가열 수단 및 이를 포함하는 기판 가공 장치
    22.
    发明公开
    가열 수단 및 이를 포함하는 기판 가공 장치 失效
    加热装置和具有该加热装置的基板加工装置

    公开(公告)号:KR1020110050268A

    公开(公告)日:2011-05-13

    申请号:KR1020090107175

    申请日:2009-11-06

    CPC classification number: H01L21/67109 C23C16/46

    Abstract: PURPOSE: A heating device and a substrate processing apparatus having the same are provided to reduce processing time by forcedly cooling down one or a plurality of heaters and to reduce the time required for cooling down the process chamber. CONSTITUTION: In a heating device and a substrate processing apparatus having the same, a body(210) includes an inlet unit(211) and an outlet unit(212). One or a plurality of heaters(220) are installed inside the body. A cooling unit(230) is connected to the inlet unit of the body. An exhaust pump(240) is connected to the exhaust pipe of the body. A controller(250) controls the cooling unit.

    Abstract translation: 目的:提供一种加热装置及其基板处理装置,以通过强制冷却一个或多个加热器并减少冷却处理室所需的时间来减少处理时间。 构成:在加热装置和具有该加热装置的基板处理装置中,主体(210)包括入口单元(211)和出口单元(212)。 一个或多个加热器(220)安装在体内。 冷却单元(230)连接到主体的入口单元。 排气泵(240)连接到主体的排气管。 控制器(250)控制冷却单元。

    캐리어 가스 공급 구조가 개선된 증착 장치 및 그것을 이용한 유기 발광 디스플레이 장치 제조방법
    24.
    发明授权
    캐리어 가스 공급 구조가 개선된 증착 장치 및 그것을 이용한 유기 발광 디스플레이 장치 제조방법 有权
    提供改进的载气供给结构的气相沉积装置和使用该气相沉积装置的OLED制造方法

    公开(公告)号:KR101074810B1

    公开(公告)日:2011-10-19

    申请号:KR1020090130025

    申请日:2009-12-23

    CPC classification number: C23C16/4481 H01L27/1277

    Abstract: 캐리어가스공급구조가개선된증착장치가개시된다. 개시된증착장치는증착소스가장입되는캐니스터와, 증착소스가승화되도록캐니스터를가열하는히터와, 캐니스터와연결되며증착대상체가장착되는챔버및, 승화된증착소스를챔버로보내기위한캐리어가스를공급하는캐리어가스공급유닛을포함하며, 캐리어가스가캐니스터로주입되는주입부및 챔버를향해배출되는배출부가서로대향되는맞은편에마련된다. 이러한구조에의하면주입부와배출부가서로대향되게배치되어있어서캐니스터내의와류가억제되며, 따라서증착소스의공급이균일하고안정적으로이루어진다.

    스퍼터링 장치
    25.
    发明公开
    스퍼터링 장치 有权
    溅射装置

    公开(公告)号:KR1020110057465A

    公开(公告)日:2011-06-01

    申请号:KR1020090113887

    申请日:2009-11-24

    Abstract: PURPOSE: A sputtering device for depositing a metal catalyst is provided to improve the uniformity of metal catalyst of the extreme low density on a substrate by minimizing the deposition of metal catalyst discharged from a metal target in a pre-sputtering process. CONSTITUTION: A metal target(120) is located in a process chamber(110). A target transfer unit(130) includes a first shield(150) to control the progressing direction of a metal catalyst discharged from the metal target. A substrate holder(140) faces the metal target. The difference between the length of the first shield and the distance between the substrate and the metal target is 3 cm or less.

