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公开(公告)号:NL2011580A
公开(公告)日:2014-05-08
申请号:NL2011580
申请日:2013-10-10
Applicant: ASML NETHERLANDS BV
Inventor: LOOPSTRA ERIK , YAKUNIN ANDREI , BANINE VADIM , NIKIPELOV ANDREY , OSORIO OLIVEROS EDGAR , STRUYCKEN ALEXANDER , DRIE NHUIZEN BERT , SCHOOT JAN
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公开(公告)号:NL2010108A
公开(公告)日:2013-07-22
申请号:NL2010108
申请日:2013-01-10
Applicant: ASML NETHERLANDS BV
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公开(公告)号:SG184557A1
公开(公告)日:2012-11-29
申请号:SG2012075628
申请日:2011-02-22
Applicant: ASML NETHERLANDS BV
Inventor: SOER WOUTER , BANINE VADIM , LOOPSTRA ERIK , YAKUNIN ANDREI , JAK MARTIN
Abstract: A spectral purity filter includes a body of material, through which a plurality of apertures extend. The apertures are arranged to suppress radiation having a first wavelength and to allow at least a portion of radiation having a second wavelength to be transmitted through the apertures. The second wavelength of radiation is shorter than the first wavelength of radiation. The body of material is formed from a material having a bulk reflectance of substantially greater than or equal to 70% at the first wavelength of radiation. The material has a melting point above 1000 °C.
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公开(公告)号:NL2005750A
公开(公告)日:2011-01-18
申请号:NL2005750
申请日:2010-11-24
Applicant: ASML NETHERLANDS BV
Inventor: YAKUNIN ANDREI , BANINE VADIM , IVANOV VLADIMIR , KOSHELEV KONSTANTIN , KRIVTSUN VLADIMIR , GLUSHKOV DENIS
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公开(公告)号:NL2005748A
公开(公告)日:2011-01-06
申请号:NL2005748
申请日:2010-11-24
Applicant: ASML NETHERLANDS BV
Inventor: LOOPSTRA ERIK , BANINE VADIM , BRULS RICHARD , IVANOV VLADIMIR , NEERHOF HENDRIK , YAKUNIN ANDREI , SCACCABAROZZI LUIGI
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公开(公告)号:NL2004984A
公开(公告)日:2010-08-12
申请号:NL2004984
申请日:2010-06-28
Applicant: ASML NETHERLANDS BV
Inventor: YAKUNIN ANDREI , KRIVTSUN VLADIMIR , MEDVEDEV VIACHESLAV , KODENTSOV ALEXANDRE
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公开(公告)号:NL2011484A
公开(公告)日:2014-04-29
申请号:NL2011484
申请日:2013-09-23
Applicant: ASML NETHERLANDS BV
Inventor: NIKIPELOV ANDREY , BANINE VADIM , YAKUNIN ANDREI
IPC: G03F7/20
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38.
公开(公告)号:NL2009372A
公开(公告)日:2013-04-02
申请号:NL2009372
申请日:2012-08-28
Applicant: ASML NETHERLANDS BV
Inventor: SCHOOT JAN , GREEVENBROEK HENDRIKUS , IVANOV VLADIMIR , YAKUNIN ANDREI , KREUWEL HERMANUS
IPC: G03F7/20
Abstract: EUV exposure dose in a lithographic apparatus is controlled pulse to pulse by varying a conversion efficiency with which a pulse of EUV radiation is generated from an excitation of a fuel material by a corresponding pulse of excitation laser radiation. Conversion efficiency can be varied in several different ways, by varying the proportion of a fuel material that intersects a laser beam, and/or by varying a quality of the interaction. Mechanisms to vary the conversion efficiency can be based on variation of a laser pulse timing, variation of pre-pulse energy, and/or variable displacement of a main laser beam in one or more directions. Steps to maintain symmetry of the generated EUV radiation can be included.
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公开(公告)号:NL2010236A
公开(公告)日:2013-03-19
申请号:NL2010236
申请日:2013-02-04
Applicant: ASML NETHERLANDS BV
Inventor: YEREMENKO SERGIY , KRIVTSUN VLADIMIR MIHAILOVITCH , LABETSKI DZMITRY , YAKUNIN ANDREI
IPC: G03F7/20
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公开(公告)号:NL2007864A
公开(公告)日:2011-12-22
申请号:NL2007864
申请日:2011-11-25
Applicant: ASML NETHERLANDS BV
Inventor: YAKUNIN ANDREI , IVANOV VLADIMIR , SCHOOT JAN , KRIVTSUN VLADIMIR , SWINKELS GERARDUS , MEDVEDEV VIACHESLAV
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