Abstract:
PURPOSE: A heating device and a substrate processing apparatus having the same are provided to reduce processing time by forcedly cooling down one or a plurality of heaters and to reduce the time required for cooling down the process chamber. CONSTITUTION: In a heating device and a substrate processing apparatus having the same, a body(210) includes an inlet unit(211) and an outlet unit(212). One or a plurality of heaters(220) are installed inside the body. A cooling unit(230) is connected to the inlet unit of the body. An exhaust pump(240) is connected to the exhaust pipe of the body. A controller(250) controls the cooling unit.
Abstract:
본 발명은 박막트랜지스터, 그의 제조방법 및 그를 구비하는 유기전계발광표시장치에 관한 것으로, 기판; 상기 기판 상에 위치하는 버퍼층; 상기 상기 버퍼층 상에 위치하는 반도체층; 상기 반도체층과 절연되는 게이트 전극; 상기 반도체층과 상기 게이트 전극을 절연시키는 게이트 절연막; 및 상기 상기 게이트 전극과 절연되며, 상기 반도체층과 일부가 연결되는 소오스/드레인 전극을 포함하며, 상기 반도체층은 하나 또는 다수개의 홈부를 포함하는 것을 특징으로 하는 박막트랜지스터 및 그의 제조방법에 관한 것이다. 또한, 기판; 상기 기판 상에 위치하는 버퍼층; 상기 상기 버퍼층 상에 위치하는 반도체층; 상기 반도체층과 절연되는 게이트 전극; 상기 반도체층과 상기 게이트 전극을 절연시키는 게이트 절연막; 상기 상기 게이트 전극과 절연되며, 상기 반도체층과 일부가 연결되는 소오스/드레인 전극; 상기 기판 전면에 걸쳐 위치하는 절연막; 및 상기 절연막 상에 상기 소오스/드레인과 전기적으로 연결되는 제 1 전극, 유기막층 및 제 2 전극을 포함하며, 상기 반도체층은 하나 또는 다수개의 홈부를 포함하는 것을 특징으로 하는 유기전계발광표시장치에 관한 것이다. 다결정 실리콘, 게터링, 박막트랜지스터
Abstract:
PURPOSE: A sputtering device for depositing a metal catalyst is provided to improve the uniformity of metal catalyst of the extreme low density on a substrate by minimizing the deposition of metal catalyst discharged from a metal target in a pre-sputtering process. CONSTITUTION: A metal target(120) is located in a process chamber(110). A target transfer unit(130) includes a first shield(150) to control the progressing direction of a metal catalyst discharged from the metal target. A substrate holder(140) faces the metal target. The difference between the length of the first shield and the distance between the substrate and the metal target is 3 cm or less.
Abstract:
PURPOSE: A thin film transistor, an organic electroluminescent display device including the same and manufacturing methods thereof are provided to improve the property of a semiconductor layer by controlling metal silicide due to metal catalyst. CONSTITUTION: A semiconductor layer includes one or more channel regions and a source/drain region on a buffer layer. A gate insulation layer is located on the substrate. A gate electrode(150) is located on the gate insulation layer. An interlayer insulation layer(160) is located on the substrate. Source and drain electrodes(170a,170b) are located on the interlayer insulation layer and are electrically connected to the semiconductor layer. A polycrystalline silicon layer of the channel region of the semiconductor layer includes only the low angle grain boundary. A high angle grain boundary is located on the region except the channel region of the semiconductor layer.
Abstract:
PURPOSE: A sputtering apparatus is provided to uniformly deposit metallic catalyst of very low density on a substrate by reducing the unevenness of a metallic catalyst which is deposited at the edge of the substrate. CONSTITUTION: In a sputtering apparatus, a metal target(120) is arranged in a reaction chamber. The area of the metal target is at least 1.3 times larger than that of the substrate mounted in a substrate holder. A substrate holder(130) is arranged to be faced with the metal target. A vacuum pump(140) is connected to the exhaust pipe of the reaction chamber. A first shield(160) controls the progressive direction of the metallic catalyst discharged from the metal target.
Abstract:
PURPOSE: A source gas supplying unit, a deposition device having the same and a method thereof are provided to deposit a uniform thin by supplying a source gas to deposition chamber. CONSTITUTION: In a source gas supplying unit, a deposition device having the same and a method thereof, a source is stored in a canister(112). A heating portion heats the canister. A source gas supply tube(114) is formed in one side of the canister. A measuring unit is installed in the source gas supply tube and measures the amount of the source gas through a source gas supply tube. A temperature controller(116) is connected to a heating unit and the measuring unit. The temperature controller controls the heating unit according the amount of the source gas.
Abstract:
PURPOSE: Inline thermal process equipment and a wafer thermal processing method using the same are provided to increase the crystallinity of polysilicon by rapidly heat-treating a substrate at a high temperature more than a strain point of substrate. CONSTITUTION: A rapid thermal anneal part comprises a rapid high temperature annealing unit(600), a heating source(610) and a second controller. The heating source is installed inside the rapid high temperature annealing unit. The second controller controls the temperature value of the heating source. The second controller controls the operation of the heating source in order to heat the substrate(10) with rapid annealing temperature value.
Abstract:
PURPOSE: A substrate heat treatment system is provided to reduce a space and equipment by forming a chamber of a thermal treatment apparatus as a multi-layer structure without an additional transfer unit. CONSTITUTION: A heat treatment of substrate system comprises a thermal treatment unit(10) and a transfer unit(20). A thermal treatment unit includes at least one chamber(10a,10b,10c) with a heating unit(11a,11b,11c) for processing a substrate through thermal treatment. The transport unit is installed at the one side of the thermal treatment unit and supports the substrate before and after thermal treatment and transfers it. The chambers are deposited in a vertical direction, and the same process is performed in the chamber.