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公开(公告)号:DE502004007852D1
公开(公告)日:2008-09-25
申请号:DE502004007852
申请日:2004-06-15
Applicant: INFINEON TECHNOLOGIES AG
Inventor: LEHMANN VOLKER , STENGEL REINHARD , SCHAEFER HERBERT
IPC: H01L23/473 , H01L21/306 , H01L21/3063 , H01L23/427
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公开(公告)号:DE10250204B8
公开(公告)日:2008-09-11
申请号:DE10250204
申请日:2002-10-28
Applicant: INFINEON TECHNOLOGIES AG
Inventor: STENGL REINHARD , MEISTER THOMAS , SCHAEFER HERBERT , BOECK JOSEF , SECK MARTIN , LACHNER RUDOLF
IPC: H01L21/8222 , H01L21/331 , H01L27/082 , H01L29/08 , H01L29/732
Abstract: A method for fabricating a transistor structure with a first and a second bipolar transistor having different collector widths is presented. The method includes providing a semiconductor substrate, introducing a first buried layer of the first bipolar transistor and a second buried layer of the second bipolar transistor into the semiconductor substrate, and producing at least a first collector region having a first collector width on the first buried layer and a second collector region having a second collector width on the second buried layer. A first collector zone having a first thickness is produced on the second buried layer for production of the second collector width. A second collector zone having a second thickness is produced on the first collector zone. At least one insulation region is produced that isolates at least the collector regions from one another.
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公开(公告)号:DE10250204B4
公开(公告)日:2008-04-30
申请号:DE10250204
申请日:2002-10-28
Applicant: INFINEON TECHNOLOGIES AG
Inventor: STENGL REINHARD , MEISTER THOMAS , SCHAEFER HERBERT , BOECK JOSEF , SECK MARTIN , LACHNER RUDOLF
IPC: H01L21/8222 , H01L21/331 , H01L27/082 , H01L29/08 , H01L29/732
Abstract: A method for fabricating a transistor structure with a first and a second bipolar transistor having different collector widths is presented. The method includes providing a semiconductor substrate, introducing a first buried layer of the first bipolar transistor and a second buried layer of the second bipolar transistor into the semiconductor substrate, and producing at least a first collector region having a first collector width on the first buried layer and a second collector region having a second collector width on the second buried layer. A first collector zone having a first thickness is produced on the second buried layer for production of the second collector width. A second collector zone having a second thickness is produced on the first collector zone. At least one insulation region is produced that isolates at least the collector regions from one another.
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公开(公告)号:DE102006043484A1
公开(公告)日:2008-04-03
申请号:DE102006043484
申请日:2006-09-15
Applicant: INFINEON TECHNOLOGIES AG
Inventor: SCHAEFER HERBERT , BOECK JOSEF , LIEBL WOLFGANG , KNAPP HERBERT
IPC: H01L23/525
Abstract: A fuse structure includes a substrate, a fuse conductive trace disposed closer to a first chip surface than to a second chip surface facing away from the first chip surface, a metallization layer on the substrate disposed on a side of the fuse conductive trace facing away from the first chip surface, and a planar barrier multilayer assembly disposed between the fuse conductive trace and the metallization layer and including multiple barrier layers of different materials, wherein the fuse conductive trace, the metallization layer and the barrier multilayer assembly are arranged such that when cutting the fuse conductive trace and the barrier multilayer assembly, a first area of the metallization layer is electrically isolated from a second area of the metallization layer.
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公开(公告)号:DE10316531A1
公开(公告)日:2004-07-08
申请号:DE10316531
申请日:2003-04-10
Applicant: INFINEON TECHNOLOGIES AG
Inventor: SCHAEFER HERBERT , BOECK JOSEF , MEISTER THOMAS , STENGL REINHARD
IPC: H01L21/331 , H01L29/08 , H01L29/167 , H01L29/732 , H01L29/737
Abstract: The device has a collector region (25) of a first conductor type, a sub-collector region (10) of the first type electrically connected to a first side of the collector region, a base region (30) of a second conductor type on the second side of the collector region, an emitter region (50) of the first conductor type above the base region remote from the collector region and a carbon doped semiconducting region on the first side next to the collector region.