    Abstract translation: 目的:提供一种用于沉积金属催化剂的溅射装置,通过在预溅射过程中使从金属靶排出的金属催化剂的沉积最小化来改善金属催化剂在基板上的极低密度的均匀性。 构成:金属靶(120)位于处理室(110)中。 目标传送单元(130)包括用于控制从金属靶排出的金属催化剂的前进方向的第一屏蔽(150)。 衬底保持器(140)面向金属靶。 第一屏蔽的长度与基板与金属靶之间的距离之差为3cm以下。

    박막트랜지스터, 그를 구비하는 유기전계발광표시장치 및 그들의 제조방법
    26.
    发明公开
    박막트랜지스터, 그를 구비하는 유기전계발광표시장치 및 그들의 제조방법 有权
    薄膜晶体管,包含TFT的有机发光显示装置及其制造方法

    公开(公告)号:KR1020110053041A

    公开(公告)日:2011-05-19

    申请号:KR1020090109837

    申请日:2009-11-13

    Abstract: PURPOSE: A thin film transistor, an organic electroluminescent display device including the same and manufacturing methods thereof are provided to improve the property of a semiconductor layer by controlling metal silicide due to metal catalyst. CONSTITUTION: A semiconductor layer includes one or more channel regions and a source/drain region on a buffer layer. A gate insulation layer is located on the substrate. A gate electrode(150) is located on the gate insulation layer. An interlayer insulation layer(160) is located on the substrate. Source and drain electrodes(170a,170b) are located on the interlayer insulation layer and are electrically connected to the semiconductor layer. A polycrystalline silicon layer of the channel region of the semiconductor layer includes only the low angle grain boundary. A high angle grain boundary is located on the region except the channel region of the semiconductor layer.

    Abstract translation: 目的:提供薄膜晶体管,包括该薄膜晶体管的有机电致发光显示装置及其制造方法,以通过控制由于金属催化剂引起的金属硅化物来改善半导体层的性能。 构成:半导体层包括缓冲层上的一个或多个沟道区和源极/漏极区。 栅极绝缘层位于衬底上。 栅电极(150)位于栅极绝缘层上。 层间绝缘层(160)位于基板上。 源电极和漏电极(170a,170b)位于层间绝缘层上并与半导体层电连接。 半导体层的沟道区域的多晶硅层仅包含低角度晶界。 高角度晶界位于半导体层的沟道区域以外的区域。

    스퍼터링 장치
    27.
    发明公开
    스퍼터링 장치 无效
    溅射装置

    公开(公告)号:KR1020110039920A

    公开(公告)日:2011-04-20

    申请号:KR1020090096978

    申请日:2009-10-12

    CPC classification number: C23C14/34

    Abstract: PURPOSE: A sputtering apparatus is provided to uniformly deposit metallic catalyst of very low density on a substrate by reducing the unevenness of a metallic catalyst which is deposited at the edge of the substrate. CONSTITUTION: In a sputtering apparatus, a metal target(120) is arranged in a reaction chamber. The area of the metal target is at least 1.3 times larger than that of the substrate mounted in a substrate holder. A substrate holder(130) is arranged to be faced with the metal target. A vacuum pump(140) is connected to the exhaust pipe of the reaction chamber. A first shield(160) controls the progressive direction of the metallic catalyst discharged from the metal target.

    Abstract translation: 目的:提供一种溅射装置,通过减少沉积在基板边缘的金属催化剂的不均匀性,在基板上均匀沉积非常低密度的金属催化剂。 构成:在溅射装置中,金属靶(120)布置在反应室中。 金属靶的面积比安装在衬底保持器中的衬底的面积大至少1.3倍。 衬底保持器(130)布置成面对金属靶。 真空泵(140)连接到反应室的排气管。 第一屏蔽(160)控制从金属靶排出的金属催化剂的行进方向。

    소스 가스 공급 유닛, 이를 구비하는 증착 장치 및 방법
    28.
    发明公开
    소스 가스 공급 유닛, 이를 구비하는 증착 장치 및 방법 失效
    源气供应单元,具有该气源的沉积装置及其方法

    公开(公告)号:KR1020110032283A

    公开(公告)日:2011-03-30

    申请号:KR1020090089698

    申请日:2009-09-22

    CPC classification number: F17D1/02 C23C16/4485 C23C16/52 Y10T137/0318

    Abstract: PURPOSE: A source gas supplying unit, a deposition device having the same and a method thereof are provided to deposit a uniform thin by supplying a source gas to deposition chamber. CONSTITUTION: In a source gas supplying unit, a deposition device having the same and a method thereof, a source is stored in a canister(112). A heating portion heats the canister. A source gas supply tube(114) is formed in one side of the canister. A measuring unit is installed in the source gas supply tube and measures the amount of the source gas through a source gas supply tube. A temperature controller(116) is connected to a heating unit and the measuring unit. The temperature controller controls the heating unit according the amount of the source gas.

