Abstract:
IN A SPECTROMETER FOR USE IN ANALYZING A PORTION OF LIGHT EMITTED FROM A RELATIVELY LARGE LIGHT SOURCE COMPRISING A CYLINDRICAL, HIGHLY POLISHED METALLIC MEMBER THE SIZE OF A COMMON NEEDLE LOCATED AT THE FOCAL PLANE OF AN ACHROMATIC COLLIMATOR OF THE SPECTROMETER, THE CYLINDRICAL MEMBER BEING ADJUSTABLY SITUATED IN THE PATH OF A LIGHT SOURCE OF RELATIVELY LARGE AREA, SAID CYLINDRICAL MEMBER BEING ILLUMINATED BY A PORTIION OF SAID LIGHT SOURCE, SAID CYLINDRICAL MEMBER REFLECTING A PORTION OF SAID LIGHT SOURCE. IN A NARROW BEAM CONFIGURATION SUITABLE FOR COLLIMATION.
Abstract:
A filter assembly includes an incident medium, a spacer, at least one dielectric filter and an exit medium. The spacer is arranged between the incident medium and the at least one dielectric filter such that the incident medium and the at least one dielectric filter are spaced apart by a working distance and thereby enclose a medium of lower index of refraction than the incident medium. The at least one dielectric filter is arranged on the exit medium.
Abstract:
A hand held spectrometer is used to illuminate the object and measure the one or more spectra. The spectral data of the object can be used to determine one or more attributes of the object. In many embodiments, the spectrometer is coupled to a database of spectral information that can be used to determine the attributes of the object. The spectrometer system may comprise a hand held communication device coupled to a spectrometer, in which the user can input and receive data related to the measured object with the hand held communication device. The embodiments disclosed herein allow many users to share object data with many people, in order to provide many people with actionable intelligence in response to spectral data.
Abstract:
Systems and methods for determining one or more properties of a sample are disclosed. The systems and methods disclosed can be capable of measuring along multiple locations and can reimage and resolve multiple optical paths within the sample. The system can be configured with one-layer or two-layers of optics suitable for a compact system. The optics can be simplified to reduce the number and complexity of the coated optical surfaces, et al. on effects, manufacturing tolerance stack-up problems, and interference-based spectroscopic errors. The size, number, and placement of the optics can enable multiple simultaneous or non-simultaneous measurements at various locations across and within the sample. Moreover, the systems can be configured with an optical spacer window located between the sample and the optics, and methods to account for changes in optical paths due to inclusion of the optical spacer window are disclosed.
Abstract:
A spectrometer comprises a plurality of isolated optical channels comprising a plurality of isolated optical paths. The isolated optical paths decrease cross-talk among the optical paths and allow the spectrometer to have a decreased length with increased resolution. In many embodiments, the isolated optical paths comprise isolated parallel optical paths that allow the length of the device to be decreased substantially. In many embodiments, each isolated optical path extends from a filter of a filter array, through a lens of a lens array, through a channel of a support array, to a region of a sensor array. Each region of the sensor array comprises a plurality of sensor elements in which a location of the sensor element corresponds to the wavelength of light received based on an angle of light received at the location, the focal length of the lens and the central wavelength of the filter.
Abstract:
An image sensor assembly includes at least one upconverter configured to detect light in a NIR waveband that is received from an object to be imaged and generate, based on the detected light, upconverted light that is outside of the NIR waveband; and at least one image sensor configured to detect the upconverted light.
Abstract:
A method of processing a substrate that includes: exposing the substrate in a plasma processing chamber to a plasma powered by applying a first power to a first electrode of a plasma processing chamber; turning OFF the first power to the first electrode after the first time duration; while the first power is OFF, applying a second power to a second electrode of the plasma processing chamber for a second time duration, the second time duration being shorter than the first time duration, an energy of the second power over the second time duration is less than an energy of the first power over the first time duration by a factor of at least 2; and detecting an optical emission spectrum (OES) from species in the plasma processing chamber.
Abstract:
A method, a system, and a non-transitory computer readable medium for accurate Raman spectroscopy. The method may include executing at least one iteration of the steps of: (i) performing, by an optical measurement system, a calibration process that comprises (a) finding a misalignment between a region of interest defined by a spatial filter, and an impinging beam of radiation that is emitted from an illuminated area of a sample, the impinging beam impinges on the spatial filter; and (b) determining a compensating path of propagation of the impinging beam that compensates the misalignment; and (ii) performing a measurement process, while the optical measurement system is configured to provide the compensating path of propagation of the impinging beam, to provide one or more Raman spectra.
Abstract:
A spectrometer for studying a sample comprises a light guide for receiving light from the sample. The received light is emitted by the light guide through an exit surface that is on a side of the light guide and extending in a longitudinal direction of the light guide. The light emitted through the exit surface is filtered by a linear variable filter having an array of bandpass filters extending alongside and adjacent the exit surface. The filtered light is detected by the photodetectors of a detector array disposed parallel to the linear variable filter, and signals of the photodetectors are analyzed to obtain a spectral distribution of the light from the sample.