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公开(公告)号:DE19821901C2
公开(公告)日:2002-05-08
申请号:DE19821901
申请日:1998-05-15
Applicant: INFINEON TECHNOLOGIES AG
Inventor: REISINGER HANS , STENGL REINHARD , GRUENING ULRIKE , LEHMANN VOLKER , WENDT HERMANN , WILLER JOSEF , FRANOSCH MARTIN , SCHAEFER HERBERT
IPC: H01L21/8244 , H01L27/11 , G11C11/412
Abstract: An integrated electrical circuit has at least one memory cell, in which the memory cell is disposed in the region of a surface of a semiconductor substrate. The memory cell contains at least two inverters that are electrically connected to one another. The inverters each contain two complementary MOS transistors having a source, a drain and a channel, the channels of the complementary MOS transistors having different conductivity types. According to the invention, the integrated electrical circuit is constructed in such a way that the inverters are disposed perpendicularly to the surface of the semiconductor substrate. The source, the drain and the channel of the complementary MOS transistors are formed by layers which lie one on top of the other and are disposed in such a way that the complementary MOS transistors are situated one above the other. The invention furthermore relates to a method for fabricating the integrated electrical circuit.
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公开(公告)号:DE19958062A1
公开(公告)日:2001-07-05
申请号:DE19958062
申请日:1999-12-02
Applicant: INFINEON TECHNOLOGIES AG
Inventor: STENGL REINHARD , MEISTER THOMAS F , SCHAEFER HERBERT , FRANOSCH MARTIN , BOECK JOSEF , KLEIN WOLFGANG
IPC: H01L21/331 , H01L29/732 , H01L27/082
Abstract: The bipolar transistor is produced such that a connection region of its base is provided with a silicide layer, so that a base resistance of the bipolar transistor is small. No silicide layer is produced between an emitter and an emitter contact and between a connection region of a collector and a collector contact. The base is produced by in situ-doped epitaxy in a region in which a first insulating layer is removed by isotropic etching such that the connection region of the base which is arranged on the first insulating layer is undercut. In order to avoid defects of a substrate in which the bipolar transistor is partly produced, isotropic etching is used for the patterning of auxiliary layers, whereby etching is selective with respect to auxiliary layers lying above, which are patterned by anisotropic etching.
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公开(公告)号:DE19958151A1
公开(公告)日:2001-06-13
申请号:DE19958151
申请日:1999-12-03
Applicant: INFINEON TECHNOLOGIES AG
Inventor: NELLE PETER , FISCHER HERMANN , WERNER WOLFGANG , SCHAEFER HERBERT
IPC: H01L21/336 , H01L29/06 , H01L29/78
Abstract: Lateral high voltage semiconductor element comprises a semiconductor substrate (1) of first conductivity with a semiconductor layer (2) of second conductivity having an active zone (3). Semiconductor regions (11, 12) of first and second conductivity are provided on the semiconductor layer by selective multiple epitaxy. An Independent claim is also included for a process for the production of a lateral high voltage semiconductor element, comprising back-etching an insulating layer provided on the edges of the semiconductor regions (11, 12) after selective multiple epitaxy and then carrying out further selective epitaxy to form a connecting layer. Preferred Features: The semiconductor regions have a thickness of 1-100 nm, especially 50 nm.
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公开(公告)号:DE19933564C1
公开(公告)日:2001-01-25
申请号:DE19933564
申请日:1999-07-16
Applicant: INFINEON TECHNOLOGIES AG
Inventor: SCHULZ THOMAS , ROESNER WOLFGANG , FRANOSCH MARTIN , SCHAEFER HERBERT , RISCH LOTHAR , AEUGLE THOMAS
IPC: H01L21/335 , H01L21/336 , H01L21/8234 , H01L27/088 , H01L29/76 , H01L51/00 , H01L51/05 , H01L51/30 , H01L29/78
Abstract: According to the invention, a double gate MOSFET semiconductor layer structure is formed on a substrate (1). This structure is comprised of a first and of a second gate electrode (10A, 10B) between which a semiconductor channel layer zone (4A) is embedded, and of a source region (2A) and a drain region (2B) which are arranged on opposite faces of the semiconductor channel layer zone (4A). At least one additional semiconductor channel layer zone (6A) is provided on one of the gate electrodes (10B). The faces of the at least one additional semiconductor channel layer zone are also contacted by the source region (2A) and drain region (2B).
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公开(公告)号:DE102010001290A1
公开(公告)日:2010-08-19
申请号:DE102010001290
申请日:2010-01-27
Applicant: INFINEON TECHNOLOGIES AG
Inventor: BOECK JOSEF , MEISTER THOMAS , SCHAEFER HERBERT , LIEBL WOLFGANG
IPC: H01L21/331 , H01L29/73
Abstract: Beschrieben wird ein Verfahren zum Herstellen eines Bipolartransistors mit einem Kollektorgebiet, das innerhalb eines Halbleiterkörpers angeordnet ist und das von einem Basisgebiet durch eine oder mehrere Isolationskavitäten, die mit einem niedrig-permittiven Gas gefüllt sind, getrennt ist.
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