    Abstract translation: 目的:提供源气体供给单元,具有该源气体供给单元的沉积装置及其方法,以通过向沉积室供应源气体来沉积均匀的薄膜。 构成:在源气体供给单元中,具有该源装置的沉积装置及其方法,源被存储在罐(112)中。 加热部分加热罐。 源气体供给管(114)形成在罐的一侧。 测量单元安装在源气体供应管中,并通过源气体供应管测量源气体的量。 温度控制器(116)连接到加热单元和测量单元。 温度控制器根据源气体的量控制加热单元。

    인라인 열처리 설비 및 이를 사용한 기판 열처리 방법
    29.
    发明公开
    인라인 열처리 설비 및 이를 사용한 기판 열처리 방법 失效
    在线热处理设备和使用该方法的热处理方法

    公开(公告)号:KR1020100020291A

    公开(公告)日:2010-02-22

    申请号:KR1020080079003

    申请日:2008-08-12

    Abstract: PURPOSE: Inline thermal process equipment and a wafer thermal processing method using the same are provided to increase the crystallinity of polysilicon by rapidly heat-treating a substrate at a high temperature more than a strain point of substrate. CONSTITUTION: A rapid thermal anneal part comprises a rapid high temperature annealing unit(600), a heating source(610) and a second controller. The heating source is installed inside the rapid high temperature annealing unit. The second controller controls the temperature value of the heating source. The second controller controls the operation of the heating source in order to heat the substrate(10) with rapid annealing temperature value.

    Abstract translation: 目的:提供在线热处理设备和使用其的晶片热处理方法,以通过在高于衬底的应变点的高温下快速热处理衬底来提高多晶硅的结晶度。 构成:快速热退火部件包括快速高温退火单元(600),加热源(610)和第二控制器。 加热源安装在快速高温退火单元的内部。 第二控制器控制加热源的温度值。 第二控制器控制加热源的操作,以便以快速退火温度值加热基板(10)。

    기판 열처리 시스템
    30.
    发明公开
    기판 열처리 시스템 无效
    基板热处理系统

    公开(公告)号:KR1020100001118A

    公开(公告)日:2010-01-06

    申请号:KR1020080060914

    申请日:2008-06-26

    CPC classification number: H01L21/67207 H01L21/67098

    Abstract: PURPOSE: A substrate heat treatment system is provided to reduce a space and equipment by forming a chamber of a thermal treatment apparatus as a multi-layer structure without an additional transfer unit. CONSTITUTION: A heat treatment of substrate system comprises a thermal treatment unit(10) and a transfer unit(20). A thermal treatment unit includes at least one chamber(10a,10b,10c) with a heating unit(11a,11b,11c) for processing a substrate through thermal treatment. The transport unit is installed at the one side of the thermal treatment unit and supports the substrate before and after thermal treatment and transfers it. The chambers are deposited in a vertical direction, and the same process is performed in the chamber.

    Abstract translation: 目的:提供一种基板热处理系统,通过在没有附加转印单元的情况下,形成多层结构的热处理设备的腔室来减少空间和设备。 构成:衬底系统的热处理包括热处理单元(10)和转移单元(20)。 热处理单元包括具有加热单元(11a,11b,11c)的至少一个腔室(10a,10b,10c),用于通过热处理来处理衬底。 运输单元安装在热处理单元的一侧,并在热处理之前和之后支撑基板并将其传送。 腔室沿垂直方向沉积,并且在腔室中执行相同的过程。

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