通道和第二上转换通道，并且被布置成使得在非线性材料中以不同角度穿过波长转换器系统的光被成像到图像平面中的不同位置。 第一上转换通道可配置用于在入射到第一侧的第一输入波长范围内的相位匹配红外光和在第二侧输出的第一输出波长范围内的光，并且相应地，第二上转换通道可配置 用于将入射在第一侧的第二输入波长范围内的红外光相互匹配成在第二侧输出的第二输出波长范围内的光。 光谱仪还包括解复用器，其被配置用于对第一上转换通道中的光进行解复用和第二上转换通道中的光。 解复用器位于波长转换器系统的第一侧或第二侧。 最后，光谱仪包括布置在图像平面中的空间分辨检测器，以检测波长转换器系统的第一输出波长范围和第二输出波长范围输出中的光。

    Spectroscopic analysis
    268.
    发明授权
    Spectroscopic analysis 有权
    光谱分析

    公开(公告)号：US09354165B2

    公开(公告)日：2016-05-31

    申请号：US14409450

    申请日：2013-06-19

    Applicant: KLEIN MEDICAL LIMITED

    Inventor： Raymond Andrew Simpkin ,  Donal Paul Krouse ,  Bryan James Smith

    IPC: G01J5/02 ,  G01N21/359 ,  G01N21/31 ,  G01N21/27 ,  G01N21/3577 ,  G01J3/28

    CPC classification number: G01J3/108 ,  G01J3/0297 ,  G01J3/28 ,  G01N21/274 ,  G01N21/3577 ,  G01N21/359 ,  G01N2201/0691

    Abstract: A method and analyzer for identifying, verifying or otherwise characterizing a sample involves emitting electromagnetic radiation in at least one beam at a sample. The electromagnetic radiation includes at least two different wavelengths. A sample detector detects affected electromagnetic radiation resulting from the emitted electromagnetic radiation affected by the sample and provides output representing the detected affected radiation. A processor determines sample coefficients from the output and identifies, verifies or otherwise characterizes the sample using the sample coefficients and training coefficients determined from training samples. The coefficients reduce sensitivity to a sample retainer variation and/or are independent of concentration.

    Abstract translation: 用于识别，验证或以其他方式表征样品的方法和分析仪包括在样品的至少一个束中发射电磁辐射。 电磁辐射包括至少两个不同的波长。 样品检测器检测受样品发射的电磁辐射产生的电磁辐射，并提供表示检测到的受影响辐射的输出。 处理器从输出端确定采样系数，并使用从训练样本确定的采样系数和训练系数来识别，验证或以其他方式表征样本。 系数降低了对样品保持器变化的敏感性和/或不依赖于浓度。

    Absolute measurement method and apparatus thereof for non-linear error
    269.
    发明授权
    Absolute measurement method and apparatus thereof for non-linear error 有权

    公开(公告)号：US09347823B2

    公开(公告)日：2016-05-24

    申请号：US14166796

    申请日：2014-01-28

    Applicant: National Institute of Metrology, P.R.China

    Inventor： Ruoduan Sun

    IPC: G01J1/10 ,  G01J1/02 ,  G01J3/02 ,  G01J1/04

    CPC classification number: G01J1/0295 ,  G01J1/0437 ,  G01J1/0462 ,  G01J3/0229 ,  G01J3/0254 ,  G01J3/0297

    Abstract: The present invention discloses a method for measuring absolute value of non-linear error and an apparatus thereof. The method comprises: placing N reflecting plates jointed together at the sample port of the optical measuring instrument at the same time, wherein each of reflecting plate has a same covering area at the sample port; placing an aperture along light paths of the optical measuring instrument; adjusting the number of reflecting plates as used according to a position in the measuring range of the optical measuring instrument where the non-linear error is required to be measured; following every adjustment, acquiring the output results when the adjusted reflecting plates are placed at the sample port; performing a computation processing for non-linear error to the output results; and acquiring the non-linear error of the output results of the optical measuring instrument.

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